{"id":"https://openalex.org/W4390873749","doi":"https://doi.org/10.1109/tim.2024.3353877","title":"Tiny Defect-Oriented Single-View CT Reconstruction Based on a Hybrid Framework","display_name":"Tiny Defect-Oriented Single-View CT Reconstruction Based on a Hybrid Framework","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4390873749","doi":"https://doi.org/10.1109/tim.2024.3353877"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3353877","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3353877","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103259692","display_name":"Xuchong Liu","orcid":"https://orcid.org/0009-0001-7190-1821"},"institutions":[{"id":"https://openalex.org/I27357992","display_name":"Dalian University of Technology","ror":"https://ror.org/023hj5876","country_code":"CN","type":"education","lineage":["https://openalex.org/I27357992"]},{"id":"https://openalex.org/I4210092944","display_name":"Dalian University","ror":"https://ror.org/00g2ypp58","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210092944"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuchong Liu","raw_affiliation_strings":["School of Electronic and Information Engineering, Dalian University of Technology, Dalian, China"],"raw_orcid":"https://orcid.org/0009-0001-7190-1821","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Dalian University of Technology, Dalian, China","institution_ids":["https://openalex.org/I4210092944","https://openalex.org/I27357992"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081364468","display_name":"Jianqiao Yu","orcid":"https://orcid.org/0000-0003-0527-517X"},"institutions":[{"id":"https://openalex.org/I27357992","display_name":"Dalian University of Technology","ror":"https://ror.org/023hj5876","country_code":"CN","type":"education","lineage":["https://openalex.org/I27357992"]},{"id":"https://openalex.org/I4210092944","display_name":"Dalian University","ror":"https://ror.org/00g2ypp58","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210092944"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianqiao Yu","raw_affiliation_strings":["School of Electronic and Information Engineering, Dalian University of Technology, Dalian, China"],"raw_orcid":"https://orcid.org/0000-0003-0527-517X","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Dalian University of Technology, Dalian, China","institution_ids":["https://openalex.org/I4210092944","https://openalex.org/I27357992"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073840185","display_name":"Yi Sun","orcid":"https://orcid.org/0000-0001-6086-5741"},"institutions":[{"id":"https://openalex.org/I27357992","display_name":"Dalian University of Technology","ror":"https://ror.org/023hj5876","country_code":"CN","type":"education","lineage":["https://openalex.org/I27357992"]},{"id":"https://openalex.org/I4210092944","display_name":"Dalian University","ror":"https://ror.org/00g2ypp58","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210092944"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Sun","raw_affiliation_strings":["School of Electronic and Information Engineering, Dalian University of Technology, Dalian, China"],"raw_orcid":"https://orcid.org/0000-0001-6086-5741","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Dalian University of Technology, Dalian, China","institution_ids":["https://openalex.org/I4210092944","https://openalex.org/I27357992"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054407228","display_name":"Xuanheng Li","orcid":"https://orcid.org/0000-0003-2606-6932"},"institutions":[{"id":"https://openalex.org/I27357992","display_name":"Dalian University of Technology","ror":"https://ror.org/023hj5876","country_code":"CN","type":"education","lineage":["https://openalex.org/I27357992"]},{"id":"https://openalex.org/I4210092944","display_name":"Dalian University","ror":"https://ror.org/00g2ypp58","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210092944"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuanheng Li","raw_affiliation_strings":["School of Electronic and Information Engineering, Dalian University of Technology, Dalian, China"],"raw_orcid":"https://orcid.org/0000-0003-2606-6932","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Dalian University of Technology, Dalian, China","institution_ids":["https://openalex.org/I4210092944","https://openalex.org/I27357992"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4884,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.57139857,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T10844","display_name":"Radiation Dose and Imaging","score":0.9890999794006348,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6451504826545715},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.6375362873077393},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6270100474357605},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.6189572215080261},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5849406719207764},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5479273796081543},{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.5195596218109131},{"id":"https://openalex.org/keywords/industrial-computed-tomography","display_name":"Industrial computed tomography","score":0.4434686303138733},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.43074214458465576},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.42450472712516785},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.34779947996139526},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.21286046504974365},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.09925854206085205},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09094688296318054}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6451504826545715},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.6375362873077393},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6270100474357605},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.6189572215080261},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5849406719207764},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5479273796081543},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.5195596218109131},{"id":"https://openalex.org/C116321358","wikidata":"https://www.wikidata.org/wiki/Q1662063","display_name":"Industrial