{"id":"https://openalex.org/W4379180638","doi":"https://doi.org/10.1109/tim.2023.3277935","title":"Solder Joint Inspection on Printed Circuit Boards: A Survey and a Dataset","display_name":"Solder Joint Inspection on Printed Circuit Boards: A Survey and a Dataset","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4379180638","doi":"https://doi.org/10.1109/tim.2023.3277935"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3277935","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3277935","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063055273","display_name":"Furkan \u00dclger","orcid":"https://orcid.org/0000-0002-5935-2743"},"institutions":[{"id":"https://openalex.org/I56303344","display_name":"Aselsan (Turkey)","ror":"https://ror.org/04knh8e66","country_code":"TR","type":"company","lineage":["https://openalex.org/I56303344"]},{"id":"https://openalex.org/I66514158","display_name":"Hacettepe University","ror":"https://ror.org/04kwvgz42","country_code":"TR","type":"education","lineage":["https://openalex.org/I66514158"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Furkan Ulger","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Hacettepe University, Ankara, Turkey","Aselsan Inc, Turkey"],"raw_orcid":"https://orcid.org/0000-0002-5935-2743","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Hacettepe University, Ankara, Turkey","institution_ids":["https://openalex.org/I66514158"]},{"raw_affiliation_string":"Aselsan Inc, Turkey","institution_ids":["https://openalex.org/I56303344"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012317612","display_name":"Seniha Esen Y\u00fcksel","orcid":"https://orcid.org/0000-0002-8868-1132"},"institutions":[{"id":"https://openalex.org/I66514158","display_name":"Hacettepe University","ror":"https://ror.org/04kwvgz42","country_code":"TR","type":"education","lineage":["https://openalex.org/I66514158"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Seniha Esen Yuksel","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Hacettepe University, Ankara, Turkey"],"raw_orcid":"https://orcid.org/0000-0002-8868-1132","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Hacettepe University, Ankara, Turkey","institution_ids":["https://openalex.org/I66514158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001307249","display_name":"Atila Y\u0131lmaz","orcid":"https://orcid.org/0000-0001-9459-8493"},"institutions":[{"id":"https://openalex.org/I66514158","display_name":"Hacettepe University","ror":"https://ror.org/04kwvgz42","country_code":"TR","type":"education","lineage":["https://openalex.org/I66514158"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Atila Yilmaz","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Hacettepe University, Ankara, Turkey"],"raw_orcid":"https://orcid.org/0000-0001-9459-8493","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Hacettepe University, Ankara, Turkey","institution_ids":["https://openalex.org/I66514158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007290446","display_name":"Din\u00e7er G\u00f6kcen","orcid":"https://orcid.org/0000-0003-1847-1356"},"institutions":[{"id":"https://openalex.org/I66514158","display_name":"Hacettepe University","ror":"https://ror.org/04kwvgz42","country_code":"TR","type":"education","lineage":["https://openalex.org/I66514158"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Dincer Gokcen","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Hacettepe University, Ankara, Turkey"],"raw_orcid":"https://orcid.org/0000-0003-1847-1356","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Hacettepe University, Ankara, Turkey","institution_ids":["https://openalex.org/I66514158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":6.7691,"has_fulltext":false,"cited_by_count":47,"citation_normalized_percentile":{"value":0.97140329,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"21"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface-mount-technology","display_name":"Surface-mount technology","score":0.9035263061523438},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.7828327417373657},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.7681232690811157},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6753615736961365},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6733770966529846},{"id":"https://openalex.org/keywords/joint","display_name":"Joint (building)","score":0.6710724234580994},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.5725663900375366},{"id":"https://openalex.org/keywords/soldering","display_name":"Soldering","score":0.5595521330833435},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.5433178544044495},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5333195924758911},{"id":"https://openalex.org/keywords/smt-placement-equipment","display_name":"SMT