{"id":"https://openalex.org/W4385194661","doi":"https://doi.org/10.1109/tim.2023.3298390","title":"Nondestructive Inspection and Quantification of Soldering Defects in PCB Using an Autofocusing Digital Holographic Camera","display_name":"Nondestructive Inspection and Quantification of Soldering Defects in PCB Using an Autofocusing Digital Holographic Camera","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4385194661","doi":"https://doi.org/10.1109/tim.2023.3298390"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3298390","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3298390","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064314354","display_name":"Gaurav Dwivedi","orcid":"https://orcid.org/0000-0002-6130-0790"},"institutions":[{"id":"https://openalex.org/I44635919","display_name":"National Institute of Technology Delhi","ror":"https://ror.org/032twef21","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210152752","https://openalex.org/I44635919"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Gaurav Dwivedi","raw_affiliation_strings":["CSIR-CSIO, Chandigarh, India","National Institute of Technology, Delhi, India"],"raw_orcid":"https://orcid.org/0000-0002-6130-0790","affiliations":[{"raw_affiliation_string":"CSIR-CSIO, Chandigarh, India","institution_ids":[]},{"raw_affiliation_string":"National Institute of Technology, Delhi, India","institution_ids":["https://openalex.org/I44635919"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008024213","display_name":"Lavlesh Pensia","orcid":"https://orcid.org/0000-0002-0710-8933"},"institutions":[{"id":"https://openalex.org/I42095658","display_name":"Central Scientific Instruments Organisation","ror":"https://ror.org/04bfs6764","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I42095658","https://openalex.org/I4210134808","https://openalex.org/I66760702"]},{"id":"https://openalex.org/I99364266","display_name":"Academy of Scientific and Innovative Research","ror":"https://ror.org/053rcsq61","country_code":"IN","type":"education","lineage":["https://openalex.org/I99364266"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Lavlesh Pensia","raw_affiliation_strings":["CSIR-Central Scientific Instruments Organisation, Chandigarh, India","Academy of Scientific and Innovative Research (AcSIR), Ghaziabad, India"],"raw_orcid":"https://orcid.org/0000-0002-0710-8933","affiliations":[{"raw_affiliation_string":"CSIR-Central Scientific Instruments Organisation, Chandigarh, India","institution_ids":["https://openalex.org/I42095658"]},{"raw_affiliation_string":"Academy of Scientific and Innovative Research (AcSIR), Ghaziabad, India","institution_ids":["https://openalex.org/I99364266"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047618478","display_name":"Viney Lohchab","orcid":null},"institutions":[{"id":"https://openalex.org/I42095658","display_name":"Central Scientific Instruments Organisation","ror":"https://ror.org/04bfs6764","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I42095658","https://openalex.org/I4210134808","https://openalex.org/I66760702"]},{"id":"https://openalex.org/I99364266","display_name":"Academy of Scientific and Innovative Research","ror":"https://ror.org/053rcsq61","country_code":"IN","type":"education","lineage":["https://openalex.org/I99364266"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Viney Lohchab","raw_affiliation_strings":["CSIR-Central Scientific Instruments Organisation, Chandigarh, India","Academy of Scientific and Innovative Research (AcSIR), Ghaziabad, India"],"raw_orcid":"https://orcid.org/0000-0001-8827-5866","affiliations":[{"raw_affiliation_string":"CSIR-Central Scientific Instruments Organisation, Chandigarh, India","institution_ids":["https://openalex.org/I42095658"]},{"raw_affiliation_string":"Academy of Scientific and Innovative Research (AcSIR), Ghaziabad, India","institution_ids":["https://openalex.org/I99364266"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029210756","display_name":"Raj Kumar","orcid":"https://orcid.org/0000-0002-2382-1325"},"institutions":[{"id":"https://openalex.org/I42095658","display_name":"Central Scientific Instruments Organisation","ror":"https://ror.org/04bfs6764","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I42095658","https://openalex.org/I4210134808","https://openalex.org/I66760702"]},{"id":"https://openalex.org/I99364266","display_name":"Academy of Scientific and Innovative Research","ror":"https://ror.org/053rcsq61","country_code":"IN","type":"education","lineage":["https://openalex.org/I99364266"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Raj Kumar","raw_affiliation_strings":["CSIR-Central Scientific Instruments Organisation, Chandigarh, India","Academy of Scientific and Innovative Research (AcSIR), Ghaziabad, India"],"raw_orcid":"https://orcid.org/0000-0002-2382-1325","affiliations":[{"raw_affiliation_string":"CSIR-Central Scientific Instruments Organisation, Chandigarh, India","institution_ids":["https://openalex.org/I42095658"]},{"raw_affiliation_string":"Academy of Scientific and Innovative Research (AcSIR), Ghaziabad, India","institution_ids":["https://openalex.org/I99364266"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5064314354"],"corresponding_institution_ids":["https://openalex.org/I44635919"],"apc_list":null,"apc_paid":null,"fwci":3.5396,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.93319156,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/autofocus","display_name":"Autofocus","score":0.8354964852333069},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.7002630233764648},{"id":"https://openalex.org/keywords/holography","display_name":"Holography","score":0.5504549145698547},{"id":"https://openalex.org/keywords/digital-holography","display_name":"Digital