{"id":"https://openalex.org/W4390493996","doi":"https://doi.org/10.1109/tim.2023.3348888","title":"A Valid Evaluation Method for Electromagnetic Shielding Efficiency of Metallic Mesh Based on Free-Space Reflection Measurement","display_name":"A Valid Evaluation Method for Electromagnetic Shielding Efficiency of Metallic Mesh Based on Free-Space Reflection Measurement","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4390493996","doi":"https://doi.org/10.1109/tim.2023.3348888"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3348888","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3348888","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029726063","display_name":"Zhengang Lu","orcid":"https://orcid.org/0000-0001-6490-5819"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengang Lu","raw_affiliation_strings":["Ultra-Precision Optical and Electronic Instrument Engineering Center, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0001-6490-5819","affiliations":[{"raw_affiliation_string":"Ultra-Precision Optical and Electronic Instrument Engineering Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101874702","display_name":"Zhibo Cao","orcid":"https://orcid.org/0000-0002-6753-0749"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhibo Cao","raw_affiliation_strings":["Ultra-Precision Optical and Electronic Instrument Engineering Center, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-6753-0749","affiliations":[{"raw_affiliation_string":"Ultra-Precision Optical and Electronic Instrument Engineering Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090605103","display_name":"Jiubin Tan","orcid":"https://orcid.org/0000-0002-0941-7932"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiubin Tan","raw_affiliation_strings":["Ultra-Precision Optical and Electronic Instrument Engineering Center, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-0941-7932","affiliations":[{"raw_affiliation_string":"Ultra-Precision Optical and Electronic Instrument Engineering Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":{"value":2495,"currency":"USD","value_usd":2495},"apc_paid":null,"fwci":0.5125,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.51167972,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-shielding","display_name":"Electromagnetic shielding","score":0.8589602112770081},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.597727358341217},{"id":"https://openalex.org/keywords/reflection-coefficient","display_name":"Reflection coefficient","score":0.5563386082649231},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5350785255432129},{"id":"https://openalex.org/keywords/anechoic-chamber","display_name":"Anechoic chamber","score":0.5286089777946472},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4673519432544708},{"id":"https://openalex.org/keywords/transmission-coefficient","display_name":"Transmission coefficient","score":0.41902539134025574},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.39073646068573},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3711426556110382},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3446961045265198},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3081520199775696},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17007777094841003},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15347975492477417},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14785677194595337},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.11061206459999084}],"concepts":[{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.8589602112770081},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.597727358341217},{"id":"https://openalex.org/C41700454","wikidata":"https://www.wikidata.org/wiki/Q1852282","display_name":"Reflection coefficient","level":2,"score":0.5563386082649231},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5350785255432129},{"id":"https://openalex.org/C149712133","wikidata":"https://www.wikidata.org/wiki/Q332774","display_name":"Anechoic chamber","level":2,"score":0.5286089777946472},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4673519432544708},{"id":"https://openalex.org/C55310301","wikidata":"https://www.wikidata.org/wiki/Q75384","display_name":"Transmission coefficient","level":3,"score":0.41902539134025574},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.39073646068573},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3711426556110382},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3446961045265198},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3081520199775696},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17007777094841003},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15347975492477417},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14785677194595337},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.11061206459999084},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3348888","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3348888","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6899999976158142,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G4048853208","display_name":null,"funder_award_id":"BS61975046","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1538889225","https://openalex.org/W1998272117","https://openalex.org/W2058993077","https://openalex.org/W2108767095","https://openalex.org/W2112876900","https://openalex.org/W2123904602","https://openalex.org/W2138798176","https://openalex.org/W2148211756","https://openalex.org/W2155473037","https://openalex.org/W2160284352","https://openalex.org/W2338163480","https://openalex.org/W2890351524","https://openalex.org/W2919607171","https://openalex.org/W2946999178","https://openalex.org/W2969091710","https://openalex.org/W2972477187","https://openalex.org/W3006633086","https://openalex.org/W3009384818","https://openalex.org/W3154341715","https://openalex.org/W4248288458","https://openalex.org/W4281612508","https://openalex.org/W4286436482","https://openalex.org/W4290829954","https://openalex.org/W4322706775","https://openalex.org/W4367840581","https://openalex.org/W6679371886"],"related_works":["https://openalex.org/W2279353097","https://openalex.org/W2361611705","https://openalex.org/W2102167196","https://openalex.org/W4386004670","https://openalex.org/W2064709604","https://openalex.org/W2038558525","https://openalex.org/W2329459365","https://openalex.org/W2588832254","https://openalex.org/W2362680144","https://openalex.org/W3052101671"],"abstract_inverted_index":{"Metallic":[0],"mesh":[1,16,54,80,108,184],"is":[2,109,156],"an":[3],"important":[4,157],"transparent":[5],"electromagnetic":[6],"shielding":[7,22,31,74],"component":[8],"with":[9,131,142],"applications":[10],"in":[11,25,99,137],"many":[12],"fields.":[13],"When":[14],"metallic":[15,53,79,107,183],"has":[17],"been":[18],"assembled":[19],"to":[20,66,152,158,163,182,187],"the":[21,30,50,60,73,78,87,90,96,100,103,106,117,120,128,143,160,165,175],"enclosure":[23],"and":[24,92,200],"use,":[26],"direct":[27],"evaluation":[28,47],"of":[29,52,72],"efficiency":[32],"(SE)":[33],"through":[34,95],"common":[35],"transmission":[36,97],"method":[37,48,177],"becomes":[38],"difficult.":[39],"In":[40,113],"this":[41],"study,":[42],"we":[43,85],"proposed":[44,176],"a":[45,82,114],"valid":[46],"for":[49,59,127],"SE":[51,91,132,145],"based":[55],"on":[56],"reflection":[57,93],"measurement":[58,65],"first":[61],"time,":[62],"which":[63],"allows":[64],"be":[67],"performed":[68],"at":[69],"one":[70],"side":[71],"components.":[75],"By":[76],"modeling":[77],"as":[81,194],"two-port":[83],"network,":[84],"established":[86],"relationship":[88],"between":[89],"coefficient":[94],"matrix":[98],"case":[101],"that":[102,154,174],"equivalent":[104],"admittance$Y$of":[105],"unknown":[110],"before":[111],"testing.":[112],"nonanechoic":[115],"environment,":[116],"experiment":[118],"demonstrated":[119],"maximum":[121],"test":[122],"deviation":[123],"was":[124,149],"0.95":[125],"dB":[126,136],"testing":[129],"sample":[130],"greater":[133],"than":[134],"15":[135],"the$Ku$-band":[138],"(12\u201318":[139],"GHz)":[140],"compared":[141],"normal":[144],"measurement.":[146],"Accuracy":[147],"analysis":[148],"carried":[150],"out":[151],"illustrate":[153],"it":[155],"reduce":[159],"phase":[161],"error":[162],"control":[164],"entire":[166],"uncertainty.":[167],"Moreover,":[168],"extra":[169],"numerical":[170],"studies":[171],"further":[172],"proved":[173],"can":[178],"apply":[179],"not":[180],"only":[181],"but":[185],"also":[186],"other":[188],"impedance":[189],"film\u2013substrate":[190],"bilayer":[191],"structures":[192],"such":[193],"meshed":[195],"frequency":[196],"selection":[197],"surface":[198],"(FSS)":[199],"semiconductor":[201],"films.":[202]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":4}],"updated_date":"2026-08-28T12:50:07.497085","created_date":"2025-10-10T00:00:00"}