{"id":"https://openalex.org/W4387682009","doi":"https://doi.org/10.1109/tim.2023.3324689","title":"An Image-Based Hairline Crack Identification Method for Metal Parts","display_name":"An Image-Based Hairline Crack Identification Method for Metal Parts","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4387682009","doi":"https://doi.org/10.1109/tim.2023.3324689"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3324689","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3324689","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101829571","display_name":"Chuanpeng Hao","orcid":"https://orcid.org/0000-0003-1345-9307"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chuanpeng Hao","raw_affiliation_strings":["School of Mechanical Engineering, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100755001","display_name":"Yan He","orcid":"https://orcid.org/0000-0002-6287-1130"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan He","raw_affiliation_strings":["School of Mechanical Engineering, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100355160","display_name":"Yufeng Li","orcid":"https://orcid.org/0000-0003-4203-7189"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yufeng Li","raw_affiliation_strings":["School of Mechanical Engineering, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035817368","display_name":"Xiaobo Niu","orcid":"https://orcid.org/0000-0001-8609-261X"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaobo Niu","raw_affiliation_strings":["School of Mechanical Engineering, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100633954","display_name":"Shilong Wang","orcid":"https://orcid.org/0000-0001-6086-0481"},"institutions":[{"id":"https://openalex.org/I71637028","display_name":"University of Brighton","ror":"https://ror.org/04kp2b655","country_code":"GB","type":"education","lineage":["https://openalex.org/I71637028"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Yan Wang","raw_affiliation_strings":["School of Computing, Engineering and Mathematics, University of Brighton, Brighton, U.K","School of Computing, Engineering & Mathematics, University of Brighton, Brighton, United Kingdom"],"affiliations":[{"raw_affiliation_string":"School of Computing, Engineering and Mathematics, University of Brighton, Brighton, U.K","institution_ids":["https://openalex.org/I71637028"]},{"raw_affiliation_string":"School of Computing, Engineering & Mathematics, University of Brighton, Brighton, United Kingdom","institution_ids":["https://openalex.org/I71637028"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101829571"],"corresponding_institution_ids":["https://openalex.org/I158842170"],"apc_list":null,"apc_paid":null,"fwci":1.0133,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.80497515,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9864000082015991,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.667415976524353},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6129134893417358},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5156651735305786},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.4955223798751831},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4898228347301483},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.47980812191963196},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46158865094184875},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4236403703689575},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3552989959716797},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1325814425945282},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09736353158950806}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.667415976524353},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6129134893417358},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5156651735305786},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.4955223798751831},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4898228347301483},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.47980812191963196},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46158865094184875},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4236403703689575},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3552989959716797},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1325814425945282},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09736353158950806},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2023.3324689","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3324689","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:publications/a9432231-fba2-49b2-9cd5-0161ff46c914","is_oa":false,"landing_page_url":"https://research.brighton.ac.uk/en/publications/a9432231-fba2-49b2-9cd5-0161ff46c914","pdf_url":null,"source":{"id":"https://openalex.org/S4306401758","display_name":"University of Brighton Repository (University of Brighton)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I71637028","host_organization_name":"University of Brighton","host_organization_lineage":["https://openalex.org/I71637028"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Hao, C, He, Y, Li, Y, Niu, X & Wang, Y 2023, 'An Image-Based Hairline Crack Identification Method for Metal Parts', IEEE Transactions on Instrumentation and Measurement, vol. 72, 200114, pp. 