{"id":"https://openalex.org/W4382407374","doi":"https://doi.org/10.1109/tim.2023.3290290","title":"Graphene-Based Star\u2013Mesh Resistance Networks","display_name":"Graphene-Based Star\u2013Mesh Resistance Networks","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4382407374","doi":"https://doi.org/10.1109/tim.2023.3290290"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3290290","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3290290","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043286311","display_name":"Dean G. Jarrett","orcid":"https://orcid.org/0000-0003-1392-423X"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Dean G. Jarrett","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011965402","display_name":"Ching-Chen Yeh","orcid":"https://orcid.org/0000-0002-9703-1641"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ching-Chen Yeh","raw_affiliation_strings":["Department of Physics, National Taiwan University, Taipei City, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Physics, National Taiwan University, Taipei City, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082719299","display_name":"Shamith U. Payagala","orcid":"https://orcid.org/0000-0001-6359-8765"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shamith U. Payagala","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075794046","display_name":"Alireza R. Panna","orcid":"https://orcid.org/0000-0001-6557-2112"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alireza R. Panna","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369311","display_name":"Yanfei Yang","orcid":"https://orcid.org/0000-0003-0406-7416"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yanfei Yang","raw_affiliation_strings":["Graphene Waves, LLC, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"Graphene Waves, LLC, Gaithersburg, MD, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052986953","display_name":"Linli Meng","orcid":"https://orcid.org/0000-0001-8278-3376"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Linli Meng","raw_affiliation_strings":["Graphene Waves, LLC, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"Graphene Waves, LLC, Gaithersburg, MD, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033972287","display_name":"Swapnil M. Mhatre","orcid":"https://orcid.org/0000-0002-4131-3877"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Swapnil M. Mhatre","raw_affiliation_strings":["Graduate Institute of Applied Physics, National Taiwan University, Taipei City, Taiwan"],"affiliations":[{"raw_affiliation_string":"Graduate Institute of Applied Physics, National Taiwan University, Taipei City, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047823808","display_name":"Ngoc Thanh Mai Tran","orcid":"https://orcid.org/0000-0003-0346-986X"},"institutions":[{"id":"https://openalex.org/I4210151733","display_name":"Joint Quantum Institute","ror":"https://ror.org/04xz38214","country_code":"US","type":"facility","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210151733","https://openalex.org/I66946132"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ngoc Thanh Mai Tran","raw_affiliation_strings":["Joint Quantum Institute, University of Maryland, College Park, MD, USA"],"affiliations":[{"raw_affiliation_string":"Joint Quantum Institute, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I4210151733","https://openalex.org/I66946132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062292595","display_name":"Heather M. Hill","orcid":"https://orcid.org/0000-0002-4801-5864"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Heather M. Hill","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076088128","display_name":"Dipanjan Saha","orcid":"https://orcid.org/0000-0002-9702-5671"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dipanjan Saha","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078951512","display_name":"Randolph E. Elmquist","orcid":"https://orcid.org/0000-0001-9041-7966"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Randolph E. Elmquist","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006474578","display_name":"David B. Newell","orcid":"https://orcid.org/0000-0002-2612-1172"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David B. Newell","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039812989","display_name":"Albert F. Rigosi","orcid":"https://orcid.org/0000-0002-8189-3829"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Albert F. Rigosi","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":13,"corresponding_author_ids":["https://openalex.org/A5043286311"],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":null,"apc_paid":null,"fwci":1.0512,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.72891824,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ohm","display_name":"Ohm","score":0.7080444097518921},{"id":"https://openalex.org/keywords/graphene","display_name":"Graphene","score":0.62252277135849},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.5182694792747498},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40852123498916626},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3802661895751953},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3784366548061371},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.35901427268981934},