{"id":"https://openalex.org/W4388505271","doi":"https://doi.org/10.1109/tim.2023.3331419","title":"Overcoming Limited Fault Data: Intermittent Fault Detection in Analog Circuits via Improved GAN","display_name":"Overcoming Limited Fault Data: Intermittent Fault Detection in Analog Circuits via Improved GAN","publication_year":2023,"publication_date":"2023-11-08","ids":{"openalex":"https://openalex.org/W4388505271","doi":"https://doi.org/10.1109/tim.2023.3331419"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3331419","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3331419","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021498167","display_name":"Xiaoyu Fang","orcid":"https://orcid.org/0000-0002-7350-3085"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaoyu Fang","raw_affiliation_strings":["School of Automation, Chongqing University, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0002-7350-3085","affiliations":[{"raw_affiliation_string":"School of Automation, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055672506","display_name":"Jianfeng Qu","orcid":"https://orcid.org/0000-0002-2596-2850"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianfeng Qu","raw_affiliation_strings":["School of Automation, Chongqing University, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0002-2596-2850","affiliations":[{"raw_affiliation_string":"School of Automation, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053865422","display_name":"Bowen Liu","orcid":"https://orcid.org/0000-0001-5297-0795"},"institutions":[{"id":"https://openalex.org/I168337820","display_name":"Chongqing University of Science and Technology","ror":"https://ror.org/03n3v6d52","country_code":"CN","type":"education","lineage":["https://openalex.org/I168337820"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bowen Liu","raw_affiliation_strings":["School of Intelligent Technology and Engineering, Chongqing University of Science and Technology, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0001-5297-0795","affiliations":[{"raw_affiliation_string":"School of Intelligent Technology and Engineering, Chongqing University of Science and Technology, Chongqing, China","institution_ids":["https://openalex.org/I168337820"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103037128","display_name":"Yi Chai","orcid":"https://orcid.org/0000-0002-8637-8682"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Chai","raw_affiliation_strings":["School of Automation, Chongqing University, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0002-8637-8682","affiliations":[{"raw_affiliation_string":"School of Automation, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5021498167"],"corresponding_institution_ids":["https://openalex.org/I158842170"],"apc_list":null,"apc_paid":null,"fwci":2.2996,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.88836181,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discriminator","display_name":"Discriminator","score":0.9687286019325256},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6724251508712769},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6460540294647217},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5781102180480957},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5594731569290161},{"id":"https://openalex.org/keywords/encoder","display_name":"Encoder","score":0.5463999509811401},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5230939388275146},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5082370638847351},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.48247459530830383},{"id":"https://openalex.org/keywords/analogue-filter","display_name":"Analogue filter","score":0.4437800347805023},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4230518043041229},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3250410556793213},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2997053265571594},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1625978946685791},{"id":"https://openalex.org/keywords/digital-filter","display_name":"Digital filter","score":0.1362316906452179},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.12168338894844055},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.11549988389015198},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.08993181586265564}],"concepts":[{"id":"https://openalex.org/C2779803651","wikidata":"https://www.wikidata.org/wiki/Q5282088","display_name":"Discriminator","level":3,"score":0.9687286019325256},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6724251508712769},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6460540294647217},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5781102180480957},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5594731569290161},{"id":"https://openalex.org/C118505674","wikidata":"https://www.wikidata.org/wiki/Q42586063","display_name":"Encoder","level":2,"score":0.5463999509811401},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5230939388275146},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5082370638847351},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.48247459530830383},{"id":"https://openalex.org/C176046018","wikidata":"https://www.wikidata.org/wiki/Q359205","display_name":"Analogue