{"id":"https://openalex.org/W4382203275","doi":"https://doi.org/10.1109/tim.2023.3289555","title":"Nanosecond Peak Detect and Hold Circuit With Adjustable Dynamic Range","display_name":"Nanosecond Peak Detect and Hold Circuit With Adjustable Dynamic Range","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4382203275","doi":"https://doi.org/10.1109/tim.2023.3289555"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3289555","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3289555","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085754242","display_name":"Gabriel Fellner","orcid":"https://orcid.org/0000-0001-6061-4280"},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Gabriel Fellner","raw_affiliation_strings":["Institute of Electronics, Graz University of Technology, Graz, Austria"],"raw_orcid":"https://orcid.org/0000-0001-6061-4280","affiliations":[{"raw_affiliation_string":"Institute of Electronics, Graz University of Technology, Graz, Austria","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049103080","display_name":"Lucas Speckbacher","orcid":"https://orcid.org/0000-0003-1347-1541"},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Lucas Speckbacher","raw_affiliation_strings":["Institute of Electronics, Graz University of Technology, Graz, Austria"],"raw_orcid":"https://orcid.org/0000-0003-1347-1541","affiliations":[{"raw_affiliation_string":"Institute of Electronics, Graz University of Technology, Graz, Austria","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102781863","display_name":"Seyed Mostafa Mousavi","orcid":"https://orcid.org/0000-0002-2622-741X"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seyed Mostafa Mousavi","raw_affiliation_strings":["EMC Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"raw_orcid":"https://orcid.org/0000-0002-2622-741X","affiliations":[{"raw_affiliation_string":"EMC Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058942455","display_name":"David Pommerenke","orcid":"https://orcid.org/0000-0002-0649-8159"},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"David Johannes Pommerenke","raw_affiliation_strings":["Institute of Electronics and the SAL-GEMC Laboratory, Graz University of Technology, Graz, Austria"],"raw_orcid":"https://orcid.org/0000-0002-0649-8159","affiliations":[{"raw_affiliation_string":"Institute of Electronics and the SAL-GEMC Laboratory, Graz University of Technology, Graz, Austria","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047493123","display_name":"Satyajeet Shinde","orcid":"https://orcid.org/0000-0003-4407-4848"},"institutions":[{"id":"https://openalex.org/I4210153776","display_name":"Apple (United States)","ror":"https://ror.org/059hsda18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153776"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Satyajeet Shinde","raw_affiliation_strings":["Apple Inc., Cupertino, CA, USA"],"raw_orcid":"https://orcid.org/0000-0003-4407-4848","affiliations":[{"raw_affiliation_string":"Apple Inc., Cupertino, CA, USA","institution_ids":["https://openalex.org/I4210153776"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067296299","display_name":"Michael Hillstrom","orcid":"https://orcid.org/0000-0001-8594-6118"},"institutions":[{"id":"https://openalex.org/I4210153776","display_name":"Apple (United States)","ror":"https://ror.org/059hsda18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153776"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Hillstrom","raw_affiliation_strings":["Apple Inc., Cupertino, CA, USA"],"raw_orcid":"https://orcid.org/0000-0001-8594-6118","affiliations":[{"raw_affiliation_string":"Apple Inc., Cupertino, CA, USA","institution_ids":["https://openalex.org/I4210153776"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048186276","display_name":"R. Chundru","orcid":"https://orcid.org/0000-0002-0613-2253"},"institutions":[{"id":"https://openalex.org/I4210153776","display_name":"Apple (United States)","ror":"https://ror.org/059hsda18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153776"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ram Chundru","raw_affiliation_strings":["Apple Inc., Cupertino, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-0613-2253","affiliations":[{"raw_affiliation_string":"Apple Inc., Cupertino, CA, USA","institution_ids":["https://openalex.org/I4210153776"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042623118","display_name":"Cheung-Wei Lam","orcid":"https://orcid.org/0000-0003-0132-2530"},"institutions":[{"id":"https://openalex.org/I4210153776","display_name":"Apple (United States)","ror":"https://ror.org/059hsda18","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153776"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Cheung-Wei Lam","raw_affiliation_strings":["Apple Inc., Cupertino, CA, USA"],"raw_orcid":"https://orcid.org/0000-0003-0132-2530","affiliations":[{"raw_affiliation_string":"Apple Inc., Cupertino, CA, USA","institution_ids":["https://openalex.org/I4210153776"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5085754242"],"corresponding_institution_ids":["https://openalex.org/I4092182"],"apc_list":null,"apc_paid":null,"fwci":0.511,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.63622063,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.6053828597068787},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5388559699058533},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5092991590499878},{"id":"https://openalex.org/keywords/schmitt-trigger","display_name":"Schmitt