{"id":"https://openalex.org/W4390187912","doi":"https://doi.org/10.1109/tim.2023.3346500","title":"A Compressive Learning-Based Scheme for Nonlinear Reconstructions in Electrical Impedance Tomography","display_name":"A Compressive Learning-Based Scheme for Nonlinear Reconstructions in Electrical Impedance Tomography","publication_year":2023,"publication_date":"2023-12-25","ids":{"openalex":"https://openalex.org/W4390187912","doi":"https://doi.org/10.1109/tim.2023.3346500"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3346500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3346500","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101460179","display_name":"Zheng Zong","orcid":"https://orcid.org/0000-0002-3516-0261"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zheng Zong","raw_affiliation_strings":["College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-3516-0261","affiliations":[{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100706499","display_name":"Yusong Wang","orcid":"https://orcid.org/0000-0002-9772-6400"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yusong Wang","raw_affiliation_strings":["College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-9772-6400","affiliations":[{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101559986","display_name":"Siyuan He","orcid":"https://orcid.org/0000-0002-9393-9812"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siyuan He","raw_affiliation_strings":["College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-9393-9812","affiliations":[{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090777984","display_name":"Yongjian Zhu","orcid":"https://orcid.org/0000-0002-5924-1998"},"institutions":[{"id":"https://openalex.org/I4210158318","display_name":"Second Affiliated Hospital of Zhejiang University","ror":"https://ror.org/059cjpv64","country_code":"CN","type":"healthcare","lineage":["https://openalex.org/I4210158318"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yong-Jian Zhu","raw_affiliation_strings":["Department of Neurosurgery, The Second Affiliated Hospital, Zhejiang University School of Medicine, Shangcheng, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-5924-1998","affiliations":[{"raw_affiliation_string":"Department of Neurosurgery, The Second Affiliated Hospital, Zhejiang University School of Medicine, Shangcheng, Hangzhou, China","institution_ids":["https://openalex.org/I4210158318"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074289048","display_name":"Zhun Wei","orcid":"https://orcid.org/0000-0002-8699-3749"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhun Wei","raw_affiliation_strings":["College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-8699-3749","affiliations":[{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101460179"],"corresponding_institution_ids":["https://openalex.org/I76130692"],"apc_list":null,"apc_paid":null,"fwci":1.2776,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.80447057,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6295097470283508},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.6074214577674866},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5927115082740784},{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.5332512259483337},{"id":"https://openalex.org/keywords/compressed-sensing","display_name":"Compressed sensing","score":0.4971320927143097},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.49407485127449036},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4608447551727295},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4531642496585846},{"id":"https://openalex.org/keywords/memory-footprint","display_name":"Memory footprint","score":0.43286556005477905},{"id":"https://openalex.org/keywords/iterative-method","display_name":"Iterative method","score":0.4286923110485077},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.42316934466362},{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.4148685336112976},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.2165537178516388},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.19956988096237183},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13784295320510864}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6295097470283508},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.6074214577674866},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5927115082740784},{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.5332512259483337},{"id":"https://openalex.org/C124851039","wikidata":"https://www.wikidata.org/wiki/Q2665459","display_name":"Compressed sensing","level":2,"score":0.4971320927143097},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.49407485127449036},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4608447551727295},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4531642496585846},{"id":"https://openalex.org/C74912251","wikidata":"https://www.wikidata.org/wiki/Q6815727","display_name":"Memory footprint","level":2,"score":0.43286556005477905},{"id":"https://openalex.org/C159694833","wikidata":"https://www.wikidata.org/wiki/Q2321565","display_name":"Iterative