{"id":"https://openalex.org/W4382998620","doi":"https://doi.org/10.1109/tim.2023.3291776","title":"CoRe: Contrastive and Restorative Self-Supervised Learning for Surface Defect Inspection","display_name":"CoRe: Contrastive and Restorative Self-Supervised Learning for Surface Defect Inspection","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4382998620","doi":"https://doi.org/10.1109/tim.2023.3291776"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3291776","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3291776","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011001803","display_name":"Huangyuan Wu","orcid":"https://orcid.org/0000-0002-7063-3917"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Huangyuan Wu","raw_affiliation_strings":["School of Automation Science and Engineering, South China University of Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100673448","display_name":"Bin Li","orcid":"https://orcid.org/0000-0001-6767-5350"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Li","raw_affiliation_strings":["School of Automation Science and Engineering, South China University of Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100345591","display_name":"Lianfang Tian","orcid":"https://orcid.org/0000-0003-4326-6821"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lianfang Tian","raw_affiliation_strings":["School of Automation Science and Engineering, South China University of Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001852074","display_name":"Zhengzheng Sun","orcid":"https://orcid.org/0000-0002-9293-5625"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengzheng Sun","raw_affiliation_strings":["School of Automation Science and Engineering, South China University of Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114608802","display_name":"Chao Dong","orcid":"https://orcid.org/0000-0001-6335-0508"},"institutions":[{"id":"https://openalex.org/I4210090744","display_name":"Guangzhou Marine Geological Survey","ror":"https://ror.org/00jaxam28","country_code":"CN","type":"government","lineage":["https://openalex.org/I2799486974","https://openalex.org/I4210090744"]},{"id":"https://openalex.org/I4210106122","display_name":"Southern Marine Science and Engineering Guangdong Laboratory (Guangzhou)","ror":"https://ror.org/00y7mag53","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210106122"]},{"id":"https://openalex.org/I211433327","display_name":"Ministry of Natural Resources","ror":"https://ror.org/02kxqx159","country_code":"CN","type":"funder","lineage":["https://openalex.org/I211433327","https://openalex.org/I4210127390"]},{"id":"https://openalex.org/I4391012567","display_name":"Southern Marine Science and Engineering Guangdong Laboratory (Zhuhai)","ror":"https://ror.org/03swgqh13","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391012567"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Dong","raw_affiliation_strings":["Key Laboratory of Marine Environmental Survey Technology and Application, Ministry of Natural Resources, Guangzhou, China","Southern Marine Science and Engineering Guangdong Laboratory, Zhuhai, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Marine Environmental Survey Technology and Application, Ministry of Natural Resources, Guangzhou, China","institution_ids":["https://openalex.org/I4210090744","https://openalex.org/I211433327"]},{"raw_affiliation_string":"Southern Marine Science and Engineering Guangdong Laboratory, Zhuhai, China","institution_ids":["https://openalex.org/I4210106122","https://openalex.org/I4391012567"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015582924","display_name":"Wenzhi Liao","orcid":"https://orcid.org/0000-0002-2183-0324"},"institutions":[{"id":"https://openalex.org/I4210116480","display_name":"Flanders Make (Belgium)","ror":"https://ror.org/02ndjfz59","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210116480"]},{"id":"https://openalex.org/I12607205","display_name":"University College Ghent","ror":"https://ror.org/00rs45z86","country_code":"BE","type":"education","lineage":["https://openalex.org/I12607205"]},{"id":"https://openalex.org/I32597200","display_name":"Ghent University","ror":"https://ror.org/00cv9y106","country_code":"BE","type":"education","lineage":["https://openalex.org/I32597200"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Wenzhi Liao","raw_affiliation_strings":["Flanders Make, Ghent University, Ghent, Belgium","Flanders Make and Ghent University, Ghent, Belgium"],"affiliations":[{"raw_affiliation_string":"Flanders Make, Ghent University, Ghent, Belgium","institution_ids":["https://openalex.org/I4210116480","https://openalex.org/I12607205"]},{"raw_affiliation_string":"Flanders Make and Ghent University, Ghent, Belgium","institution_ids":["https://openalex.org/I4210116480","https://openalex.org/I32597200"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5011001803"],"corresponding_institution_ids":["https://openalex.org/I90610280"],"apc_list":null,"apc_paid":null,"fwci":1.3893,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.7831148,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7246105670928955},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7172802090644836},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.6689529418945312},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.6486172080039978},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.5656858682632446},{"id":"https://openalex.org/keywords/bridge","display_name":"Bridge (graph theory)","score":0.5448285937309265},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.49715736508369446},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.47803816199302673},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4612976014614105},{"id":"https://openalex.org/keywords/transfer-of-learning","display_name":"Transfer of learning","score":0.4561634659767151},{"id":"https://openalex.org/keywords/feature-learning","display_name":"Feature learning","score":0.45562198758125305},{"id":"https://openalex.org/keywords/supervised-learning","display_name":"Supervised learning","score":0.45176461338996887},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.41498544812202454},{"id":"https://openalex.org/keywords/natural-language-processing","display_name":"Natural language