filter","level":4,"score":0.4437800347805023},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4230518043041229},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3250410556793213},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2997053265571594},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1625978946685791},{"id":"https://openalex.org/C36390408","wikidata":"https://www.wikidata.org/wiki/Q1163067","display_name":"Digital filter","level":3,"score":0.1362316906452179},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.12168338894844055},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.11549988389015198},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.08993181586265564},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3331419","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3331419","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[{"id":"https://openalex.org/G1230151577","display_name":null,"funder_award_id":"KJQN202301502","funder_id":"https://openalex.org/F4320324805","funder_display_name":"Chongqing Municipal Education Commission"},{"id":"https://openalex.org/G8892919414","display_name":null,"funder_award_id":"U2034209","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320324805","display_name":"Chongqing Municipal Education Commission","ror":"https://ror.org/031nm5713"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W2026593831","https://openalex.org/W2100204983","https://openalex.org/W2296077894","https://openalex.org/W2775109975","https://openalex.org/W2929815085","https://openalex.org/W2930999278","https://openalex.org/W2963061824","https://openalex.org/W2969733715","https://openalex.org/W2978834409","https://openalex.org/W2982296774","https://openalex.org/W3000835335","https://openalex.org/W3024988100","https://openalex.org/W3025651583","https://openalex.org/W3034292309","https://openalex.org/W3083676672","https://openalex.org/W3084604457","https://openalex.org/W3095821048","https://openalex.org/W3104997747","https://openalex.org/W3120741450","https://openalex.org/W3132773019","https://openalex.org/W3159557112","https://openalex.org/W3162621823","https://openalex.org/W3172278476","https://openalex.org/W3188484212","https://openalex.org/W4200072094","https://openalex.org/W4206945314","https://openalex.org/W4225503344","https://openalex.org/W4226334005","https://openalex.org/W4283654373","https://openalex.org/W4288779689","https://openalex.org/W4307467286","https://openalex.org/W4310355591","https://openalex.org/W4312965670","https://openalex.org/W4317754108","https://openalex.org/W4375802375","https://openalex.org/W4376456983","https://openalex.org/W4377001547","https://openalex.org/W4377090510","https://openalex.org/W4378174090","https://openalex.org/W6732249622"],"related_works":["https://openalex.org/W2169757786","https://openalex.org/W2164489324","https://openalex.org/W2030185406","https://openalex.org/W2392969921","https://openalex.org/W4206788129","https://openalex.org/W2149717872","https://openalex.org/W4285494435","https://openalex.org/W2383167751","https://openalex.org/W2067323993","https://openalex.org/W4388820958"],"abstract_inverted_index":{"Owing":[0],"to":[1,20,79,102,155,172],"the":[2,40,48,81,85,100,104,108,118,122,125,128,133,136,145,148,157,162,200],"characteristics":[3],"of":[4,25,42,50,60,107,127,161,197],"intermittent":[5],"faults":[6],"(IFs),":[7],"such":[8],"as":[9],"short":[10],"duration":[11],"and":[12,65,97,124,147,182],"randomness":[13],"in":[14,47,84],"analog":[15,54,175],"circuits,":[16,176],"it":[17],"is":[18,95,113,170],"difficult":[19],"collect":[21],"a":[22,66,89,151,178,183,194,204],"sufficient":[23],"amount":[24],"manually":[26],"labeled":[27],"fault":[28,138,153,158,198],"data":[29],"for":[30,53],"training":[31,111],"detection":[32,52,105,139,159,210],"model.":[33,109],"To":[34],"this":[35,37],"end,":[36],"article":[38],"explores":[39],"application":[41],"generative":[43],"adversarial":[44,129],"network":[45],"(GAN)":[46],"field":[49],"IF":[51],"circuits.":[55],"The":[56,110,141,167,187],"proposed":[57,96,168,201],"model":[58],"consists":[59],"two":[61,116,163,173],"networks,":[62],"an":[63],"autoencoder":[64,123,146],"discriminator,":[67],"which":[68],"are":[69],"trained":[70],"by":[71,192],"competing":[72],"against":[73],"each":[74],"other":[75,208],"while":[76],"working":[77,165],"together":[78],"grasp":[80],"underlying":[82],"concepts":[83],"target.":[86],"In":[87],"addition,":[88],"spatial":[90],"Fourier":[91],"convolution":[92],"(SFC)":[93],"block":[94],"introduced":[98],"into":[99,115],"discriminator":[101,126,134,149],"enhance":[103,156],"performance":[106],"process":[112],"divided":[114],"stages,":[117],"first":[119],"stage":[120,143],"through":[121],"learning,":[130],"so":[131],"that":[132],"has":[135,203],"initial":[137],"ability.":[140],"second":[142],"trains":[144],"with":[150],"few":[152],"samples":[154],"capability":[160],"networks":[164],"cooperatively.":[166],"method":[169,202],"applied":[171],"typical":[174],"namely,":[177],"power":[179],"amplifier":[180],"circuit":[181],"low-pass":[184],"filter":[185],"circuit.":[186],"results":[188],"show":[189],"that,":[190],"guided":[191],"only":[193],"small":[195],"number":[196],"samples,":[199],"great":[205],"advantage":[206],"over":[207],"state-of-the-art":[209],"methods.":[211]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}