{"id":"https://openalex.org/W4386902753","doi":"https://doi.org/10.1109/tim.2023.3317469","title":"An Enhanced Inductance-to-Digital Converter for Single-Element and Differential-Type Inductive Sensors With Automatic Offset Eliminator","display_name":"An Enhanced Inductance-to-Digital Converter for Single-Element and Differential-Type Inductive Sensors With Automatic Offset Eliminator","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4386902753","doi":"https://doi.org/10.1109/tim.2023.3317469"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3317469","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tim.2023.3317469","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Narayanan P. P.","orcid":"https://orcid.org/0009-0002-2842-6655"},"institutions":[{"id":"https://openalex.org/I4210113248","display_name":"Indian Institute of Technology Palakkad","ror":"https://ror.org/0264cg909","country_code":"IN","type":"facility","lineage":["https://openalex.org/I4210113248"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Narayanan P. P.","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, Palakkad, Kerala, India"],"raw_orcid":"https://orcid.org/0009-0002-2842-6655","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Palakkad, Kerala, India","institution_ids":["https://openalex.org/I4210113248"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101725583","display_name":"Sreenath Vijayakumar","orcid":"https://orcid.org/0000-0003-2289-0924"},"institutions":[{"id":"https://openalex.org/I4210113248","display_name":"Indian Institute of Technology Palakkad","ror":"https://ror.org/0264cg909","country_code":"IN","type":"facility","lineage":["https://openalex.org/I4210113248"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sreenath Vijayakumar","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, Palakkad, Kerala, India"],"raw_orcid":"https://orcid.org/0000-0003-2289-0924","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Palakkad, Kerala, India","institution_ids":["https://openalex.org/I4210113248"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210113248"],"apc_list":null,"apc_paid":null,"fwci":0.2256,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.47193176,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.8360600471496582},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5423583984375},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.5395230054855347},{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.4986133575439453},{"id":"https://openalex.org/keywords/leakage-inductance","display_name":"Leakage inductance","score":0.4852771461009979},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.4775829613208771},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4772588908672333},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41584905982017517},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3401576280593872},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.24837979674339294}],"concepts":[{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.8360600471496582},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5423583984375},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.5395230054855347},{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.4986133575439453},{"id":"https://openalex.org/C32976094","wikidata":"https://www.wikidata.org/wiki/Q1515253","display_name":"Leakage inductance","level":4,"score":0.4852771461009979},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.4775829613208771},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4772588908672333},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41584905982017517},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3401576280593872},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.24837979674339294},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3317469","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tim.2023.3317469","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1038327613","https://openalex.org/W1992328704","https://openalex.org/W2014381539","https://openalex.org/W2098764989","https://openalex.org/W2106713572","https://openalex.org/W2111530675","https://openalex.org/W2142953531","https://openalex.org/W2166207675","https://openalex.org/W2166307883","https://openalex.org/W2211539769","https://openalex.org/W2240407134","https://openalex.org/W2524868880","https://openalex.org/W2580626289","https://openalex.org/W2719456318","https://openalex.org/W2905997759","https://openalex.org/W2918267750","https://openalex.org/W2933042604","https://openalex.org/W2972984491","https://openalex.org/W2986661939","https://openalex.org/W3015107240","https://openalex.org/W3017339070","https://openalex.org/W3041473