placement equipment","score":0.4972675144672394},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4760743975639343},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.3812773823738098},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20621195435523987},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.09454283118247986}],"concepts":[{"id":"https://openalex.org/C2776584680","wikidata":"https://www.wikidata.org/wiki/Q191042","display_name":"Surface-mount technology","level":3,"score":0.9035263061523438},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.7828327417373657},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.7681232690811157},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6753615736961365},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6733770966529846},{"id":"https://openalex.org/C18555067","wikidata":"https://www.wikidata.org/wiki/Q8375051","display_name":"Joint (building)","level":2,"score":0.6710724234580994},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5725663900375366},{"id":"https://openalex.org/C50296614","wikidata":"https://www.wikidata.org/wiki/Q211387","display_name":"Soldering","level":2,"score":0.5595521330833435},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.5433178544044495},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5333195924758911},{"id":"https://openalex.org/C17511633","wikidata":"https://www.wikidata.org/wiki/Q830694","display_name":"SMT placement equipment","level":3,"score":0.4972675144672394},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4760743975639343},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.3812773823738098},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20621195435523987},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.09454283118247986},{"id":"https://openalex.org/C90509273","wikidata":"https://www.wikidata.org/wiki/Q11012","display_name":"Robot","level":2,"score":0.0},{"id":"https://openalex.org/C170154142","wikidata":"https://www.wikidata.org/wiki/Q150737","display_name":"Architectural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3277935","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3277935","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.49000000953674316,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":131,"referenced_works":["https://openalex.org/W188655508","https://openalex.org/W592556692","https://openalex.org/W632789555","https://openalex.org/W1485009520","https://openalex.org/W1503398984","https://openalex.org/W1597628491","https://openalex.org/W1603486763","https://openalex.org/W1611842984","https://openalex.org/W1780575547","https://openalex.org/W1965696824","https://openalex.org/W1965996769","https://openalex.org/W1968587574","https://openalex.org/W1979348319","https://openalex.org/W1981319256","https://openalex.org/W1983571569","https://openalex.org/W1985468640","https://openalex.org/W1985756133","https://openalex.org/W1993516256","https://openalex.org/W1995895923","https://openalex.org/W1999461605","https://openalex.org/W2004056068","https://openalex.org/W2004241456","https://openalex.org/W2004313226","https://openalex.org/W2008960136","https://openalex.org/W2018459216","https://openalex.org/W2020457182","https://openalex.org/W2024468509","https://openalex.org/W2025115091","https://openalex.org/W2027933820","https://openalex.org/W2029420343","https://openalex.org/W2034897069","https://openalex.org/W2036727450","https://openalex.org/W2048715575","https://openalex.org/W2049281750","https://openalex.org/W2052545764","https://openalex.org/W2054822316","https://openalex.org/W2056000113","https://openalex.org/W2062027733","https://openalex.org/W2071476158","https://openalex.org/W2075352981","https://openalex.org/W2087177100","https://openalex.org/W2095425546","https://openalex.org/W2099890266","https://openalex.org/W2112129461","https://openalex.org/W2113161393","https://openalex.org/W2114908523","https://openalex.org/W2120270858","https://openalex.org/W2123085404","https://openalex.org/W2125150158","https://openalex.org/W2125387914","https://openalex.org/W2126780805","https://openalex.org/W2127628407","https://openalex.org/W2132015403","https://openalex.org/W2137534053","https://openalex.org/W2141832011","https://openalex.org/W2145103509","https://openalex.org/W2147953125","https://openalex.org/W2161514412","https://openalex.org/W2163605009","https://openalex.org/W2241204461","https://openalex.org/W2520155979","https://openalex.org/W2550604463","https://openalex.org/W2564346188","https://openalex.org/W2571841761","https://openalex.org/W2575493008","https://openalex.org/