{"id":"https://openalex.org/W4390604037","doi":"https://doi.org/10.1109/tim.2024.3350134","title":"Measuring the Dissipation Factor of Capacitive Equipment Under Damped AC Voltage","display_name":"Measuring the Dissipation Factor of Capacitive Equipment Under Damped AC Voltage","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4390604037","doi":"https://doi.org/10.1109/tim.2024.3350134"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2024.3350134","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3350134","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091071614","display_name":"Mengxin Zhu","orcid":"https://orcid.org/0000-0001-9465-1469"},"institutions":[{"id":"https://openalex.org/I4391768273","display_name":"State Key Laboratory of Electrical Insulation and Power Equipment","ror":"https://ror.org/03kd9rr37","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768273","https://openalex.org/I87445476"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mengxin Zhu","raw_affiliation_strings":["State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China"],"raw_orcid":"https://orcid.org/0000-0001-9465-1469","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I87445476","https://openalex.org/I4391768273"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086457702","display_name":"Fangzhou Shi","orcid":"https://orcid.org/0009-0002-7792-516X"},"institutions":[{"id":"https://openalex.org/I4391768273","display_name":"State Key Laboratory of Electrical Insulation and Power Equipment","ror":"https://ror.org/03kd9rr37","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768273","https://openalex.org/I87445476"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fangzhou Shi","raw_affiliation_strings":["State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China"],"raw_orcid":"https://orcid.org/0009-0002-7792-516X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I87445476","https://openalex.org/I4391768273"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043789151","display_name":"Li Wang","orcid":"https://orcid.org/0000-0002-7131-6534"},"institutions":[{"id":"https://openalex.org/I4391768273","display_name":"State Key Laboratory of Electrical Insulation and Power Equipment","ror":"https://ror.org/03kd9rr37","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768273","https://openalex.org/I87445476"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li Wang","raw_affiliation_strings":["State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China"],"raw_orcid":"https://orcid.org/0000-0002-7131-6534","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I87445476","https://openalex.org/I4391768273"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103127484","display_name":"Junbai Chen","orcid":"https://orcid.org/0000-0002-9114-5381"},"institutions":[{"id":"https://openalex.org/I4391768273","display_name":"State Key Laboratory of Electrical Insulation and Power Equipment","ror":"https://ror.org/03kd9rr37","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768273","https://openalex.org/I87445476"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junbai Chen","raw_affiliation_strings":["State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China"],"raw_orcid":"https://orcid.org/0000-0002-9114-5381","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I87445476","https://openalex.org/I4391768273"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047370796","display_name":"Yuan Yan","orcid":"https://orcid.org/0000-0001-9284-1584"},"institutions":[{"id":"https://openalex.org/I4391768273","display_name":"State Key Laboratory of Electrical Insulation and Power Equipment","ror":"https://ror.org/03kd9rr37","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768273","https://openalex.org/I87445476"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuan Yan","raw_affiliation_strings":["State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China"],"raw_orcid":"https://orcid.org/0000-0001-9284-1584","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I87445476","https://openalex.org/I4391768273"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042809920","display_name":"Xin Xia","orcid":"https://orcid.org/0009-0008-7408-6739"},"institutions":[{"id":"https://openalex.org/I4391768273","display_name":"State Key Laboratory of Electrical Insulation and Power Equipment","ror":"https://ror.org/03kd9rr37","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768273","https://openalex.org/I87445476"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Xia","raw_affiliation_strings":["State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China"],"raw_orcid":"https://orcid.org/0009-0008-7408-6739","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I87445476","https://openalex.org/I4391768273"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100631990","display_name":"Hongjie Li","orcid":"https://orcid.org/0000-0002-9546-8938"},"institutions":[{"id":"https://openalex.org/I4391768273","display_name":"State Key Laboratory of Electrical Insulation and Power Equipment","ror":"https://ror.org/03kd9rr37","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768273","https://openalex.org/I87445476"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongjie Li","raw_affiliation_strings":["State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China"],"raw_orcid":"https://orcid.org/0000-0002-9546-8938","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I87445476","https://openalex.org/I4391768273"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9281,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.72659077,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10787","display_name":"Lightning and Electromagnetic