474","https://openalex.org/W3174191408","https://openalex.org/W4292072129","https://openalex.org/W6690166179"],"related_works":["https://openalex.org/W2605243265","https://openalex.org/W2108569687","https://openalex.org/W2087014434","https://openalex.org/W1775192674","https://openalex.org/W2581532139","https://openalex.org/W2373643149","https://openalex.org/W4235942709","https://openalex.org/W2112086678","https://openalex.org/W2162173402","https://openalex.org/W2144362216"],"abstract_inverted_index":{"A":[0],"novel":[1],"inductance-to-digital":[2],"converter":[3],"(LDC)":[4],"that":[5,121,250],"outputs":[6],"a":[7,228,339,360,389],"digital":[8,251],"value":[9],"corresponding":[10],"to":[11,101,138,159,189],"the":[12,88,102,118,123,141,181,191,209,232,241,257,297,328,332,354,370,386],"change":[13,89],"in":[14,47,82,90,149,183,231,353,369,392],"inductance":[15,26,49,92,125,194,259,410],"(<inline-formula":[16,27,50,62],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[17,28,34,40,51,63,69,75,94,112,127,152,161,196,203,213,220,261,272,347,374,395],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[18,29,35,41,52,64,70,76,95,113,128,153,162,197,204,214,221,262,273,348,375,396],"<tex-math":[19,30,36,42,53,65,71,77,96,114,129,154,163,198,205,215,222,263,274,349,376,397],"notation=\"LaTeX\">$\\Delta":[20,97,155,350,398],"L$":[21,98,156,351,399],"</tex-math></inline-formula>)":[22,79,136],"independent":[23,255],"of":[24,140,180,256,331,343,356,363,372,388],"offset":[25,48,193,245,258],"notation=\"LaTeX\">$L_{01}$":[31,199],"</tex-math></inline-formula>,":[32,38,67,73],"<inline-formula":[33,39,68,74,93,111,126,151,160,195,202,212,219,260,271,346,394],"notation=\"LaTeX\">$L_{02}$":[37,206],"notation=\"LaTeX\">$L_{03}":[43],"$":[44,378],"</tex-math></inline-formula>),":[45,57],"mismatch":[46,270],"notation=\"LaTeX\">$L_{01}":[54,275],"\\neq":[55,276],"L_{02}$":[56,277],"and":[58,173,218,268,289,303,308,323,359,404,412],"series":[59],"coil":[60,316,366,413],"resistance":[61,317,367],"notation=\"LaTeX\">$R_{C1}$":[66],"notation=\"LaTeX\">$R_{C2}$":[72],"notation=\"LaTeX\">$R_{C3}$":[78],"is":[80,147,186,253],"presented":[81,283],"this":[83],"work.":[84],"In":[85],"most":[86,179],"cases,":[87],"sensor":[91,124,171,176],"</tex-math></inline-formula>":[99,157,165,200,207,217,265,278,352,400],"due":[100],"measurand":[103],"will":[104,226],"be":[105],"very":[106,187],"small":[107],"as":[108],"compared":[109],"with":[110,318,407],"notation=\"LaTeX\">$L_{0}$":[115],"</tex-math></inline-formula>.":[116,224,379],"Thus,":[117],"existing":[119,235],"architectures":[120],"measure":[122],"notation=\"LaTeX\">$L_{Xi}":[130],"(=\\!\\!L_{0i}":[131],"\\pm":[132],"\\Delta":[133],"L;":[134],"i=1,2,3$":[135],"leads":[137],"underutilization":[139],"output":[142,233,252],"range.":[143],"The":[144,281,311,335,380],"proposed":[145,242,312,333,381],"scheme":[146],"effective":[148],"measuring":[150,393],"insensitive":[158],"notation=\"LaTeX\">$L_{0i}$":[164],"for":[166,208,234,240,293,299,321,345,365,401],"both":[167,402],"single-element":[168],"type":[169],"inductive":[170,175],"(SIS)":[172],"differential-type":[174],"(DIS).":[177],"For":[178],"DIS,":[182,324,405],"practice,":[184],"it":[185],"difficult":[188],"obtain":[190],"matched":[192],"=":[201],"differential":[210],"pair":[211],"notation=\"LaTeX\">$L_{X1}$":[216],"notation=\"LaTeX\">$L_{X2}$":[223],"This":[225,295],"introduce":[227],"noticeable":[229],"error":[230,342,362],"DIS":[236],"readout":[237,391],"schemes.":[238],"Whereas,":[239],"LDC\u2019s":[243],"automatic":[244],"elimination":[246],"(AOE)":[247],"mechanism":[248],"ensure":[249],"made":[254],"notation=\"LaTeX\">$L_{03}$":[264],"(for":[266,279],"SIS)":[267],"associated":[269],"DIS).":[280],"LDC":[282,313],"here":[284],"uses":[285],"dual-slope":[286],"conversion":[287],"technique":[288],"employs":[290],"dc":[291],"source":[292,302],"digitization.":[294],"eliminates":[296],"need":[298],"ac":[300],"excitation":[301],"possesses":[304],"high":[305],"measurement":[306],"accuracy":[307],"noise":[309],"immunity.":[310],"also":[314],"measures":[315],"negligible":[319],"cross-sensitivity":[320],"SIS":[322,403],"which":[325],"further":[326],"enhances":[327],"practical":[329],"efficacy":[330],"scheme.":[334],"developed":[336],"prototype":[337],"demonstrated":[338],"worst-case":[340],"linearity":[341,361],"0.59%":[344],"range":[355,371],"\u00b19":[357],"mH":[358],"0.48%":[364],"measured":[368],"100\u2013<inline-formula":[373],"notation=\"LaTeX\">$1000~\\Omega":[377],"approach":[382],"paves":[383],"path":[384],"toward":[385],"use":[387],"single":[390],"even":[406],"large":[408],"nominal":[409],"values":[411],"resistance.":[414]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}