{"id":"https://openalex.org/W4385194770","doi":"https://doi.org/10.1109/tim.2023.3298415","title":"Acoustic Resonance-Based Method for Long Distance Liquid Level Detection","display_name":"Acoustic Resonance-Based Method for Long Distance Liquid Level Detection","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4385194770","doi":"https://doi.org/10.1109/tim.2023.3298415"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3298415","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3298415","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043110747","display_name":"Jiufei Luo","orcid":"https://orcid.org/0000-0003-2160-9571"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jiufei Luo","raw_affiliation_strings":["School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100336916","display_name":"Jing Li","orcid":"https://orcid.org/0000-0002-3492-4493"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Li","raw_affiliation_strings":["School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029460235","display_name":"Mingxuan Zheng","orcid":"https://orcid.org/0000-0003-3345-7915"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingxuan Zheng","raw_affiliation_strings":["School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103276594","display_name":"Xin Liu","orcid":"https://orcid.org/0000-0002-6124-0943"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Liu","raw_affiliation_strings":["School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083631251","display_name":"Song Feng","orcid":"https://orcid.org/0000-0002-9347-5165"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Song Feng","raw_affiliation_strings":["School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5043110747"],"corresponding_institution_ids":["https://openalex.org/I10535382"],"apc_list":null,"apc_paid":null,"fwci":1.0379,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.70741636,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interpolation","display_name":"Interpolation (computer graphics)","score":0.5597434043884277},{"id":"https://openalex.org/keywords/fast-fourier-transform","display_name":"Fast Fourier transform","score":0.555334210395813},{"id":"https://openalex.org/keywords/resonance","display_name":"Resonance (particle physics)","score":0.4904460608959198},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4717339277267456},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4462489187717438},{"id":"https://openalex.org/keywords/discrete-fourier-transform","display_name":"Discrete Fourier transform (general)","score":0.4412142336368561},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43872061371803284},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.4312835931777954},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.4300192594528198},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3630772829055786},{"id":"https://openalex.org/keywords/fourier-transform","display_name":"Fourier transform","score":0.3630713224411011},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2414322793483734},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22480109333992004},{"id":"https://openalex.org/keywords/fourier-analysis","display_name":"Fourier analysis","score":0.19620928168296814},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18096008896827698},{"id":"https://openalex.org/keywords/fractional-fourier-transform","display_name":"Fractional Fourier transform","score":0.13991811871528625},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09406086802482605}],"concepts":[{"id":"https://openalex.org/C137800194","wikidata":"https://www.wikidata.org/wiki/Q11713455","display_name":"Interpolation (computer graphics)","level":3,"score":0.5597434043884277},{"id":"https://openalex.org/C75172450","wikidata":"https://www.wikidata.org/wiki/Q623950","display_name":"Fast Fourier transform","level":2,"score":0.555334210395813},{"id":"https://openalex.org/C139210041","wikidata":"https://www.wikidata.org/wiki/Q2145840","display_name":"Resonance (particle physics)","level":2,"score":0.4904460608959198},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4717339277267456},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4462489187717438},{"id":"https://openalex.org/C57733114","wikidata":"https://www.wikidata.org/wiki/Q1006032","display_name":"Discrete Fourier transform (general)","level":5,"score":0.4412142336368561},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43872061371803284},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4312835931777954},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.4300192594528198},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3630772829055786},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.3630713224411011},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2414322793483734},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22480109333992004},{"id":"https://openalex.org/C203024314","wikidata":"https://www.wikidata.org/wiki/Q1365258","display_name":"Fourier analysis","level":3,"score":0.19620928168296814},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18096008896827698},{"id":"https://openalex.org/C76563020","wikidata":"https://www.wikidata.org/wiki/Q4817582","display_name":"Fractional Fourier transform","level":4,"score":0.13991811871528625},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09406086802482605},{"id":"https://openalex.org/C104114177","wikidata":"https://www.wikidata.org/wiki/Q79782","display_name":"Motion (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C109214941","wikidata":"https://www.wikidata.org/wiki/Q18334","display_name":"Particle physics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3298415","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3298415","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5099999904632568,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W151857624","https://openalex.org/W335937977","https://openalex.org/W2005947810","https://openalex.org/W2008559277","https://openalex.org/W2057723830","https://openalex.org/W2058415695","https://openalex.org/W2074404324","https://openalex.org/W2079865126","https://openalex.org/W2100567194","https://openalex.org/W2115848264","https://openalex.org/W2125037630","https://openalex.org/W2139150818","https://openalex.org/W2149543651","https://openalex.org/W2170211487","https://openalex.org/W2179315331","https://openalex.org/W2186802891","https://openalex.org/W2302749967","https://openalex.org/W2395718246","https://openalex.org/W2590701451","https://openalex.org/W2769707295","https://openalex.org/W2793253085","https://openalex.org/W2886723444","https://openalex.org/W2902158973","https://openalex.org/W2914829278","https://openalex.org/W2922501886","https://openalex.org/W2945015477","https://openalex.org/W2963785911","https://openalex.org/W3010341623","https://openalex.org/W3013392474","https://openalex.org/W3134038900","https://openalex.org/W3139579315","https://openalex.org/W4206905997","https://openalex.org/W4301347335"],"related_works":["https://openalex.org/W4327521644","https://openalex.org/W2978884468","https://openalex.org/W2154006536","https://openalex.org/W2348800014","https://openalex.org/W2365391860","https://openalex.org/W1820187807","https://openalex.org/W2085939569","https://openalex.org/W2516295475","https://openalex.org/W2766639751","https://openalex.org/W2390401148"],"abstract_inverted_index":{"Liquid":[0],"level":[1,36,151],"distance":[2,34,149],"can":[3],"be":[4],"determined":[5],"by":[6],"the":[7,18,23,65,76,87,99,110,114,125,128,137],"fundamental":[8],"resonance":[9,79],"frequency":[10],"(RF)":[11],"or":[12],"a":[13,39,72,142],"series":[14],"of":[15,44,64,78,89,127],"RFs":[16],"from":[17],"acquired":[19,66],"acoustic":[20,24],"signals":[21],"using":[22],"resonance-based":[25],"method":[26,120,140],"(ARM).":[27],"However,":[28],"in":[29],"practical":[30],"industrial":[31],"applications,":[32],"long":[33,148],"liquid":[35,150],"detection":[37,139],"remains":[38],"challenge":[40],"due":[41],"to":[42,97],"lack":[43],"measurement":[45,54,100],"accuracy":[46,144],"and":[47,109,117,145],"reliability.":[48],"In":[49],"this":[50],"study,":[51],"an":[52],"improved":[53],"strategy":[55,116],"based":[56,85],"on":[57,86,106],"ARM":[58],"is":[59,68,95,121],"proposed.":[60],"A":[61,81],"mathematical":[62],"model":[63],"signal":[67],"established,":[69],"which":[70,123],"provides":[71],"theoretical":[73],"foundation":[74],"for":[75,147],"extraction":[77],"characteristics.":[80],"parameter":[82],"estimation":[83],"algorithm":[84],"interpolation":[88],"discrete":[90],"Fourier":[91],"transform":[92],"(DFT)":[93],"coefficients":[94],"developed":[96],"enhance":[98],"accuracy.":[101],"The":[102,131],"testings":[103],"are":[104],"carried":[105],"different":[107],"pipelines":[108],"good":[111],"agreement":[112],"between":[113],"proposed":[115,129],"sound":[118],"reflection-based":[119],"observed,":[122],"validates":[124],"effectiveness":[126],"method.":[130],"experimental":[132],"results":[133],"also":[134],"revealed":[135],"that":[136],"new":[138],"demonstrates":[141],"high":[143],"stability":[146],"measurement.":[152]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}