1-14. https://doi.org/10.1109/tim.2023.3324689","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[{"id":"https://openalex.org/G2527308336","display_name":null,"funder_award_id":"52175453","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3630497730","display_name":null,"funder_award_id":"cstc2019jcyj-cxttX0003","funder_id":"https://openalex.org/F4320323172","funder_display_name":"Natural Science Foundation of Chongqing"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320323172","display_name":"Natural Science Foundation of Chongqing","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":62,"referenced_works":["https://openalex.org/W32111384","https://openalex.org/W1686810756","https://openalex.org/W1969393996","https://openalex.org/W1990727549","https://openalex.org/W1992181517","https://openalex.org/W1995130521","https://openalex.org/W2012493086","https://openalex.org/W2031946226","https://openalex.org/W2065289708","https://openalex.org/W2079054397","https://openalex.org/W2081080333","https://openalex.org/W2088984019","https://openalex.org/W2092072518","https://openalex.org/W2107888651","https://openalex.org/W2117287331","https://openalex.org/W2144801789","https://openalex.org/W2167667767","https://openalex.org/W2225314469","https://openalex.org/W2271158160","https://openalex.org/W2279236905","https://openalex.org/W2337083997","https://openalex.org/W2552392885","https://openalex.org/W2588612844","https://openalex.org/W2765854388","https://openalex.org/W2782408838","https://openalex.org/W2810123099","https://openalex.org/W2884143694","https://openalex.org/W2890939466","https://openalex.org/W2899144041","https://openalex.org/W2899242765","https://openalex.org/W2904718489","https://openalex.org/W2910121985","https://openalex.org/W2923486253","https://openalex.org/W2948461581","https://openalex.org/W2971843891","https://openalex.org/W2973007446","https://openalex.org/W3003754589","https://openalex.org/W3007264146","https://openalex.org/W3009418960","https://openalex.org/W3012374719","https://openalex.org/W3015382364","https://openalex.org/W3021896361","https://openalex.org/W3024889357","https://openalex.org/W3028650173","https://openalex.org/W3047824324","https://openalex.org/W3093074788","https://openalex.org/W3104156061","https://openalex.org/W3118998531","https://openalex.org/W3132521757","https://openalex.org/W3134108147","https://openalex.org/W4206572781","https://openalex.org/W4210629389","https://openalex.org/W4236935367","https://openalex.org/W4299995623","https://openalex.org/W4313200003","https://openalex.org/W4318200063","https://openalex.org/W4320085797","https://openalex.org/W6601285894","https://openalex.org/W6637373629","https://openalex.org/W6733417127","https://openalex.org/W6767795550","https://openalex.org/W6775969592"],"related_works":["https://openalex.org/W4285411112","https://openalex.org/W2085033728","https://openalex.org/W2171299904","https://openalex.org/W2922442631","https://openalex.org/W2053596378","https://openalex.org/W2168523118","https://openalex.org/W2106540031","https://openalex.org/W1982025852","https://openalex.org/W2047970610","https://openalex.org/W3089080437"],"abstract_inverted_index":{"Accurate":[0],"detection":[1,58],"and":[2,36,55,59,84,126,168,172,181],"measurement":[3,42,60,189],"of":[4,32,39,61,93,146,165,186],"hairline":[5,62,134,148,174],"cracks":[6,63,99,149],"on":[7,64,100,139],"metal":[8,34,65,101],"parts,":[9],"typically":[10],"less":[11],"than":[12],"1mm":[13],"wide,":[14],"are":[15],"important":[16],"for":[17,170],"remanufacturing.":[18],"However,":[19],"this":[20],"task":[21],"remains":[22],"challenging":[23],"due":[24],"to":[25,80,110,114,143],"the":[26,33,37,90,104,129,147,158,178,192],"small":[27],"crack":[28,124,135,188],"size,":[29],"high":[30,94],"reflectance":[31,95],"surface,":[35],"lack":[38],"reliable":[40],"real-size":[41,153],"methods.":[43],"This":[44,67,87],"paper":[45],"proposes":[46],"an":[47,163],"image-based":[48],"identification":[49,136],"method":[50,68],"that":[51],"addresses":[52],"these":[53],"challenges":[54],"enables":[56],"precise":[57],"surfaces.":[66,102],"establishes":[69],"a":[70,75],"controllable":[71],"imaging":[72,105],"system":[73,106],"with":[74,97],"blue":[76],"dome":[77],"light":[78],"source":[79],"capture":[81],"uniformly":[82],"illuminated":[83],"high-contrast":[85],"images.":[86],"setup":[88],"overcomes":[89],"primary":[91],"difficulty":[92],"associated":[96],"detecting":[98],"Furthermore,":[103],"incorporates":[107],"camera":[108],"calibration":[109],"convert":[111],"pixel":[112,130],"size":[113,116],"real":[115],"accurately,":[117],"offering":[118],"significant":[119],"practical":[120],"value":[121],"beyond":[122],"mere":[123],"localization":[125],"segmentation":[127],"at":[128],"level.":[131],"A":[132],"new":[133],"algorithm":[137],"based":[138],"morphology":[140],"is":[141],"developed":[142],"extract":[144],"pixels":[145],"directly,":[150],"followed":[151],"by":[152],"calculation.":[154],"Experimental":[155],"results":[156],"validate":[157],"proposed":[159,193],"method\u2019s":[160,194],"effectiveness,":[161],"achieving":[162],"accuracy":[164],"approximately":[166],"97%":[167],"90%":[169],"millimeter-level":[171],"submillimeter-level":[173],"cracks,":[175],"respectively.":[176],"Moreover,":[177],"average":[179],"error":[180],"standard":[182],"deviation":[183],"surpass":[184],"those":[185],"previous":[187],"techniques,":[190],"demonstrating":[191],"superiority.":[195]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}