{"id":"https://openalex.org/W4383220177","doi":"https://doi.org/10.1109/tim.2023.3291735","title":"Reproducing Kernel-Based Best Interpolation Approximation for Improving Spatial Resolution in Electrical Tomography","display_name":"Reproducing Kernel-Based Best Interpolation Approximation for Improving Spatial Resolution in Electrical Tomography","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4383220177","doi":"https://doi.org/10.1109/tim.2023.3291735"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3291735","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tim.2023.3291735","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100685191","display_name":"Kun Li","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Kun Li","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0001-7568-6009","affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018962276","display_name":"Shihong Yue","orcid":"https://orcid.org/0000-0003-3473-2704"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shihong Yue","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-3473-2704","affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014858258","display_name":"Yongguang Tan","orcid":"https://orcid.org/0000-0001-7114-3752"},"institutions":[{"id":"https://openalex.org/I148099405","display_name":"Xi'an University of Architecture and Technology","ror":"https://ror.org/04v2j2k71","country_code":"CN","type":"education","lineage":["https://openalex.org/I148099405"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongguang Tan","raw_affiliation_strings":["School of Building Services Science and Engineering, Xi’an University of Architecture and Technology, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-7114-3752","affiliations":[{"raw_affiliation_string":"School of Building Services Science and Engineering, Xi’an University of Architecture and Technology, Xi’an, China","institution_ids":["https://openalex.org/I148099405"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060150695","display_name":"Huaxiang Wang","orcid":"https://orcid.org/0000-0003-1584-6925"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaxiang Wang","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-1584-6925","affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100618811","display_name":"Xinshan Zhu","orcid":"https://orcid.org/0000-0003-2060-9932"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinshan Zhu","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-2060-9932","affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100685191"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":0.511,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.63707019,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interpolation","display_name":"Interpolation (computer graphics)","score":0.8369616270065308},{"id":"https://openalex.org/keywords/kernel","display_name":"Kernel (algebra)","score":0.7164908647537231},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.7074812650680542},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5437229871749878},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5255461931228638},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.5212843418121338},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5179216265678406},{"id":"https://openalex.org/keywords/multivariate-interpolation","display_name":"Multivariate interpolation","score":0.46660158038139343},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.4529872536659241},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4339601397514343},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.41272085905075073},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3869982659816742},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.29294896125793457},{"id":"https://openalex.org/keywords/bilinear-interpolation","display_name":"Bilinear interpolation","score":0.21416449546813965},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2118476927280426},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1602005958557129},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.12104052305221558}],"concepts":[{"id":"https://openalex.org/C137800194","wikidata":"https://www.wikidata.org/wiki/Q11713455","display_name":"Interpolation (computer graphics)","level":3,"score":0.8369616270065308},{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.7164908647537231},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.7074812650680542},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5437229871749878},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5255461931228638},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.5212843418121338},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5179216265678406},{"id":"https://openalex.org/C203332170","wikidata":"https://www.wikidata.org/wiki/Q6334079","display_name":"Multivariate interpolation","level":3,"score":0.46660158038139343},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4529872536659241},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4339601397514343},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.41272085905075073},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3869982659816742},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.29294896125793457},{"id":"https://openalex.org/C205203396","wikidata":"https://www.wikidata.org/wiki/Q612143","display_name":"Bilinear interpolation","level":2,"score":0.21416449546813965},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2118476927280426},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1602005958557129},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.12104052305221558},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3291735","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tim.2023.3291735","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5547953984","display_name":null,"funder_award_id":"61972282","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6288664033","display_name":null,"funder_award_id":"61973232","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1565176583","https://openalex.org/W1981413265","https://openalex.org/W1981536890","https://openalex.org/W1992312940","https://openalex.org/W2035142958","https://openalex.org/W2051498449","https://openalex.org/W2070738097","https://openalex.org/W2080615127","https://openalex.org/W2083598195","https://openalex.org/W2097391269","https://openalex.org/W2100192125","https://openalex.org/W2112430772","https://openalex.org/W2114424556","https://openalex.org/W2117706442","https://openalex.org/W2133743845","https://openalex.org/W2217096638","https://openalex.org/W2335426297","https://openalex.org/W2530307286","https://openalex.org/W2759764994","https://openalex.org/W2804612897","https://openalex.org/W2909146010","https://openalex.org/W2911413824","https://openalex.org/W2913992956","https://openalex.org/W2972800549","https://openalex.org/W2992486873","https://openalex.org/W3080915053","https://openalex.org/W3096908491","https://openalex.org/W3104776511","https://openalex.org/W3186270708","https://openalex.org/W3198632954","https://openalex.org/W4293411480","https://openalex.org/W4388321161","https://openalex.org/W6678914141"],"related_works":["https://openalex.org/W2045588195","https://openalex.org/W2362697663","https://openalex.org/W2381198209","https://openalex.org/W2989592345","https://openalex.org/W3180612984","https://openalex.org/W2363866393","https://openalex.org/W2892787497","https://openalex.org/W2512393538","https://openalex.org/W4382867132","https://openalex.org/W4283070427"],"abstract_inverted_index":{"Electric":[0],"tomography":[1,18],"(ET)":[2],"is":[3,26,48,110],"an":[4],"advanced":[5],"visualization":[6],"technique":[7],"with":[8,16,96],"low-cost,":[9],"rapid-response,":[10],"nonradiative,":[11],"and":[12,100,115,126],"nonintrusive":[13],"advantages":[14],"compared":[15,81],"other":[17],"modalities.":[19],"The":[20,106],"imaging":[21],"resolution":[22,125],"of":[23,40,62,72,90,108,128],"ET,":[24],"however,":[25],"significantly":[27],"low":[28],"providing":[29],"the":[30,38,60,66,77,83,88,101,123],"required":[31],"measurements":[32,64],"that":[33,56,119],"are":[34],"far":[35],"less":[36],"than":[37],"number":[39,61],"pixels":[41],"in":[42,65],"a":[43,49,70],"detection":[44],"field.":[45],"Presented":[46],"here":[47],"reproducing":[50],"kernel-based":[51],"best":[52],"interpolation":[53,85],"(RKBI)":[54],"method":[55],"can":[57,92],"greatly":[58],"increase":[59],"numeric":[63],"ET":[67,129],"process.":[68],"For":[69],"group":[71],"available":[73],"measurements,":[74],"RKBI":[75,91,109,120],"has":[76],"smallest":[78],"approximation":[79],"error":[80,89],"to":[82],"existing":[84],"methods.":[86],"Furthermore,":[87],"be":[93],"easily":[94],"estimated":[95],"no":[97],"additional":[98],"hardware":[99],"need":[102],"for":[103],"actual":[104],"measurements.":[105],"optimality":[107],"validated":[111],"using":[112],"both":[113],"theoretical":[114],"experimental":[116],"frameworks,":[117],"demonstrating":[118],"really":[121],"improves":[122],"spatial":[124],"steadiness":[127],"images.":[130]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}