{"id":"https://openalex.org/W4389887942","doi":"https://doi.org/10.1109/tim.2023.3343769","title":"Fast Adaptive Coarse-to-Fine PatchMatch-Based Defect Detection on Nonflat Prints","display_name":"Fast Adaptive Coarse-to-Fine PatchMatch-Based Defect Detection on Nonflat Prints","publication_year":2023,"publication_date":"2023-12-18","ids":{"openalex":"https://openalex.org/W4389887942","doi":"https://doi.org/10.1109/tim.2023.3343769"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3343769","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3343769","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066087170","display_name":"Chenbo Shi","orcid":"https://orcid.org/0000-0002-8022-5992"},"institutions":[{"id":"https://openalex.org/I80143920","display_name":"Shandong University of Science and Technology","ror":"https://ror.org/04gtjhw98","country_code":"CN","type":"education","lineage":["https://openalex.org/I80143920"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenbo Shi","raw_affiliation_strings":["College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China"],"raw_orcid":"https://orcid.org/0000-0002-8022-5992","affiliations":[{"raw_affiliation_string":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China","institution_ids":["https://openalex.org/I80143920"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014784963","display_name":"Baodun Jia","orcid":"https://orcid.org/0009-0003-2776-3227"},"institutions":[{"id":"https://openalex.org/I80143920","display_name":"Shandong University of Science and Technology","ror":"https://ror.org/04gtjhw98","country_code":"CN","type":"education","lineage":["https://openalex.org/I80143920"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baodun Jia","raw_affiliation_strings":["College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China"],"raw_orcid":"https://orcid.org/0009-0003-2776-3227","affiliations":[{"raw_affiliation_string":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China","institution_ids":["https://openalex.org/I80143920"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014997289","display_name":"C. Zhang","orcid":"https://orcid.org/0009-0009-3865-963X"},"institutions":[{"id":"https://openalex.org/I80143920","display_name":"Shandong University of Science and Technology","ror":"https://ror.org/04gtjhw98","country_code":"CN","type":"education","lineage":["https://openalex.org/I80143920"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chun Zhang","raw_affiliation_strings":["College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China"],"raw_orcid":"https://orcid.org/0009-0009-3865-963X","affiliations":[{"raw_affiliation_string":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China","institution_ids":["https://openalex.org/I80143920"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000155348","display_name":"Xiangteng Zang","orcid":"https://orcid.org/0000-0002-9932-1984"},"institutions":[{"id":"https://openalex.org/I80143920","display_name":"Shandong University of Science and Technology","ror":"https://ror.org/04gtjhw98","country_code":"CN","type":"education","lineage":["https://openalex.org/I80143920"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangteng Zang","raw_affiliation_strings":["College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China"],"raw_orcid":"https://orcid.org/0000-0002-9932-1984","affiliations":[{"raw_affiliation_string":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China","institution_ids":["https://openalex.org/I80143920"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101639610","display_name":"Junsheng Zhang","orcid":"https://orcid.org/0009-0008-0013-3598"},"institutions":[{"id":"https://openalex.org/I80143920","display_name":"Shandong University of Science and Technology","ror":"https://ror.org/04gtjhw98","country_code":"CN","type":"education","lineage":["https://openalex.org/I80143920"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junsheng Zhang","raw_affiliation_strings":["College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China"],"raw_orcid":"https://orcid.org/0009-0008-0013-3598","affiliations":[{"raw_affiliation_string":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China","institution_ids":["https://openalex.org/I80143920"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114752815","display_name":"Jiang Xin","orcid":"https://orcid.org/0009-0006-8989-8196"},"institutions":[{"id":"https://openalex.org/I80143920","display_name":"Shandong University of Science and Technology","ror":"https://ror.org/04gtjhw98","country_code":"CN","type":"education","lineage":["https://openalex.org/I80143920"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Jiang","raw_affiliation_strings":["College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China"],"raw_orcid":"https://orcid.org/0009-0006-8989-8196","affiliations":[{"raw_affiliation_string":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China","institution_ids":["https://openalex.org/I80143920"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008984115","display_name":"Changsheng Zhu","orcid":"https://orcid.org/0000-0003-2083-2704"},"institutions":[{"id":"https://openalex.org/I80143920","display_name":"Shandong University of Science and Technology","ror":"https://ror.org/04gtjhw98","country_code":"CN","type":"education","lineage":["https://openalex.org/I80143920"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changsheng Zhu","raw_affiliation_strings":["College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China"],"raw_orcid":"https://orcid.org/0000-0003-2083-2704","affiliations":[{"raw_affiliation_string":"College of Intelligent Equipment, Shandong University of Science and Technology, Tai’an, China","institution_ids":["https://openalex.org/I80143920"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1881,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.60871958,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/image-warping","display_name":"Image warping","score":0.7799102067947388},{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.682303786277771},{"id":"https://openalex.org/keywords/displacement-field","display_name":"Displacement field","score":0.6803462505340576},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5897246599197388},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5843086838722229},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.5784491300582886},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49901723861694336},{"id":"https://openalex.org/keywords/deformation","display_name":"Deformation (meteorology)","score":0.49347078800201416},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.481918603181839},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.46606069803237915},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4128149151802063},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.38946014642715454},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3474229574203491},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.33967188000679016},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11392781138420105},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.10732695460319519},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10115653276443481},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.09987163543701172},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.07493248581886292}],"concepts":[{"id":"https://openalex.org/C157202957","wikidata":"https://www.wikidata.org/wiki/Q1659609","display_name":"Image warping","level":2,"score":0.7799102067947388},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.682303786277771},{"id":"https://openalex.org/C29660869","wikidata":"https://www.wikidata.org/wiki/Q5282615","display_name":"Displacement field","level":3,"score":0.6803462505340576},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5897246599197388},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5843086838722229},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.5784491300582886},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49901723861694336},{"id":"https://openalex.org/C204366326","wikidata":"https://www.wikidata.org/wiki/Q3027650","display_name":"Deformation (meteorology)","level":2,"score":0.49347078800201416},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.481918603181839},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.46606069803237915},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4128149151802063},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.38946014642715454},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3474229574203491},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.33967188000679016},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11392781138420105},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.10732695460319519},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10115653276443481},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.09987163543701172},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.07493248581886292},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3343769","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3343769","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities","score":0.49000000953674316}],"awards":[{"id":"https://openalex.org/G399306896","display_name":null,"funder_award_id":"2023TATSGC051","funder_id":"https://openalex.org/F4320313895","funder_display_name":"Department of Science and Technology of Shandong Province"},{"id":"https://openalex.org/G8037270230","display_name":null,"funder_award_id":"2023TATSGC014","funder_id":"https://openalex.org/F4320313895","funder_display_name":"Department of Science and Technology of Shandong Province"}],"funders":[{"id":"https://openalex.org/F4320313895","display_name":"Department of Science and Technology of Shandong Province","ror":"https://ror.org/01b9fvd84"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1578285471","https://openalex.org/W1762798876","https://openalex.org/W1867429401","https://openalex.org/W1951289974","https://openalex.org/W2048710758","https://openalex.org/W2090518410","https://openalex.org/W2113221323","https://openalex.org/W2128060444","https://openalex.org/W2131747574","https://openalex.org/W2163148245","https://openalex.org/W2441099548","https://openalex.org/W2545478168","https://openalex.org/W2727459456","https://openalex.org/W2738028674","https://openalex.org/W2790999834","https://openalex.org/W2905310541","https://openalex.org/W3127528059","https://openalex.org/W4205388843","https://openalex.org/W4210860225","https://openalex.org/W4289792391","https://openalex.org/W4308235797","https://openalex.org/W4312298392","https://openalex.org/W6758101687"],"related_works":["https://openalex.org/W1670332068","https://openalex.org/W2095618524","https://openalex.org/W2735770592","https://openalex.org/W1971024059","https://openalex.org/W1502062143","https://openalex.org/W4224236531","https://openalex.org/W4291993329","https://openalex.org/W3015130003","https://openalex.org/W3153956783","https://openalex.org/W2801262036"],"abstract_inverted_index":{"Residual":[0],"map":[1,43],"based":[2,44,140],"defect":[3],"detection":[4,199],"methods":[5,45],"have":[6],"been":[7],"widely":[8,82],"concerned":[9],"in":[10,19,36,84,197],"the":[11,38,59,64,71,85,91,101,116,130,145,155,161,169,180,198],"field":[12,121,157],"of":[13,16,22,32,93,133,164,200],"prints,":[14,205],"because":[15],"their":[17],"superiority":[18],"detecting":[20,37],"defects":[21,202],"arbitrary":[23],"shapes":[24],"and":[25,80,136,152,166,192],"extreme":[26],"aspect":[27],"ratios":[28],"by":[29,62,100,168],"taking":[30],"advantage":[31],"pixel-level":[33],"comparison,":[34],"especially":[35],"tiny":[39,201],"defects.":[40],"However,":[41],"residual":[42],"require":[46],"extremely":[47],"high":[48],"structural":[49,60],"similarity":[50],"between":[51],"images,":[52,88],"so":[53,144],"it":[54],"is":[55,158,207],"important":[56],"to":[57,67,129,172,179],"eliminate":[58],"differences":[61],"warping":[63],"tested":[65],"image":[66,69],"template":[68],"via":[70],"displacement":[72,79,97,120,138,156],"field.":[73,98],"In":[74],"practice,":[75],"weak":[76],"textures,":[77],"large":[78],"deformation":[81,175],"existed":[83],"non-flat":[86,204],"print":[87],"which":[89,206],"increased":[90],"difficulty":[92],"obtaining":[94],"a":[95],"satisfied":[96],"Inspired":[99],"PatchMatch,":[102],"our":[103],"approach,":[104],"ACPM":[105,165],"(Adaptive":[106],"Coarse-to-fine":[107],"PatchMatch),":[108],"blends":[109],"an":[110,194],"adaptive":[111,125],"patch":[112],"matching":[113,146,162],"strategy":[114],"with":[115,189],"coarse-to-fine":[117],"scheme":[118],"for":[119,210],"estimation.":[122],"We":[123],"generate":[124],"size":[126],"patches":[127],"according":[128],"texture":[131],"richness":[132],"local":[134],"regions":[135],"propagate":[137],"information":[139],"on":[141,203],"morphological":[142],"operations,":[143],"correspondences":[147],"can":[148,185],"be":[149],"more":[150,208],"reliable":[151],"accurate.":[153],"Furthermore,":[154],"interpolated":[159],"from":[160],"result":[163],"refined":[167],"variational":[170],"model":[171],"tackle":[173],"non-rigid":[174],"(called":[176],"ACPMFlow).":[177],"Compared":[178],"state-of-the-art":[181],"method":[182],"DeepFlow,":[183],"ACPMFlow":[184],"achieve":[186],"comparable":[187],"performance":[188,196],"20x":[190],"speed,":[191],"obtain":[193],"excellent":[195],"suitable":[209],"real-time":[211],"inspection.":[212]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}