{"id":"https://openalex.org/W4386212296","doi":"https://doi.org/10.1109/tim.2023.3309357","title":"A High-Resolution Nanosecond-Scale On-Chip Voltage Sensor for FPGA Applications","display_name":"A High-Resolution Nanosecond-Scale On-Chip Voltage Sensor for FPGA Applications","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4386212296","doi":"https://doi.org/10.1109/tim.2023.3309357"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3309357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3309357","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101580465","display_name":"Xinchi Xu","orcid":"https://orcid.org/0000-0002-1066-4295"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinchi Xu","raw_affiliation_strings":["Department of Modern Physics, State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-1066-4295","affiliations":[{"raw_affiliation_string":"Department of Modern Physics, State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100334350","display_name":"Yonggang Wang","orcid":"https://orcid.org/0000-0002-4204-0073"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yonggang Wang","raw_affiliation_strings":["Department of Modern Physics, State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-4204-0073","affiliations":[{"raw_affiliation_string":"Department of Modern Physics, State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101752402","display_name":"Bo Wu","orcid":"https://orcid.org/0000-0003-3697-6809"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Wu","raw_affiliation_strings":["Department of Modern Physics, State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-3697-6809","affiliations":[{"raw_affiliation_string":"Department of Modern Physics, State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020681288","display_name":"Zeyu Wang","orcid":"https://orcid.org/0000-0001-8142-2122"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zeyu Wang","raw_affiliation_strings":["Department of Modern Physics, State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-8142-2122","affiliations":[{"raw_affiliation_string":"Department of Modern Physics, State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103174256","display_name":"Y. Zhou","orcid":"https://orcid.org/0000-0001-5873-4187"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yonghang Zhou","raw_affiliation_strings":["Department of Modern Physics, State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-5873-4187","affiliations":[{"raw_affiliation_string":"Department of Modern Physics, State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2271,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.79308159,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7704291939735413},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6597729921340942},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5564638376235962},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.537521481513977},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4590313732624054},{"id":"https://openalex.org/keywords/buffer-amplifier","display_name":"Buffer amplifier","score":0.4312672019004822},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3883787989616394},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3280419707298279},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.28658419847488403},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.15862005949020386}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7704291939735413},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6597729921340942},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5564638376235962},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.537521481513977},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4590313732624054},{"id":"https://openalex.org/C127749002","wikidata":"https://www.wikidata.org/wiki/Q978470","display_name":"Buffer amplifier","level":4,"score":0.4312672019004822},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3883787989616394},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3280419707298279},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.28658419847488403},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.15862005949020386}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3309357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3309357","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7099999785423279,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G4443011945","display_name":"\u4f4d\u7f6e\u7075\u654f\u63a2\u6d4b\u5668\u4fe1\u53f7\u8bfb\u51fa\u7535\u5b50\u5b66\u7684\u5173\u952e\u6280\u672f\u7814\u7a76","funder_award_id":"11735013","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5039510518","display_name":null,"funder_award_id":"U1932202","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7824993519","display_name":null,"funder_award_id":"GJJSTD20200008","funder_id":"https://openalex.org/F4320321133","funder_display_name":"Chinese