Phenomena","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.6980332136154175},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.682133674621582},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6460263729095459},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5931992530822754},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5004537105560303},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.4976392090320587},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4632946252822876},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.4614371955394745},{"id":"https://openalex.org/keywords/power-factor","display_name":"Power factor","score":0.4551120400428772},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.42008838057518005},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4018537700176239},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32097822427749634},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30406633019447327},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24708613753318787}],"concepts":[{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6980332136154175},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.682133674621582},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6460263729095459},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5931992530822754},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5004537105560303},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.4976392090320587},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4632946252822876},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.4614371955394745},{"id":"https://openalex.org/C64424096","wikidata":"https://www.wikidata.org/wiki/Q750454","display_name":"Power factor","level":3,"score":0.4551120400428772},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.42008838057518005},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4018537700176239},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32097822427749634},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30406633019447327},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24708613753318787},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2024.3350134","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2024.3350134","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.800000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W210359992","https://openalex.org/W617690559","https://openalex.org/W1493928068","https://openalex.org/W2034002463","https://openalex.org/W2082538389","https://openalex.org/W2088676418","https://openalex.org/W2099855986","https://openalex.org/W2121413289","https://openalex.org/W2130582696","https://openalex.org/W2135230732","https://openalex.org/W2152529310","https://openalex.org/W2160855877","https://openalex.org/W2176369011","https://openalex.org/W2214705985","https://openalex.org/W2608879712","https://openalex.org/W2921160297","https://openalex.org/W2946375428","https://openalex.org/W3047952440","https://openalex.org/W3149754046","https://openalex.org/W4206302838","https://openalex.org/W4206982552","https://openalex.org/W4210353635","https://openalex.org/W4234330728","https://openalex.org/W4362498813","https://openalex.org/W4377001535","https://openalex.org/W4384284131","https://openalex.org/W4389236309","https://openalex.org/W6619471939"],"related_works":["https://openalex.org/W2348740411","https://openalex.org/W2051563071","https://openalex.org/W1966596465","https://openalex.org/W2337947459","https://openalex.org/W4386858602","https://openalex.org/W2118205267","https://openalex.org/W2126912594","https://openalex.org/W1988444705","https://openalex.org/W4292622326","https://openalex.org/W1972468229"],"abstract_inverted_index":{"Damped":[0],"ac":[1],"(DAC)":[2],"test":[3,34,139],"is":[4,25,47,105,118,144,166],"widely":[5],"used":[6],"in":[7,31,100,129],"the":[8,28,32,37,40,62,84,93,101,130,135,138,141,152,179,184,205,212],"insulation":[9],"diagnosis":[10],"of":[11,27,39,65,87,92,137,155,183,222],"capacitive":[12],"power":[13,67,71],"equipment":[14],"due":[15],"to":[16,59,120,134],"its":[17,169],"flexibility":[18],"and":[19,89,109,114,125,160,168,172,181],"multifunctionality.":[20],"The":[21,208],"dissipation":[22],"factor":[23],"(DF)":[24],"one":[26,104,143],"crucial":[29],"functions":[30],"DAC":[33,46,94,107],"system.":[35],"However,":[36],"resolution":[38],"existing":[41],"DF":[42,63,79,147,197,218],"measuring":[43],"method":[44,81,186,214],"under":[45],"too":[48],"low":[49],"(i.e.,":[50],"<inline-formula":[51,223],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[52,224],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[53,225],"<tex-math":[54,226],"notation=\"LaTeX\">$1\\times":[55,227],"10^{-3}$":[56],"</tex-math></inline-formula>":[57,229],")":[58],"accurately":[60,216],"measure":[61,217],"value":[64,148],"some":[66],"equipment,":[68],"such":[69],"as":[70],"cables.":[72],"Accordingly,":[73],"this":[74],"article":[75],"proposes":[76],"an":[77,220],"improved":[78],"estimation":[80,149],"based":[82],"on":[83,193],"combined":[85],"analysis":[86],"voltage":[88,108,132],"current":[90,110],"waveforms":[91],"stress.":[95],"Two":[96],"improvements":[97],"are":[98,111,174,187],"involved":[99],"developed":[102,119],"method:":[103],"that":[106,145,211],"measured":[112],"simultaneously":[113],"a":[115,146,161,190,194,202],"measurement":[116],"approach":[117,165],"minimize":[121],"theoretical":[122],"phase":[123],"errors":[124],"avoid":[126],"any":[127],"increase":[128],"ground":[131],"owing":[133],"breakdown":[136],"object;":[140],"other":[142],"algorithm":[150],"via":[151,189],"joint":[153],"application":[154],"all-phase":[156],"fast":[157],"Fourier":[158],"transform":[159],"nonlinear":[162],"least":[163],"squares":[164],"developed,":[167],"superior":[170],"accuracy":[171],"robustness":[173],"verified":[175],"through":[176],"simulation.":[177],"Finally,":[178],"strength":[180],"feasibility":[182],"proposed":[185,213],"validated":[188],"laboratory":[191],"experiment":[192],"10-kV":[195],"variable":[196],"standard":[198],"capacitor,":[199],"along":[200],"with":[201,204,219],"comparison":[203],"conventional":[206],"solution.":[207],"result":[209],"shows":[210],"can":[215],"order":[221],"10^{-4}$":[228],".":[230]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}