trigger","score":0.48230695724487305},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47424572706222534},{"id":"https://openalex.org/keywords/pulse-width-modulation","display_name":"Pulse-width modulation","score":0.44598379731178284},{"id":"https://openalex.org/keywords/rise-time","display_name":"Rise time","score":0.4394320547580719},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4288847744464874},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.42636266350746155},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.4251467287540436},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4243046045303345},{"id":"https://openalex.org/keywords/pulsed-power","display_name":"Pulsed power","score":0.42215076088905334},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.4173011779785156},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3567195236682892},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34095072746276855},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11381509900093079}],"concepts":[{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6053828597068787},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5388559699058533},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5092991590499878},{"id":"https://openalex.org/C90201813","wikidata":"https://www.wikidata.org/wiki/Q202957","display_name":"Schmitt trigger","level":3,"score":0.48230695724487305},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47424572706222534},{"id":"https://openalex.org/C92746544","wikidata":"https://www.wikidata.org/wiki/Q585184","display_name":"Pulse-width modulation","level":3,"score":0.44598379731178284},{"id":"https://openalex.org/C47586369","wikidata":"https://www.wikidata.org/wiki/Q377672","display_name":"Rise time","level":3,"score":0.4394320547580719},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4288847744464874},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.42636266350746155},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.4251467287540436},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4243046045303345},{"id":"https://openalex.org/C97039730","wikidata":"https://www.wikidata.org/wiki/Q552565","display_name":"Pulsed power","level":3,"score":0.42215076088905334},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.4173011779785156},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3567195236682892},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34095072746276855},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11381509900093079}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3289555","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3289555","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.9100000262260437,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1968273566","https://openalex.org/W1999510564","https://openalex.org/W2012221793","https://openalex.org/W2022412863","https://openalex.org/W2022656079","https://openalex.org/W2045717491","https://openalex.org/W2055440292","https://openalex.org/W2118956359","https://openalex.org/W2122640006","https://openalex.org/W2123115623","https://openalex.org/W2126558556","https://openalex.org/W2133008780","https://openalex.org/W2148503663","https://openalex.org/W2157056807","https://openalex.org/W2534424906","https://openalex.org/W2979459418","https://openalex.org/W3208052990","https://openalex.org/W4247790476","https://openalex.org/W4253598127","https://openalex.org/W4384928295","https://openalex.org/W6965158119"],"related_works":["https://openalex.org/W1931108031","https://openalex.org/W2153627275","https://openalex.org/W2053155972","https://openalex.org/W3045614473","https://openalex.org/W2116943446","https://openalex.org/W2911400173","https://openalex.org/W969526214","https://openalex.org/W1947813179","https://openalex.org/W2368240659","https://openalex.org/W4210561788"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,40,56,98,143],"novel":[4],"peak":[5,16,93],"detect":[6],"and":[7,48,63,89,106,120],"hold":[8],"(PDH)":[9],"circuit":[10,41,74,129],"for":[11,78],"the":[12,15,27,71,86,90,124,127,134],"measurement":[13],"of":[14,18,100,148],"voltage":[17],"electromagnetic-field":[19],"probes.":[20],"These":[21],"probes":[22],"are":[23],"used":[24],"to":[25,118,133,138],"capture":[26],"fields":[28],"generated":[29],"by":[30],"electrostatic":[31],"discharge":[32],"(ESD)":[33],"events":[34],"in":[35,142],"non-grounded":[36],"portable":[37],"devices.":[38],"Therefore,":[39],"combining":[42],"small":[43],"size,":[44],"low":[45],"power":[46,121,140],"consumption":[47,141],"nano-second":[49],"operation":[50],"is":[51,76,95],"needed.":[52],"A":[53,109],"topology":[54],"using":[55],"discrete":[57],"bipolar":[58],"transistor":[59],"structure":[60],"with":[61,111,116],"OTA":[62],"common-base":[64],"storage":[65],"capacitor":[66],"charge":[67],"control":[68],"optimally":[69],"meets":[70],"requirements.":[72],"The":[73,83],"performance":[75,115],"demonstrated":[77],"different":[79,149],"bias":[80,107,125],"point":[81],"settings.":[82,108],"error":[84],"between":[85],"captured":[87],"value":[88,94],"actual":[91],"pulse":[92,103],"shown":[96],"as":[97],"function":[99],"rise":[101],"time,":[102],"length,":[104],"amplitude":[105],"comparison":[110],"literature,":[112],"shows":[113],"unmatched":[114],"respect":[117],"speed":[119],"consumption.":[122],"Using":[123],"settings":[126],"PDH":[128],"can":[130],"be":[131],"adjusted":[132],"sensor\u2019s":[135],"frequency":[136],"response":[137],"minimize":[139],"multi-channel":[144],"system":[145],"containing":[146],"sensors":[147],"bandwidth.":[150]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}