Academy of Sciences"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1971772932","https://openalex.org/W1981384041","https://openalex.org/W1994429758","https://openalex.org/W2045802182","https://openalex.org/W2050145588","https://openalex.org/W2088443347","https://openalex.org/W2134814047","https://openalex.org/W2139642492","https://openalex.org/W2145469556","https://openalex.org/W2156435621","https://openalex.org/W2165952864","https://openalex.org/W2507360886","https://openalex.org/W2801337475","https://openalex.org/W2884598006","https://openalex.org/W2899044382","https://openalex.org/W2945378913","https://openalex.org/W2987827054","https://openalex.org/W2996902831","https://openalex.org/W3014248279","https://openalex.org/W3083028264","https://openalex.org/W3103339143","https://openalex.org/W3127677234","https://openalex.org/W3145549963","https://openalex.org/W3147616483","https://openalex.org/W4234217119","https://openalex.org/W4237720872","https://openalex.org/W4242164861","https://openalex.org/W4290648676","https://openalex.org/W4319870500","https://openalex.org/W6756378822"],"related_works":["https://openalex.org/W2111241003","https://openalex.org/W4200391368","https://openalex.org/W2210979487","https://openalex.org/W2074043759","https://openalex.org/W3042736233","https://openalex.org/W2082487009","https://openalex.org/W2373535795","https://openalex.org/W2406926880","https://openalex.org/W4237139544","https://openalex.org/W2787763930"],"abstract_inverted_index":{"As":[0],"field":[1],"programmable":[2],"gate":[3],"array":[4],"(FPGA)":[5],"becomes":[6],"an":[7,23],"increasingly":[8],"important":[9],"digital":[10],"circuit":[11,28,37],"platform,":[12],"the":[13,44,48,64,77,98,102,108,117,154,157,169,195,202,214,220],"voltage":[14,74,90,99,170],"fluctuations":[15,33,100],"on":[16,43,76,101],"its":[17,146],"power":[18],"distribution":[19],"network":[20],"(PDN)":[21],"plays":[22],"unignorable":[24],"role":[25],"in":[26,79,114],"impacting":[27],"operation":[29],"and":[30,87,135,163],"performance.":[31,148],"Voltage":[32],"induced":[34],"by":[35,57,107,207],"one":[36],"block":[38],"can":[39,172],"affect":[40],"other":[41],"blocks":[42],"same":[45],"chip":[46],"through":[47],"PDN,":[49],"causing":[50],"performance":[51,155],"degradation":[52],"or":[53,96],"even":[54],"functionality":[55],"loss":[56],"critical":[58],"timing":[59],"fault.":[60],"This":[61],"also":[62,223],"opens":[63],"door":[65],"to":[66,94,144,194],"numerous":[67],"potential":[68],"attacks":[69],"that":[70],"maliciously":[71],"create":[72],"transient":[73],"drops":[75],"PDN":[78,103],"multi-user":[80],"FPGA":[81],"environments.":[82],"Therefore,":[83],"a":[84,150,184],"compact,":[85],"location-flexible,":[86],"high-speed":[88],"on-chip":[89],"sensor":[91],"is":[92,133,160,192,205,222],"needed":[93],"understand":[95],"monitor":[97],"at":[104,183],"runtime.":[105],"Limited":[106],"available":[109],"logic":[110],"resources":[111],"of":[112,120,138,156,219],"FPGA,":[113,168],"this":[115],"paper,":[116],"design":[118],"possibility":[119],"such":[121],"sensors":[122,159,171,221],"using":[123],"tapped":[124],"delay":[125],"line":[126],"(TDL)":[127],"based":[128],"time-to-digital":[129],"converter":[130,199],"(TDC)":[131],"technique":[132],"explored,":[134],"two":[136],"types":[137],"resolution":[139,177,191],"enhancement":[140],"methods":[141],"are":[142],"presented":[143],"achieve":[145,173],"optimal":[147],"Through":[149,211],"rigorous":[151],"calibration":[152],"process,":[153],"proposed":[158],"quantitively":[161],"evaluated":[162],"compared.":[164],"Using":[165],"Xilinx":[166],"Kintex-7":[167],"0.9":[174,179],"mV":[175,180],"measurement":[176],"with":[178],"RMS":[181],"precision":[182],"554":[185],"MHz":[186],"sampling":[187,203],"rate.":[188],"The":[189],"achievable":[190],"comparable":[193],"built-in":[196],"12-bit":[197],"analog-to-digital":[198],"(ADC),":[200],"but":[201],"rate":[204],"increased":[206],"several":[208],"hundred":[209],"times.":[210],"experimental":[212],"measurements,":[213],"nanosecond-scale":[215],"transients":[216],"detecting":[217],"capability":[218],"demonstrated.":[224]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":7}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}