{"id":"https://openalex.org/W4390659789","doi":"https://doi.org/10.1109/tim.2024.3351241","title":"YOLO-HMC: An Improved Method for PCB Surface Defect Detection","display_name":"YOLO-HMC: An Improved Method for PCB Surface Defect Detection","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4390659789","doi":"https://doi.org/10.1109/tim.2024.3351241"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3351241","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3351241","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046021936","display_name":"Minghao Yuan","orcid":"https://orcid.org/0009-0004-5728-497X"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Minghao Yuan","raw_affiliation_strings":["School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0004-5728-497X","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103078312","display_name":"Yongbing Zhou","orcid":"https://orcid.org/0009-0004-6332-0850"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongbing Zhou","raw_affiliation_strings":["School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0004-6332-0850","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101592530","display_name":"Xiaoyu Ren","orcid":"https://orcid.org/0009-0009-4553-7761"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyu Ren","raw_affiliation_strings":["School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0009-4553-7761","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058074445","display_name":"Hui Zhi","orcid":"https://orcid.org/0009-0005-2553-7941"},"institutions":[{"id":"https://openalex.org/I4210155932","display_name":"Changhong (China)","ror":"https://ror.org/04tttpd30","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210155932"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Zhi","raw_affiliation_strings":["Sichuan Changhong Electric Company Ltd., Mianyang, China"],"raw_orcid":"https://orcid.org/0009-0005-2553-7941","affiliations":[{"raw_affiliation_string":"Sichuan Changhong Electric Company Ltd., Mianyang, China","institution_ids":["https://openalex.org/I4210155932"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082634880","display_name":"Jian Zhang","orcid":"https://orcid.org/0000-0003-1655-3980"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Zhang","raw_affiliation_strings":["School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-1655-3980","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087249866","display_name":"Haojie Chen","orcid":"https://orcid.org/0009-0001-3445-1104"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haojie Chen","raw_affiliation_strings":["State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0009-0001-3445-1104","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":35.9418,"has_fulltext":false,"cited_by_count":165,"citation_normalized_percentile":{"value":0.99940141,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9732000231742859,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.7082669734954834},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5437880158424377},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5400896668434143},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5164706707000732},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5140255689620972},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5010325908660889},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4681546688079834},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.4643099308013916},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3895758092403412},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3393547534942627},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09064972400665283}],"concepts":[{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.7082669734954834},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5437880158424377},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5400896668434143},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5164706707000732},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5140255689620972},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5010325908660889},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4681546688079834},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.4643099308013916},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3895758092403412},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3393547534942627},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09064972400665283},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3351241","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3351241","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":49,"referenced_works":["https://openalex.org/W2193145675","https://openalex.org/W2295107390","https://openalex.org/W2752782242","https://openalex.org/W2785622324","https://openalex.org/