computed tomography","level":3,"score":0.4434686303138733},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.43074214458465576},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.42450472712516785},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.34779947996139526},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.21286046504974365},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09925854206085205},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09094688296318054},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3353877","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3353877","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6800000071525574,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G8578706342","display_name":"\u57fa\u4e8eMojette\u53d8\u6362\u65b9\u6cd5\u7684\u6709\u9650\u89d2\u5ea6CT\u56fe\u50cf\u91cd\u5efa\u7814\u7a76","funder_award_id":"61671104","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W1901129140","https://openalex.org/W2101243341","https://openalex.org/W2129308920","https://openalex.org/W2133665775","https://openalex.org/W2138582281","https://openalex.org/W2141697870","https://openalex.org/W2145096794","https://openalex.org/W2194775991","https://openalex.org/W2332926823","https://openalex.org/W2412321691","https://openalex.org/W2603777577","https://openalex.org/W2622270330","https://openalex.org/W2791871435","https://openalex.org/W2793419304","https://openalex.org/W2805658037","https://openalex.org/W2807979819","https://openalex.org/W2901384697","https://openalex.org/W2949386129","https://openalex.org/W2950676374","https://openalex.org/W2963420686","https://openalex.org/W2969244190","https://openalex.org/W2969885416","https://openalex.org/W2979573889","https://openalex.org/W2982067315","https://openalex.org/W3000508543","https://openalex.org/W3018223060","https://openalex.org/W3031168128","https://openalex.org/W3081526588","https://openalex.org/W3095077675","https://openalex.org/W3105751747","https://openalex.org/W3131061710","https://openalex.org/W3139018523","https://openalex.org/W3174535898","https://openalex.org/W3206550496","https://openalex.org/W4213093129","https://openalex.org/W4224063192","https://openalex.org/W4312730028","https://openalex.org/W4320497906","https://openalex.org/W4362604574","https://openalex.org/W4378588810","https://openalex.org/W4379791980","https://openalex.org/W4384120071","https://openalex.org/W4385245621","https://openalex.org/W4387211256","https://openalex.org/W4387404181","https://openalex.org/W4392681580","https://openalex.org/W6853011971","https://openalex.org/W6855630142"],"related_works":["https://openalex.org/W2370826717","https://openalex.org/W2004988775","https://openalex.org/W2058702041","https://openalex.org/W2022459896","https://openalex.org/W2729309033","https://openalex.org/W2283874103","https://openalex.org/W2914297867","https://openalex.org/W2729168204","https://openalex.org/W1849392761","https://openalex.org/W754252830"],"abstract_inverted_index":{"Defect":[0],"detection":[1,17,181],"plays":[2],"an":[3,124],"important":[4],"role":[5],"in":[6,63,194],"industry":[7],"quality":[8],"control":[9],"and":[10,83,101,122,127,147,182,190],"process":[11],"evaluation.":[12],"Learning-based":[13],"Computed":[14],"Tomography":[15],"(CT)":[16],"with":[18],"3D":[19,43],"volume":[20],"restoration":[21,55],"from":[22,49,161],"a":[23,28,50,68,78,117,140,162],"single":[24,51,163],"X-ray":[25,52,125,165],"image":[26,130,166],"is":[27],"promising":[29],"method":[30,152],"faster":[31],"than":[32],"conventional":[33],"CT":[34,89,136,193],"reconstruction.":[35,137],"Although":[36],"the":[37,54,64,98,108,150,158,170,179,188],"existing":[38],"methods":[39],"have":[40],"shown":[41],"that":[42,149],"shapes":[44],"can":[45,153],"be":[46,71],"well":[47],"reconstructed":[48],"image,":[53],"of":[56,184,192],"small":[57],"internal":[58,103],"details,":[59],"especially":[60],"tiny":[61,102,112,171],"defects":[62,113,146,172],"workpieces,":[65,185],"still":[66],"remains":[67],"problem":[69],"to":[70,96,134,177],"solved.":[72],"In":[73],"this":[74],"study,":[75],"we":[76,115],"develop":[77],"hybrid":[79],"framework":[80],"unifying":[81],"large-scale":[82],"small-scale":[84],"feature":[85],"extraction":[86],"for":[87],"single-view":[88],"reconstruction,":[90],"where":[91],"two":[92],"modules":[93],"are":[94],"designed":[95],"reconstruct":[97,157],"overall":[99,159],"shape":[100,160],"defects,":[104],"respectively.":[105],"To":[106],"make":[107],"network":[109,132],"focus":[110],"on":[111],"restoration,":[114],"propose":[116],"novel":[118],"FocusSSIM":[119],"loss":[120],"function":[121],"use":[123],"projection,":[126],"its":[128],"gradient":[129],"as":[131],"input":[133],"facilitate":[135],"We":[138],"establish":[139],"real":[141],"piston":[142],"dataset":[143],"containing":[144],"different":[145],"validate":[148],"proposed":[151],"not":[154],"only":[155],"accurately":[156],"2D":[164],"but":[167],"also":[168],"restore":[169],"precisely.":[173],"This":[174],"work":[175],"contributes":[176],"improving":[178],"defect":[180],"analysis":[183],"further":[186],"promoting":[187],"exploration":[189],"application":[191],"industrial":[195],"automatic":[196],"detection.":[197]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}