{"id":"https://openalex.org/W4392567183","doi":"https://doi.org/10.1109/tim.2024.3370755","title":"An Improved SFS Method for Achieving Fast, High-Precision, and Widely Adaptable 3-D Reconstruction","display_name":"An Improved SFS Method for Achieving Fast, High-Precision, and Widely Adaptable 3-D Reconstruction","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4392567183","doi":"https://doi.org/10.1109/tim.2024.3370755"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3370755","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tim.2024.3370755","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012165383","display_name":"Yang Chen","orcid":"https://orcid.org/0009-0001-1859-1932"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chen Yang","raw_affiliation_strings":["School of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002392714","display_name":"Changshuai Fang","orcid":"https://orcid.org/0000-0001-8122-5428"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changshuai Fang","raw_affiliation_strings":["School of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033870660","display_name":"Zhengwen Li","orcid":"https://orcid.org/0009-0007-4486-0386"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengwen Li","raw_affiliation_strings":["School of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035435625","display_name":"Qianwen Wang","orcid":"https://orcid.org/0009-0005-4625-9266"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qianwen Wang","raw_affiliation_strings":["School of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100376184","display_name":"Xiaodong Zhang","orcid":"https://orcid.org/0000-0001-8469-7113"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaodong Zhang","raw_affiliation_strings":["School of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5012165383"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":2.5899,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.87348988,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9593999981880188,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12015","display_name":"Photoacoustic and Ultrasonic Imaging","score":0.9372000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5579165816307068},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34192535281181335},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23642948269844055}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5579165816307068},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34192535281181335},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23642948269844055}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3370755","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tim.2024.3370755","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6532210058","display_name":null,"funder_award_id":"62373274","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1480101757","https://openalex.org/W1975089519","https://openalex.org/W2032831684","https://openalex.org/W2104095591","https://openalex.org/W2110432750","https://openalex.org/W2117007522","https://openalex.org/W2145023731","https://openalex.org/W2146724569","https://openalex.org/W2153504150","https://openalex.org/W2162870748","https://openalex.org/W2167667767","https://openalex.org/W2207600644","https://openalex.org/W2617643478","https://openalex.org/W2891581063","https://openalex.org/W2962909976","https://openalex.org/W3046488321","https://openalex.org/W3177265935","https://openalex.org/W3180008099","https://openalex.org/W4283804702","https://openalex.org/W4312933868","https://openalex.org/W4313344102","https://openalex.org/W4379116849"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W4391913857","https://openalex.org/W2350741829","https://openalex.org/W2530322880"],"abstract_inverted_index":{"Different":[0],"optical":[1],"reconstruction":[2,104,113,119],"methods":[3],"have":[4,16],"stringent":[5],"requirements":[6],"on":[7,36],"the":[8,13,46,70,79,84,103,107,118,129,132],"material":[9],"or":[10,61],"shape":[11,40],"of":[12,48,52,83,106,121,131],"objects,":[14],"and":[15,29,63,91],"poor":[17],"generalization":[18],"ability.":[19],"To":[20],"address":[21],"this":[22,24,76],"issue,":[23],"article":[25,77,116],"proposes":[26,92],"a":[27,93],"stable":[28],"reliable":[30],"target":[31],"contour":[32],"recognition":[33],"algorithm":[34,86],"based":[35],"omnidirectional":[37],"illumination":[38],"using":[39],"from":[41],"silhouette":[42],"(SFS).":[43],"It":[44],"solves":[45,78],"problem":[47,82],"low":[49],"signal-to-noise":[50],"ratio":[51],"light":[53],"signals":[54],"reflected":[55],"by":[56],"materials":[57],"with":[58],"high":[59],"reflectivity":[60],"transparency,":[62],"achieves":[64],"performance":[65],"that":[66],"is":[67],"comparable":[68],"to":[69,127],"state-of-the-art":[71],"deep":[72],"learning":[73],"networks.":[74],"Moreover,":[75],"blind":[80],"spot":[81],"SFS":[85,109],"in":[87,135],"single-image":[88],"fast":[89],"reconstruction,":[90],"targeted":[94],"growth":[95],"visual":[96],"hull":[97],"(VH)":[98],"method,":[99],"which":[100],"further":[101],"enhances":[102],"speed":[105],"traditional":[108],"method":[110,134],"while":[111],"ensuring":[112],"accuracy.":[114],"This":[115],"takes":[117],"measurement":[120],"supermarket":[122],"products":[123],"as":[124],"an":[125],"example":[126],"demonstrate":[128],"value":[130],"proposed":[133],"practical":[136],"applications.":[137]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}