W2884585870","https://openalex.org/W2941001797","https://openalex.org/W2942945867","https://openalex.org/W2963037989","https://openalex.org/W2987322772","https://openalex.org/W3013211776","https://openalex.org/W3028888497","https://openalex.org/W3034713821","https://openalex.org/W3106250896","https://openalex.org/W3114273261","https://openalex.org/W3137421590","https://openalex.org/W3160653769","https://openalex.org/W3181339134","https://openalex.org/W3186326530","https://openalex.org/W3193024002","https://openalex.org/W3214406712","https://openalex.org/W4200128174","https://openalex.org/W4288804646","https://openalex.org/W4297676427","https://openalex.org/W4298005281","https://openalex.org/W4308602927","https://openalex.org/W4309026313","https://openalex.org/W4311144991","https://openalex.org/W4311773946","https://openalex.org/W4313326179","https://openalex.org/W4318973272","https://openalex.org/W4361275271","https://openalex.org/W4377090795","https://openalex.org/W4377691132","https://openalex.org/W4379106369","https://openalex.org/W4379207729","https://openalex.org/W4380985972","https://openalex.org/W4382280585","https://openalex.org/W4385072368","https://openalex.org/W4385484735","https://openalex.org/W4385768300","https://openalex.org/W4386076325","https://openalex.org/W4386362978","https://openalex.org/W4386404700","https://openalex.org/W4387125416","https://openalex.org/W4387717659","https://openalex.org/W4388807184","https://openalex.org/W6840866624","https://openalex.org/W6843239693","https://openalex.org/W6852703390"],"related_works":["https://openalex.org/W4252608911","https://openalex.org/W2184913151","https://openalex.org/W2389426768","https://openalex.org/W3147987719","https://openalex.org/W2599361292","https://openalex.org/W2698654916","https://openalex.org/W2907188494","https://openalex.org/W3163908127","https://openalex.org/W2013997577","https://openalex.org/W2975185102"],"abstract_inverted_index":{"The":[0],"surface":[1,44],"defects":[2,41],"of":[3,28,45,122,141,158,226],"printed":[4],"circuit":[5],"boards":[6],"(PCBs)":[7],"generated":[8],"during":[9],"the":[10,24,43,48,58,77,90,94,98,104,120,123,127,138,148,154,169,178,222,227],"manufacturing":[11],"process":[12],"have":[13,203],"an":[14,108],"adverse":[15],"effect":[16],"on":[17,42,66,198],"product":[18],"quality,":[19],"which":[20],"further":[21],"directly":[22],"affects":[23],"stability":[25],"and":[26,83,102,175,224],"reliability":[27],"equipment":[29],"performance.":[30],"However,":[31],"there":[32],"are":[33],"still":[34],"great":[35],"challenges":[36],"in":[37,72,161],"accurately":[38,82,191],"recognizing":[39],"tiny":[40,194],"PCB":[46,79,134,159,172,193,199],"under":[47],"complex":[49],"background":[50],"due":[51],"to":[52,75,118,125,146,186],"its":[53],"compact":[54],"layout.":[55],"To":[56],"address":[57],"problem,":[59],"a":[60,131,162,205],"novel":[61],"YOLO-HorNet-MCBAM-CARAFE":[62],"(YOLO-HMC)":[63],"network":[64],"based":[65],"improved":[67,109],"YOLOv5":[68,189],"framework":[69],"is":[70,116,144,184],"proposed":[71,228],"this":[73],"article":[74],"identify":[76],"tiny-size":[78],"defect":[80,128,173,200],"more":[81],"efficiently":[84],"with":[85,209],"fewer":[86],"model":[87,124,180],"parameters.":[88],"First,":[89],"backbone":[91],"part":[92],"adopts":[93],"HorNet":[95],"for":[96,151],"enhancing":[97],"feature":[99],"extraction":[100],"ability":[101,121],"deepening":[103],"information":[105,157],"interaction.":[106],"Second,":[107],"multiple":[110],"convolutional":[111],"block":[112],"attention":[113],"module":[114],"(MCBAM)":[115],"designed":[117],"improve":[119],"highlight":[126],"location":[129],"from":[130],"highly":[132],"similar":[133],"substrate":[135],"background.":[136],"Third,":[137],"content-aware":[139],"reassembly":[140],"features":[142],"(CARAFE)":[143],"used":[145],"replace":[147],"up-sampling":[149],"layer":[150],"fully":[152],"aggregating":[153],"contextual":[155],"semantic":[156],"images":[160],"large":[163],"receptive":[164],"field.":[165],"Moreover,":[166],"aiming":[167],"at":[168],"difference":[170],"between":[171],"detection":[174,181],"natural":[176],"detection,":[177],"original":[179],"head":[182],"(DH)":[183],"optimized":[185],"ensure":[187],"that":[188],"can":[190,218],"detect":[192],"defects.":[195],"Extensive":[196],"experiments":[197],"public":[201],"datasets":[202],"demonstrated":[204],"significant":[206],"advantage":[207],"compared":[208],"several":[210],"state-of-the-art":[211],"models,":[212],"whose":[213],"mean":[214],"average":[215],"precision":[216],"(mAP)":[217],"reach":[219],"98.6%,":[220],"verifying":[221],"accuracy":[223],"applicability":[225],"YOLO-HMC.":[229]},"counts_by_year":[{"year":2026,"cited_by_count":41},{"year":2025,"cited_by_count":102},{"year":2024,"cited_by_count":22}],"updated_date":"2026-07-25T15:57:00.446498","created_date":"2025-10-10T00:00:00"}