method","level":2,"score":0.4286923110485077},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.42316934466362},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.4148685336112976},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.2165537178516388},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.19956988096237183},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13784295320510864},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3346500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3346500","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8175293242","display_name":null,"funder_award_id":"2022ZD0117802","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":71,"referenced_works":["https://openalex.org/W315413564","https://openalex.org/W1971508657","https://openalex.org/W1998669985","https://openalex.org/W2060131032","https://openalex.org/W2076862184","https://openalex.org/W2077264800","https://openalex.org/W2082949320","https://openalex.org/W2133665775","https://openalex.org/W2135955684","https://openalex.org/W2279098554","https://openalex.org/W2409678566","https://openalex.org/W2562637781","https://openalex.org/W2606372414","https://openalex.org/W2738615740","https://openalex.org/W2767248316","https://openalex.org/W2777802649","https://openalex.org/W2795198316","https://openalex.org/W2908202080","https://openalex.org/W2909010875","https://openalex.org/W2910112947","https://openalex.org/W2910732135","https://openalex.org/W2913384339","https://openalex.org/W2916125097","https://openalex.org/W2945655823","https://openalex.org/W2946763030","https://openalex.org/W2957655083","https://openalex.org/W2963125010","https://openalex.org/W2963392702","https://openalex.org/W2963917315","https://openalex.org/W2965386100","https://openalex.org/W2975670401","https://openalex.org/W2981658631","https://openalex.org/W2990045899","https://openalex.org/W2990050904","https://openalex.org/W2999516274","https://openalex.org/W3005368325","https://openalex.org/W3010649991","https://openalex.org/W3013193552","https://openalex.org/W3034733718","https://openalex.org/W3101681511","https://openalex.org/W3110832096","https://openalex.org/W3118091436","https://openalex.org/W3122676996","https://openalex.org/W3160733781","https://openalex.org/W3165290021","https://openalex.org/W3168686693","https://openalex.org/W3184565761","https://openalex.org/W3208201226","https://openalex.org/W4200366524","https://openalex.org/W4205623635","https://openalex.org/W4210444635","https://openalex.org/W4213362499","https://openalex.org/W4213425554","https://openalex.org/W4220808041","https://openalex.org/W4220961705","https://openalex.org/W4225473813","https://openalex.org/W4282039350","https://openalex.org/W4285291722","https://openalex.org/W4285505301","https://openalex.org/W4286369540","https://openalex.org/W4286656131","https://openalex.org/W4293233348","https://openalex.org/W4297775537","https://openalex.org/W4300192729","https://openalex.org/W4308875872","https://openalex.org/W4312552085","https://openalex.org/W4322490774","https://openalex.org/W4362714483","https://openalex.org/W6695314431","https://openalex.org/W6736141755","https://openalex.org/W6737664043"],"related_works":["https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W2000128178","https://openalex.org/W2902419700","https://openalex.org/W2093495347","https://openalex.org/W3160616384","https://openalex.org/W2905540725","https://openalex.org/W4376629886","https://openalex.org/W2537891456","https://openalex.org/W2101428392"],"abstract_inverted_index":{"Recently,":[0],"the":[1,42,70,78,137,145,185,194],"application":[2],"of":[3,133,162],"deep":[4,140,146],"learning":[5,141],"techniques":[6],"has":[7,124],"provided":[8],"significant":[9],"advances":[10],"in":[11,35,60,204],"solving":[12],"nonlinear":[13],"electrical":[14],"impedance":[15],"tomography":[16],"(EIT)":[17],"problems.":[18],"However,":[19],"when":[20,165],"state-of-the-art":[21],"performance":[22],"is":[23,54,58,74,97,117,191],"pushed":[24],"further,":[25],"these":[26,168],"models":[27],"become":[28],"bigger":[29],"and":[30,45,102,129,144,152,202],"more":[31],"difficult":[32],"to":[33,40,76,82],"use":[34],"computation-limited":[36],"scenarios.":[37],"In":[38],"order":[39],"reduce":[41],"computational":[43],"overhead":[44],"memory":[46],"footprint,":[47],"an":[48],"EIT-specific":[49],"compressive":[50,89],"learning-based":[51,173],"scheme":[52,142],"(CLS)":[53],"proposed.":[55],"The":[56],"CLS":[57,123,196],"implemented":[59],"a":[61,65,87,107,159,172],"two-stage":[62],"strategy.":[63],"First,":[64],"noniterative":[66],"inverse":[67],"operator,":[68],"named":[69],"dominant":[71,138],"current-based":[72],"method,":[73],"introduced":[75],"map":[77],"EIT":[79],"measurement":[80],"data":[81],"approximate":[83],"conductivity":[84],"images.":[85],"Second,":[86],"wavelet-based":[88],"convolutional":[90],"neural":[91],"network":[92,131],"(CNN)":[93],"with":[94,111,167],"separable":[95],"convolution":[96],"learned":[98],"by":[99],"rough":[100],"image":[101,104],"target":[103],"pairs,":[105],"where":[106],"custom":[108],"loss":[109],"function":[110],"mixed":[112],"structural":[113],"similarity":[114],"(SSIM)":[115],"metrics":[116],"proposed":[118,122],"for":[119],"training.":[120],"Our":[121],"only":[125],"0.26%":[126],"trainable":[127],"parameters":[128],"0.61%":[130],"size":[132],"benchmark":[134,169],"methods,":[135,182],"including":[136],"current":[139],"(DC-DLS)":[143],"D-bar":[147],"method.":[148],"Nevertheless,":[149],"extensive":[150],"numerical":[151],"practical":[153],"experiments":[154],"demonstrate":[155],"that":[156,193],"it":[157,175],"achieves":[158],"comparable":[160],"level":[161],"reconstruction":[163],"quality":[164],"compared":[166],"methods.":[170],"As":[171],"approach,":[174],"also":[176],"exhibits":[177],"advantages":[178],"over":[179],"traditional":[180],"iterative":[181],"such":[183],"as":[184],"subspace":[186],"optimization":[187],"method":[188],"(SOM).":[189],"It":[190],"anticipated":[192],"suggested":[195],"would":[197],"encourage":[198],"further":[199],"compression":[200],"studies":[201],"applications":[203],"EIT.":[205]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}