{"id":"https://openalex.org/W4382407296","doi":"https://doi.org/10.1109/tim.2023.3290307","title":"Measuring Technique and Error Analysis of Complex Permittivity of Polymer Films Based on Contact Method","display_name":"Measuring Technique and Error Analysis of Complex Permittivity of Polymer Films Based on Contact Method","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4382407296","doi":"https://doi.org/10.1109/tim.2023.3290307"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3290307","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3290307","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100647726","display_name":"Jun Li","orcid":"https://orcid.org/0000-0003-3530-527X"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Li","raw_affiliation_strings":["Department of Electrical Engineering, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-3530-527X","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103210486","display_name":"T. Lv","orcid":"https://orcid.org/0000-0002-8356-7349"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianhua Lv","raw_affiliation_strings":["Department of Electrical Engineering, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-8356-7349","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014446413","display_name":"Wenhao Zhang","orcid":"https://orcid.org/0000-0003-2429-3189"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenhao Zhang","raw_affiliation_strings":["Department of Electrical Engineering, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-2429-3189","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088519469","display_name":"Feihu Zheng","orcid":"https://orcid.org/0000-0002-1728-050X"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feihu Zheng","raw_affiliation_strings":["Department of Electrical Engineering, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-1728-050X","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101616675","display_name":"Yang Xu","orcid":"https://orcid.org/0000-0001-5378-9437"},"institutions":[{"id":"https://openalex.org/I4391768273","display_name":"State Key Laboratory of Electrical Insulation and Power Equipment","ror":"https://ror.org/03kd9rr37","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768273","https://openalex.org/I87445476"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Xu","raw_affiliation_strings":["State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-5378-9437","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I4391768273","https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076237695","display_name":"Zhengxiang Shen","orcid":"https://orcid.org/0009-0007-9257-4608"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengxiang Shen","raw_affiliation_strings":["School of Physics Science and Engineering, Tongji University, Shanghai, China","School of physics science and engineering, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0007-9257-4608","affiliations":[{"raw_affiliation_string":"School of Physics Science and Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"School of physics science and engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076452606","display_name":"Yewen Zhang","orcid":"https://orcid.org/0000-0002-2854-1357"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yewen Zhang","raw_affiliation_strings":["Department of Electrical Engineering, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-2854-1357","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1676,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.39989622,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.8765566349029541},{"id":"https://openalex.org/keywords/flatness","display_name":"Flatness (cosmology)","score":0.7271156907081604},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6183738112449646},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.5988637208938599},{"id":"https://openalex.org/keywords/relative-permittivity","display_name":"Relative permittivity","score":0.5489299297332764},{"id":"https://openalex.org/keywords/polymer","display_name":"Polymer","score":0.5045052766799927},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.4425428509712219},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.43193119764328003},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.41766855120658875},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3521263003349304},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.3117828369140625},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.30057692527770996},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.25696510076522827},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23305219411849976},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.16876837611198425},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13291355967521667},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12583854794502258}],"concepts":[{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.8765566349029541},{"id":"https://openalex.org/C2778530986","wikidata":"https://www.wikidata.org/wiki/Q5457948","display_name":"Flatness (cosmology)","level":3,"score":0.7271156907081604},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6183738112449646},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5988637208938599},{"id":"https://openalex.org/C13760523","wikidata":"https://www.wikidata.org/wiki/Q4027242","display_name":"Relative permittivity","level":4,"score":0.5489299297332764},{"id":"https://openalex.org/C521977710","wikidata":"https://www.wikidata.org/wiki/Q81163","display_name":"Polymer","level":2,"score":0.5045052766799927},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.4425428509712219},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.43193119764328003},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.41766855120658875},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3521263003349304},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.3117828369140625},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.30057692527770996},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.25696510076522827},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23305219411849976},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.16876837611198425},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13291355967521667},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12583854794502258},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C26405456","wikidata":"https://www.wikidata.org/wiki/Q338","display_name":"Cosmology","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3290307","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3290307","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W2044617818","https://openalex.org/W2110983635","https://openalex.org/W2147986000","https://openalex.org/W2801445527","https://openalex.org/W2854946076","https://openalex.org/W2887409088","https://openalex.org/W2909893357","https://openalex.org/W2943001755","https://openalex.org/W2946375428","https://openalex.org/W2981850618","https://openalex.org/W3033148849","https://openalex.org/W3047834152","https://openalex.org/W3141515300","https://openalex.org/W3215198835","https://openalex.org/W4205472219","https://openalex.org/W4213252783","https://openalex.org/W4213427849","https://openalex.org/W4247405029","https://openalex.org/W4288062510","https://openalex.org/W4288774587","https://openalex.org/W4309899834","https://openalex.org/W4312712248","https://openalex.org/W6769719629"],"related_works":["https://openalex.org/W2011411333","https://openalex.org/W2105022880","https://openalex.org/W2916757468","https://openalex.org/W3048135406","https://openalex.org/W3169922844","https://openalex.org/W2257665435","https://openalex.org/W4200025391","https://openalex.org/W2981381023","https://openalex.org/W4382407296","https://openalex.org/W2078802381"],"abstract_inverted_index":{"Contact":[0],"method":[1,5,76],"is":[2,70,132],"an":[3],"important":[4],"to":[6,87,99],"measure":[7,88],"the":[8,32,37,49,58,78,100,123,128,138],"complex":[9,89,139],"permittivity":[10,90,116,140],"of":[11,39,51,60,80,91,114,142],"polymer":[12,144],"films.":[13],"There":[14],"are":[15,96,117],"some":[16],"possible":[17],"factors":[18],"affecting":[19],"its":[20],"accurate":[21],"measurement":[22,130,141],"for":[23,137],"thin":[24],"films":[25,92,145],"by":[26,42,57,105,122],"direct":[27,74],"contact":[28,75],"method.":[29],"To":[30],"solve":[31],"problem,":[33],"this":[34],"paper":[35],"analyzes":[36],"reasons":[38],"errors":[40,113],"induced":[41,56],"flatness":[43],"tolerance":[44],"and":[45,54,77,102,134],"edge":[46],"effect":[47],"from":[48],"view":[50],"three-electrode":[52],"structure,":[53],"that":[55,112],"state":[59,79],"film":[61,81],"surface":[62,95],"as":[63],"well.":[64],"An":[65],"equivalent":[66],"electric":[67],"circuit":[68],"model":[69],"proposed":[71,129],"based":[72],"on":[73],"surfaces.":[82],"The":[83],"correction":[84,124],"formulas":[85],"used":[86],"with":[93],"coarse":[94],"derived":[97],"according":[98],"model,":[101],"then":[103],"verified":[104],"experimenting":[106],"different":[107],"materials.":[108],"Experimental":[109],"results":[110],"show":[111],"relative":[115],"under":[118],"5%":[119],"after":[120],"calculation":[121],"formula.":[125],"In":[126],"conclusion,":[127],"technique":[131],"theoretically":[133],"practically":[135],"applicable":[136],"low-thickness":[143],"about":[146],"10~100":[147],"\u03bcm.":[148]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}