{"id":"https://openalex.org/W4390659495","doi":"https://doi.org/10.1109/tim.2024.3351230","title":"AC Magnetic Flux Leakage Testing With Real-Time Liftoff Compensation Using Double Layer Parallel-Cable Probe","display_name":"AC Magnetic Flux Leakage Testing With Real-Time Liftoff Compensation Using Double Layer Parallel-Cable Probe","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4390659495","doi":"https://doi.org/10.1109/tim.2024.3351230"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3351230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3351230","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002258450","display_name":"Shenghan Wang","orcid":"https://orcid.org/0000-0003-0789-2868"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shenghan Wang","raw_affiliation_strings":["School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-0789-2868","affiliations":[{"raw_affiliation_string":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101398284","display_name":"Yu Hu","orcid":"https://orcid.org/0009-0005-7963-726X"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Hu","raw_affiliation_strings":["School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0009-0005-7963-726X","affiliations":[{"raw_affiliation_string":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090257375","display_name":"Zhaoqi Duan","orcid":"https://orcid.org/0000-0001-8883-1025"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaoqi Duan","raw_affiliation_strings":["School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0001-8883-1025","affiliations":[{"raw_affiliation_string":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065963295","display_name":"Chun Yang Jiang","orcid":"https://orcid.org/0000-0002-0854-7620"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chun Jiang","raw_affiliation_strings":["School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-0854-7620","affiliations":[{"raw_affiliation_string":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025126717","display_name":"Yihua Kang","orcid":"https://orcid.org/0000-0003-2622-4769"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yihua Kang","raw_affiliation_strings":["School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-2622-4769","affiliations":[{"raw_affiliation_string":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000545422","display_name":"Bo Feng","orcid":"https://orcid.org/0000-0002-1057-3932"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Feng","raw_affiliation_strings":["School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-1057-3932","affiliations":[{"raw_affiliation_string":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":0.6901,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.61780811,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetic-flux-leakage","display_name":"Magnetic flux leakage","score":0.7596416473388672},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.6803265810012817},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.6107210516929626},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4987506866455078},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4957521855831146},{"id":"https://openalex.org/keywords/magnetic-flux","display_name":"Magnetic flux","score":0.48621049523353577},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.47466519474983215},{"id":"https://openalex.org/keywords/saturation","display_name":"Saturation (graph theory)","score":0.4657025933265686},{"id":"https://openalex.org/keywords/vibration","display_name":"Vibration","score":0.45481574535369873},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.445868581533432},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.4393550157546997},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4004805088043213},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36354053020477295},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.3570224642753601},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2123088836669922}],"concepts":[{"id":"https://openalex.org/C20892748","wikidata":"https://www.wikidata.org/wiki/Q4390394","display_name":"Magnetic flux leakage","level":3,"score":0.7596416473388672},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.6803265810012817},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.6107210516929626},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4987506866455078},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4957521855831146},{"id":"https://openalex.org/C157479481","wikidata":"https://www.wikidata.org/wiki/Q177831","display_name":"Magnetic flux","level":3,"score":0.48621049523353577},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.47466519474983215},{"id":"https://openalex.org/C9930424","wikidata":"https://www.wikidata.org/wiki/Q7426587","display_name":"Saturation (graph theory)","level":2,"score":0.4657025933265686},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.45481574535369873},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.445868581533432},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.4393550157546997},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4004805088043213},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36354053020477295},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.3570224642753601},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2123088836669922},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3351230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3351230","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6499999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G6582302743","display_name":null,"funder_award_id":"52105551","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W767604227","https://openalex.org/W1977245691","https://openalex.org/W1997348699","https://openalex.org/W2001936499","https://openalex.org/W2023734847","https://openalex.org/W2028491935","https://openalex.org/W2045581214","https://openalex.org/W2086150682","https://openalex.org/W2126827132","https://openalex.org/W2202445185","https://openalex.org/W2772618385","https://openalex.org/W2889711293","https://openalex.org/W2911819257","https://openalex.org/W2928072546","https://openalex.org/W3004932855","https://openalex.org/W3007378949","https://openalex.org/W3021117216","https://openalex.org/W3026404110","https://openalex.org/W3069528853","https://openalex.org/W3131335379","https://openalex.org/W4206267981","https://openalex.org/W4285253383","https://openalex.org/W4293235463","https://openalex.org/W4384158647","https://openalex.org/W4386385028"],"related_works":["https://openalex.org/W2902977491","https://openalex.org/W2101676717","https://openalex.org/W4241743597","https://openalex.org/W2165594630","https://openalex.org/W2577089618","https://openalex.org/W3005508687","https://openalex.org/W4383333701","https://openalex.org/W2120417348","https://openalex.org/W2045234003","https://openalex.org/W2015574894"],"abstract_inverted_index":{"During":[0],"electromagnetic":[1],"detection,":[2],"the":[3,9,15,21,24,29,40,44,47,50,53,58,66,92,97,102,106,109,112,137,143,147,161],"disturbing":[4],"magnetic":[5,17,30,87,94,103],"field":[6,18,26,31,95,104],"generated":[7,19],"by":[8,20],"defect":[10],"is":[11,121,157],"far":[12],"weaker":[13],"than":[14],"background":[16,25,93],"transmitter.":[22],"Thus,":[23],"can":[27,133,176],"cause":[28],"sensor":[32],"saturation":[33],"and":[34,49,100,118,123,127,135,139,159],"bring":[35,56],"interference":[36],"signals.":[37],"Meanwhile,":[38],"in":[39],"actual":[41],"detection":[42,67],"process,":[43],"deformation":[45],"of":[46,52,60,111,151,165,173],"material":[48],"vibration":[51],"probe":[54,113],"will":[55],"about":[57],"fluctuation":[59],"liftoff,":[61],"which":[62,90,132],"seriously":[63],"interferes":[64],"with":[65,169],"signal.":[68],"In":[69],"order":[70],"to":[71,114],"eliminate":[72],"these":[73],"two":[74],"interferences,":[75],"first,":[76],"this":[77],"article":[78],"proposes":[79],"a":[80,83,124,170],"magnetizer":[81],"using":[82,154],"double-layer":[84],"parallel":[85],"cables":[86],"bridge":[88],"circuit,":[89],"eliminates":[91],"at":[96,105,142],"measuring":[98],"element":[99],"enhances":[101],"workpiece.":[107],"Then,":[108],"ability":[110],"simultaneously":[115],"measure":[116,134],"liftoff":[117,138,156,162],"detect":[119],"defects":[120,141],"studied,":[122,158],"dual-channel":[125],"amplifier":[126],"acquisition":[128],"system":[129],"are":[130],"proposed,":[131],"compensate":[136],"quantify":[140],"same":[144],"time.":[145],"Finally,":[146],"feasibility":[148],"for":[149],"compensation":[150],"crack":[152],"signals":[153],"measured":[155],"within":[160],"variation":[163,172],"range":[164],"0.2\u20132.0":[166],"mm,":[167],"cracks":[168],"depth":[171],"1.0\u20132.0":[174],"mm":[175],"be":[177],"effectively":[178],"compensated.":[179]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}