W2606884892","https://openalex.org/W2790214586","https://openalex.org/W2795052757","https://openalex.org/W2803361407","https://openalex.org/W2804654620","https://openalex.org/W2806646158","https://openalex.org/W2884367402","https://openalex.org/W2886256586","https://openalex.org/W2895572611","https://openalex.org/W2901109682","https://openalex.org/W2914154500","https://openalex.org/W2943694032","https://openalex.org/W2954934694","https://openalex.org/W2962727943","https://openalex.org/W2963509914","https://openalex.org/W2978926843","https://openalex.org/W2984761674","https://openalex.org/W2985132266","https://openalex.org/W2996641304","https://openalex.org/W2997116767","https://openalex.org/W2997977982","https://openalex.org/W3021144501","https://openalex.org/W3023646581","https://openalex.org/W3028888497","https://openalex.org/W3034942609","https://openalex.org/W3039407588","https://openalex.org/W3087327842","https://openalex.org/W3092466439","https://openalex.org/W3107088192","https://openalex.org/W3114273261","https://openalex.org/W3124804470","https://openalex.org/W3129420947","https://openalex.org/W3171104149","https://openalex.org/W3193024002","https://openalex.org/W3203234901","https://openalex.org/W3206900642","https://openalex.org/W3213192039","https://openalex.org/W4205553873","https://openalex.org/W4205687621","https://openalex.org/W4206237889","https://openalex.org/W4206290629","https://openalex.org/W4210407621","https://openalex.org/W4210452846","https://openalex.org/W4214717370","https://openalex.org/W4214721373","https://openalex.org/W4224298131","https://openalex.org/W4226212070","https://openalex.org/W4238498257","https://openalex.org/W4286582003","https://openalex.org/W4289709210","https://openalex.org/W4293057377","https://openalex.org/W4293568373","https://openalex.org/W4312551243","https://openalex.org/W4322576545","https://openalex.org/W4353069825","https://openalex.org/W6607701154","https://openalex.org/W6628877408","https://openalex.org/W6677961869","https://openalex.org/W6679613451","https://openalex.org/W6684191040","https://openalex.org/W6759044181","https://openalex.org/W6760742710","https://openalex.org/W6777126450","https://openalex.org/W6780248173","https://openalex.org/W6810515007","https://openalex.org/W6842327062"],"related_works":["https://openalex.org/W2006647471","https://openalex.org/W2098893900","https://openalex.org/W2151533009","https://openalex.org/W2363427070","https://openalex.org/W3202287565","https://openalex.org/W2060971344","https://openalex.org/W2810364702","https://openalex.org/W2113425440","https://openalex.org/W1560398276","https://openalex.org/W188655508"],"abstract_inverted_index":{"Surface":[0],"Mount":[1],"Technology":[2],"(SMT)":[3],"is":[4,24,160],"a":[5,84,134,152],"procedure":[6,23],"for":[7,46,101,124],"mounting":[8],"electronic":[9],"components":[10],"to":[11,78,154],"the":[12,15,21,28,47,87,98,111,125],"surface":[13],"of":[14,50,143],"printed":[16],"circuit":[17],"boards":[18],"(PCB).":[19],"Although":[20],"SMT":[22,37,112,144],"more":[25,88],"reliable":[26],"than":[27],"conventional":[29],"through-hole":[30],"mounting,":[31],"many":[32],"errors":[33],"may":[34],"occur":[35,109],"in":[36,110],"lines.":[38],"In":[39],"this":[40,130],"paper,":[41],"we":[42,132],"surveyed":[43],"methods":[44,56],"presented":[45],"optical":[48],"inspection":[49,126],"solder":[51,102],"joints":[52,103],"on":[53,86],"PCBs.":[54],"The":[55,158],"are":[57,122],"grouped":[58],"by":[59],"problem-solving":[60],"approach:":[61],"reference-based,":[62],"machine":[63],"learning/computer":[64],"vision,":[65],"deep":[66,90],"learning,":[67],"and":[68,73,81,92,96,140],"3D":[69,93],"reconstruction.":[70],"We":[71],"compare":[72,155],"discuss":[74],"these":[75],"approaches":[76],"according":[77],"their":[79],"advantages":[80],"disadvantages,":[82],"with":[83,137],"focus":[85],"recent":[89],"learning":[91],"reconstruction":[94],"techniques,":[95],"list":[97],"public":[99,115,135],"datasets":[100,116],"inspection.":[104],"Since":[105],"defective":[106,119],"samples":[107,120],"rarely":[108],"manufacturing":[113],"lines,":[114],"have":[117],"few":[118],"that":[121],"essential":[123],"task.":[127],"To":[128],"fill":[129],"gap,":[131],"publish":[133],"dataset":[136,147,159],"both":[138],"normal":[139],"different":[141,156],"types":[142],"errors.":[145],"Our":[146],"can":[148],"be":[149],"used":[150],"as":[151],"benchmark":[153],"algorithms.":[157],"available":[161],"at":[162],"https://github.com/furkanulger/solder-joint-dataset.":[163]},"counts_by_year":[{"year":2026,"cited_by_count":8},{"year":2025,"cited_by_count":23},{"year":2024,"cited_by_count":15},{"year":2023,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}