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.32784608006477356},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3236932158470154},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.30056309700012207},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.28012514114379883},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.16006824374198914}],"concepts":[{"id":"https://openalex.org/C32211213","wikidata":"https://www.wikidata.org/wiki/Q47083","display_name":"Ohm","level":2,"score":0.7080444097518921},{"id":"https://openalex.org/C30080830","wikidata":"https://www.wikidata.org/wiki/Q169917","display_name":"Graphene","level":2,"score":0.62252277135849},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.5182694792747498},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40852123498916626},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3802661895751953},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3784366548061371},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.35901427268981934},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32784608006477356},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3236932158470154},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.30056309700012207},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.28012514114379883},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.16006824374198914}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3290290","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3290290","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1533151001","https://openalex.org/W1763853494","https://openalex.org/W1969548897","https://openalex.org/W1972698568","https://openalex.org/W1989415869","https://openalex.org/W1991385489","https://openalex.org/W1997898072","https://openalex.org/W2022106697","https://openalex.org/W2044576004","https://openalex.org/W2078613864","https://openalex.org/W2099027579","https://openalex.org/W2109063544","https://openalex.org/W2129706268","https://openalex.org/W2134421678","https://openalex.org/W2191560045","https://openalex.org/W2550995094","https://openalex.org/W2770056318","https://openalex.org/W2901833081","https://openalex.org/W2903925402","https://openalex.org/W2962904650","https://openalex.org/W2963911657","https://openalex.org/W2966259597","https://openalex.org/W2968686119","https://openalex.org/W2972679210","https://openalex.org/W2998031921","https://openalex.org/W3009957092","https://openalex.org/W3098787821","https://openalex.org/W3103554303","https://openalex.org/W3106464298","https://openalex.org/W3128062343","https://openalex.org/W3168684296","https://openalex.org/W4246418056","https://openalex.org/W4280507183","https://openalex.org/W4308992121","https://openalex.org/W6661476562"],"related_works":["https://openalex.org/W2606452130","https://openalex.org/W3149465128","https://openalex.org/W3196929922","https://openalex.org/W2377562106","https://openalex.org/W2081887179","https://openalex.org/W2328592354","https://openalex.org/W3033906315","https://openalex.org/W1578765583","https://openalex.org/W2914224237","https://openalex.org/W2017407474"],"abstract_inverted_index":{"Advances":[0],"in":[1,10,158],"the":[2,22,34,38,41,101,111,131,134,167,172,187],"development":[3],"of":[4,33,40,65,73,120],"graphene-based":[5,88],"technology":[6],"have":[7,20],"enabled":[8],"improvements":[9],"DC":[11],"resistance":[12,52,96,140],"metrology.":[13],"Devices":[14],"made":[15,78],"from":[16],"epitaxially":[17],"grown":[18],"graphene":[19],"replaced":[21],"GaAs-based":[23],"counterparts,":[24],"leading":[25],"to":[26,47,83,110,129,133,186],"an":[27,80],"easier":[28],"and":[29,61,137],"more":[30,156,176,183],"accessible":[31],"realization":[32],"ohm.":[35],"By":[36],"optimizing":[37],"scale":[39],"growth,":[42],"it":[43,79],"has":[44],"become":[45],"possible":[46],"fabricate":[48],"quantized":[49],"Hall":[50],"array":[51,104,144,153],"standards":[53],"(QHARS)":[54],"with":[55,142,154,181],"nominal":[56],"values":[57],"between":[58],"1":[59],"k\u03a9":[60],"1.29":[62],"M\u03a9.":[63],"One":[64],"these":[66],"QHARS":[67,89],"device":[68,163],"designs":[69],"accommodates":[70],"a":[71,85,117,151,179,182],"value":[72],"about":[74],"1.01":[75,102,161],"M\u03a9,":[76],"which":[77,114],"ideal":[81],"candidate":[82],"pursue":[84],"proof-of-concept":[86],"that":[87,166],"devices":[90],"are":[91],"suitable":[92],"for":[93,150],"forming":[94],"wye-delta":[95,112,168],"networks.":[97],"In":[98],"this":[99],"work,":[100],"M\u03a9":[103,108,136,162],"output":[105],"nearly":[106],"20.6":[107],"due":[109],"transformation,":[113],"itself":[115],"is":[116],"special":[118],"case":[119],"star-mesh":[121],"transformations.":[122],"These":[123],"mathematical":[124],"equivalence":[125],"principles":[126],"allow":[127],"one":[128],"extend":[130],"QHR":[132],"100":[135],"10":[138],"G\u03a9":[139],"levels":[141],"fewer":[143],"elements":[145,157],"than":[146],"would":[147],"be":[148],"necessary":[149],"single":[152],"many":[155],"series.":[159],"The":[160],"shows":[164],"promise":[165],"transformation":[169],"can":[170],"shorten":[171],"calibration":[173],"chain,":[174],"and,":[175],"importantly,":[177],"provide":[178],"chain":[180],"direct":[184],"line":[185],"quantum":[188],"SI.":[189]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}