processing","score":0.3751523494720459},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.18941596150398254},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14784005284309387}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7246105670928955},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7172802090644836},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.6689529418945312},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.6486172080039978},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.5656858682632446},{"id":"https://openalex.org/C100776233","wikidata":"https://www.wikidata.org/wiki/Q2532492","display_name":"Bridge (graph theory)","level":2,"score":0.5448285937309265},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.49715736508369446},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.47803816199302673},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4612976014614105},{"id":"https://openalex.org/C150899416","wikidata":"https://www.wikidata.org/wiki/Q1820378","display_name":"Transfer of learning","level":2,"score":0.4561634659767151},{"id":"https://openalex.org/C59404180","wikidata":"https://www.wikidata.org/wiki/Q17013334","display_name":"Feature learning","level":2,"score":0.45562198758125305},{"id":"https://openalex.org/C136389625","wikidata":"https://www.wikidata.org/wiki/Q334384","display_name":"Supervised learning","level":3,"score":0.45176461338996887},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.41498544812202454},{"id":"https://openalex.org/C204321447","wikidata":"https://www.wikidata.org/wiki/Q30642","display_name":"Natural language processing","level":1,"score":0.3751523494720459},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.18941596150398254},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14784005284309387},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3291776","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3291776","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6499999761581421,"display_name":"Quality Education","id":"https://metadata.un.org/sdg/4"}],"awards":[{"id":"https://openalex.org/G3127828562","display_name":null,"funder_award_id":"62273155","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":58,"referenced_works":["https://openalex.org/W343636949","https://openalex.org/W639708223","https://openalex.org/W1901129140","https://openalex.org/W2187089797","https://openalex.org/W2395611524","https://openalex.org/W2562637781","https://openalex.org/W2566365295","https://openalex.org/W2735783528","https://openalex.org/W2761216034","https://openalex.org/W2842511635","https://openalex.org/W2888407265","https://openalex.org/W2923486253","https://openalex.org/W2924450865","https://openalex.org/W2944303778","https://openalex.org/W2963420272","https://openalex.org/W2963474687","https://openalex.org/W2990873191","https://openalex.org/W2991391304","https://openalex.org/W2994615081","https://openalex.org/W3005680577","https://openalex.org/W3009561768","https://openalex.org/W3016836174","https://openalex.org/W3023371261","https://openalex.org/W3035524453","https://openalex.org/W3042782200","https://openalex.org/W3042916480","https://openalex.org/W3101748915","https://openalex.org/W3104156061","https://openalex.org/W3110187642","https://openalex.org/W3128661784","https://openalex.org/W3132936317","https://openalex.org/W3133542152","https://openalex.org/W3153381206","https://openalex.org/W3159434665","https://openalex.org/W3161141656","https://openalex.org/W3166166117","https://openalex.org/W3168822201","https://openalex.org/W3171007011","https://openalex.org/W3171297660","https://openalex.org/W3173151551","https://openalex.org/W3176009670","https://openalex.org/W3185102306","https://openalex.org/W3191879248","https://openalex.org/W3197201339","https://openalex.org/W3207924272","https://openalex.org/W3212029853","https://openalex.org/W4206551889","https://openalex.org/W4239072543","https://openalex.org/W4285109947","https://openalex.org/W4297808394","https://openalex.org/W4307972630","https://openalex.org/W4382568144","https://openalex.org/W6639824700","https://openalex.org/W6676297131","https://openalex.org/W6774314701","https://openalex.org/W6774670964","https://openalex.org/W6797132756","https://openalex.org/W6840971909"],"related_works":["https://openalex.org/W1501776718","https://openalex.org/W657108774","https://openalex.org/W2615136228","https://openalex.org/W2390192952","https://openalex.org/W2373296418","https://openalex.org/W3213254966","https://openalex.org/W1985113803","https://openalex.org/W2440023763","https://openalex.org/W2962474440","https://openalex.org/W2515319207"],"abstract_inverted_index":{"Visual":[0],"inspection":[1,14,45,99,132,155,183],"technology":[2],"based":[3],"on":[4,111,160],"deep":[5],"learning":[6,87,129,147,173],"has":[7],"achieved":[8],"great":[9],"success":[10],"in":[11],"surface":[12,162],"defect":[13,44,57,98,131,154,163,182],"tasks.":[15,37,133],"Most":[16],"existing":[17,171],"works":[18],"transfer":[19],"the":[20,24,35,39,50,61,69,79,97,104,109,112,122,127,137,140,153,170],"learned":[21],"knowledge":[22],"from":[23],"natural":[25,55,123],"dataset":[26,52,105,114],"(":[27],"<italic":[28],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[29],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">e.g</i>":[30],".,":[31],"ImageNet":[32],"dataset)":[33],"into":[34],"target":[36],"However,":[38],"paradigm":[40],"is":[41,90],"suboptimal":[42],"for":[43,96,152],"tasks":[46],"due":[47],"to":[48,92,102,135,148],"(1)":[49],"inherent":[51],"gap":[53],"between":[54],"and":[56,59,84,145,179],"images":[58],"(2)":[60],"misalignment":[62],"of":[63,121,130],"task":[64,138],"objectives.":[65],"The":[66,157],"limitations":[67],"make":[68],"model":[70,110],"cannot":[71],"learn":[72,93],"a":[73,82,116],"generalized":[74],"visual":[75],"representation.":[76],"To":[77],"address":[78],"above":[80],"issues,":[81],"contrastive":[83,144],"restorative":[85,146],"self-supervised":[86,172],"framework":[88],"(CoRe)":[89],"proposed":[91,141],"general":[94],"representation":[95,128],"task.":[100,156],"Specifically,":[101],"bridge":[103],"gap,":[106],"we":[107],"pre-train":[108],"related":[113],"with":[115],"similar":[117],"feature":[118],"distribution":[119],"instead":[120],"dataset,":[124],"which":[125],"facilitates":[126],"Subsequently,":[134],"mitigate":[136],"misalignment,":[139],"method":[142,168],"combines":[143],"excavate":[149],"features":[150],"required":[151],"experimental":[158],"results":[159],"five":[161],"datasets":[164],"demonstrate":[165],"that":[166],"our":[167],"outperforms":[169],"works,":[174],"typical":[175],"supervised":[176],"pre-training":[177],"paradigm,":[178],"some":[180],"specific":[181],"methods.":[184]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}