{"id":"https://openalex.org/W4385626998","doi":"https://doi.org/10.1109/tim.2023.3302379","title":"Feature Clustering-Based Network for Industrial Process Diagnosis With Incremental Fault Types","display_name":"Feature Clustering-Based Network for Industrial Process Diagnosis With Incremental Fault Types","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4385626998","doi":"https://doi.org/10.1109/tim.2023.3302379"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3302379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3302379","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010316396","display_name":"Xinyao Xu","orcid":"https://orcid.org/0000-0002-6371-1948"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210100255","display_name":"Beijing Academy of Artificial Intelligence","ror":"https://ror.org/016a74861","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210100255"]},{"id":"https://openalex.org/I4210112150","display_name":"Institute of Automation","ror":"https://ror.org/022c3hy66","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210112150"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinyao Xu","raw_affiliation_strings":["Research Center of Precision Sensing and Control, Institute of Automation, Chinese Academy of Sciences, Beijing, China","School of Artificial Intelligence, University of Chinese Academy of Sciences, Beijing, China","Institute of Automation, Research Center of Precision Sensing and Control, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-6371-1948","affiliations":[{"raw_affiliation_string":"Research Center of Precision Sensing and Control, Institute of Automation, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210112150","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Artificial Intelligence, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210100255","https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Institute of Automation, Research Center of Precision Sensing and Control, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210112150","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016826662","display_name":"De Xu","orcid":"https://orcid.org/0000-0002-7221-1654"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210100255","display_name":"Beijing Academy of Artificial Intelligence","ror":"https://ror.org/016a74861","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210100255"]},{"id":"https://openalex.org/I4210112150","display_name":"Institute of Automation","ror":"https://ror.org/022c3hy66","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210112150"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"De Xu","raw_affiliation_strings":["Research Center of Precision Sensing and Control, Institute of Automation, Chinese Academy of Sciences, Beijing, China","Institute of Automation, Research Center of Precision Sensing and Control, Chinese Academy of Sciences, Beijing, China","School of Artificial Intelligence, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7221-1654","affiliations":[{"raw_affiliation_string":"Research Center of Precision Sensing and Control, Institute of Automation, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210112150","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Automation, Research Center of Precision Sensing and Control, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210112150","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Artificial Intelligence, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210100255","https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8178,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.72405032,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":97},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12676","display_name":"Machine Learning and ELM","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.7367342114448547},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.6840360760688782},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.667472243309021},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6066663861274719},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6046679615974426},{"id":"https://openalex.org/keywords/forgetting","display_name":"Forgetting","score":0.596908450126648},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5676267147064209},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5208504796028137},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4844260513782501},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.43862199783325195},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4143775701522827}],"concepts":[{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.7367342114448547},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.6840360760688782},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.667472243309021},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6066663861274719},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6046679615974426},{"id":"https://openalex.org/C7149132","wikidata":"https://www.wikidata.org/wiki/Q1377840","display_name":"Forgetting","level":2,"score":0.596908450126648},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5676267147064209},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5208504796028137},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4844260513782501},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.43862199783325195},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4143775701522827},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3302379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3302379","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G7217911764","display_name":null,"funder_award_id":"62273341","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W567350711","https://openalex.org/W1997865285","https://openalex.org/W2004186751","https://openalex.org/W2098815387","https://openalex.org/W2473930607","https://openalex.org/W2738226240","https://openalex.org/W2790035102","https://openalex.org/W2808979505","https://openalex.org/W2896727370","https://openalex.org/W2921973374","https://openalex.org/W2948734064","https://openalex.org/W2965875348","https://openalex.org/W2977049471","https://openalex.org/W3030364939","https://openalex.org/W3085307110","https://openalex.org/W3116945867","https://openalex.org/W3133226615","https://openalex.org/W3172466280","https://openalex.org/W3178686235","https://openalex.org/W3199433485","https://openalex.org/W3213811257","https://openalex.org/W4282916371","https://openalex.org/W4285233227","https://openalex.org/W4292348018","https://openalex.org/W4292971554","https://openalex.org/W4309326585","https://openalex.org/W4321353374","https://openalex.org/W7064683377"],"related_works":["https://openalex.org/W4289718052","https://openalex.org/W2164121020","https://openalex.org/W2145559838","https://openalex.org/W3116498279","https://openalex.org/W4287549553","https://openalex.org/W3183027292","https://openalex.org/W2974871044","https://openalex.org/W4310285384","https://openalex.org/W2794885965","https://openalex.org/W2372829958"],"abstract_inverted_index":{"When":[0],"new":[1,22,49,66,112],"faults":[2,77],"are":[3,78],"identified":[4,91],"in":[5,12],"complex":[6],"industrial":[7],"processes,":[8],"the":[9,26,32,70,73,85,88,111,126,130,138],"model":[10,53,101,122],"parameters":[11],"neural":[13],"networks":[14],"can":[15],"be":[16],"incrementally":[17],"updated":[18],"to":[19,21,63,65,109],"adapt":[20,64],"diagnosis":[23,33,43,67,148],"tasks.":[24,68],"However,":[25],"catastrophic":[27],"forgetting":[28],"problem":[29],"inevitably":[30],"decreases":[31],"performance.":[34],"Network":[35],"expansion":[36,60],"is":[37,61,90,102,123],"a":[38,48],"feasible":[39],"solution":[40],"for":[41],"current":[42],"models.":[44,119],"In":[45,69,84],"this":[46],"paper,":[47],"two-stage":[50],"diagnostic":[51],"framework":[52],"based":[54],"on":[55,125],"feature":[56,82,94,98],"clustering":[57],"and":[58,129],"network":[59],"designed":[62],"first":[71],"stage,":[72,87],"samples":[74],"of":[75],"different":[76,81,97],"transformed":[79],"into":[80],"clusters.":[83,99],"second":[86],"sample":[89],"by":[92],"its":[93],"similarities":[95],"with":[96],"The":[100,120,134],"expanded":[103],"only":[104],"when":[105],"existing":[106,118],"features":[107],"fail":[108],"distinguish":[110],"faults.":[113],"It":[114],"expands":[115],"slower":[116],"than":[117,144],"proposed":[121,139],"verified":[124],"Tennessee-Eastman":[127],"process":[128],"Three-Phase":[131],"Flow":[132],"facility.":[133],"results":[135],"show":[136],"that":[137],"method":[140],"outperforms":[141],"1%~5%":[142],"better":[143],"other":[145],"incremental":[146],"fault":[147],"methods.":[149]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}