holography","score":0.5245887637138367},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5105756521224976},{"id":"https://openalex.org/keywords/soldering","display_name":"Soldering","score":0.4997103214263916},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.49686864018440247},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.4201076626777649},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4150090515613556},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.41264665126800537},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.3923295736312866},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3260597586631775},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30148935317993164},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.18865114450454712},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12492173910140991},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10608640313148499}],"concepts":[{"id":"https://openalex.org/C103764139","wikidata":"https://www.wikidata.org/wiki/Q210008","display_name":"Autofocus","level":3,"score":0.8354964852333069},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.7002630233764648},{"id":"https://openalex.org/C187590223","wikidata":"https://www.wikidata.org/wiki/Q527628","display_name":"Holography","level":2,"score":0.5504549145698547},{"id":"https://openalex.org/C2776640645","wikidata":"https://www.wikidata.org/wiki/Q1224906","display_name":"Digital holography","level":3,"score":0.5245887637138367},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5105756521224976},{"id":"https://openalex.org/C50296614","wikidata":"https://www.wikidata.org/wiki/Q211387","display_name":"Soldering","level":2,"score":0.4997103214263916},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.49686864018440247},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.4201076626777649},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4150090515613556},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.41264665126800537},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.3923295736312866},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3260597586631775},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30148935317993164},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.18865114450454712},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12492173910140991},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10608640313148499},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3298390","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3298390","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6600000262260437,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G1066620748","display_name":null,"funder_award_id":"DST/TSG/NTS/2015/59","funder_id":"https://openalex.org/F4320323670","funder_display_name":"Department of Science and Technology, Government of Kerala"}],"funders":[{"id":"https://openalex.org/F4320323670","display_name":"Department of Science and Technology, Government of Kerala","ror":"https://ror.org/030fy4q75"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1970523722","https://openalex.org/W1974813615","https://openalex.org/W1976463474","https://openalex.org/W1990905188","https://openalex.org/W2004241456","https://openalex.org/W2010981805","https://openalex.org/W2041054963","https://openalex.org/W2054483808","https://openalex.org/W2061420267","https://openalex.org/W2089500134","https://openalex.org/W2132653728","https://openalex.org/W2169283240","https://openalex.org/W2244241644","https://openalex.org/W2283391903","https://openalex.org/W2601589182","https://openalex.org/W2752923235","https://openalex.org/W2803361407","https://openalex.org/W2809078676","https://openalex.org/W2886256586","https://openalex.org/W2937147258","https://openalex.org/W2964793009","https://openalex.org/W3034983247","https://openalex.org/W3081735098","https://openalex.org/W3121011697","https://openalex.org/W3137808872","https://openalex.org/W3171276505","https://openalex.org/W3173736531","https://openalex.org/W4200209289","https://openalex.org/W4220870255","https://openalex.org/W4252177834","https://openalex.org/W4313530308","https://openalex.org/W4321499051","https://openalex.org/W6796820587"],"related_works":["https://openalex.org/W1634269331","https://openalex.org/W2041333522","https://openalex.org/W101095401","https://openalex.org/W1997199353","https://openalex.org/W2151533009","https://openalex.org/W2099107646","https://openalex.org/W2353288894","https://openalex.org/W4362650061","https://openalex.org/W3210127857","https://openalex.org/W3105937001"],"abstract_inverted_index":{"The":[0,142,187],"essential":[1],"requirements":[2],"for":[3,57,76,201],"any":[4],"digital":[5,72,99,150,198],"holography-based":[6,73],"system":[7],"to":[8,22,61,97,101,170],"get":[9],"employed":[10],"as":[11,179],"an":[12],"inspection":[13,79,207],"device":[14],"in":[15,46,70,84,128,139,190,204,208],"electronic":[16],"industry":[17],"are":[18,168],"portability":[19],"and":[20,40,95,107,132,164,185,206],"ability":[21],"automatically":[23,102],"focus":[24],"on":[25,155],"the":[26,32,37,41,50,58,62,67,98,104,109,118,121,129,133,140,147,156,209],"reconstruction":[27,42,105],"plane.":[28],"Any":[29],"deviation":[30],"from":[31],"exact":[33],"propagation":[34,110,135],"distance":[35,136],"between":[36],"hologram":[38,100],"plane":[39,43,106],"may":[44,193],"result":[45],"erroneous":[47],"measurement":[48],"of":[49,64,80,116,124,174,197],"surface":[51],"features":[52],"under":[53,160],"inspection.":[54],"We":[55],"report":[56],"first":[59],"time,":[60],"best":[63],"our":[65],"knowledge,":[66],"autofocus":[68,143],"capability":[69],"a":[71,85,113],"portable":[74],"camera":[75],"full-field":[77],"quantitative":[78],"solder":[81,175],"joint":[82,176],"defects":[83,177],"printed":[86,157],"circuit":[87,158],"board.":[88],"An":[89],"intensity":[90],"gradient-based":[91],"algorithm":[92,119,144],"is":[93,137,153],"developed":[94],"applied":[96,154],"locate":[103],"determine":[108],"distance.":[111],"For":[112],"given":[114],"range":[115],"distance,":[117],"calculates":[120],"maximum":[122],"value":[123],"high":[125],"frequency":[126],"components":[127],"reconstructed":[130],"image":[131],"corresponding":[134],"used":[138],"reconstruction.":[141],"along":[145],"with":[146],"double":[148],"exposure":[149],"holographic":[151,199],"interferometry":[152],"board":[159],"thermal":[161],"loading.":[162],"2D":[163],"3D":[165],"deformation":[166],"maps":[167],"analyzed":[169],"detect":[171],"different":[172],"kinds":[173],"such":[178],"holes,":[180],"irregular":[181],"shapes,":[182],"excess":[183],"soldering":[184],"bridging.":[186],"work":[188],"presented":[189],"this":[191],"manuscript":[192],"further":[194],"stimulate":[195],"development":[196],"techniques":[200],"several":[202],"applications":[203],"metrology":[205],"electronics":[210],"manufacturing":[211],"industry.":[212]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":2}],"updated_date":"2026-05-08T15:41:06.802602","created_date":"2025-10-10T00:00:00"}