{"id":"https://openalex.org/W4380433285","doi":"https://doi.org/10.1109/tim.2023.3277096","title":"Automatic Sensor Array Calibration and Coregistration for On-Scalp MEG","display_name":"Automatic Sensor Array Calibration and Coregistration for On-Scalp MEG","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4380433285","doi":"https://doi.org/10.1109/tim.2023.3277096"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3277096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3277096","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006205140","display_name":"Maotong Pang","orcid":"https://orcid.org/0000-0002-9113-4009"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Maotong Pang","raw_affiliation_strings":["Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","Hangzhou Innovation Institute, Beihang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-9113-4009","affiliations":[{"raw_affiliation_string":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041127829","display_name":"Ziyuan Huang","orcid":"https://orcid.org/0000-0003-0966-6776"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziyuan Huang","raw_affiliation_strings":["Research Institute of Frontier Science, Beihang University, Beijing, China","Hangzhou Innovation Institute, Beihang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-0966-6776","affiliations":[{"raw_affiliation_string":"Research Institute of Frontier Science, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010226215","display_name":"Zhongya Ding","orcid":"https://orcid.org/0000-0002-4340-8677"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongya Ding","raw_affiliation_strings":["Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","Hangzhou Innovation Institute, Beihang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-4340-8677","affiliations":[{"raw_affiliation_string":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017471039","display_name":"Bangcheng Han","orcid":"https://orcid.org/0000-0003-1313-756X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bangcheng Han","raw_affiliation_strings":["Research Institute of Frontier Science, Beihang University, Beijing, China","Hangzhou Innovation Institute, Beihang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-1313-756X","affiliations":[{"raw_affiliation_string":"Research Institute of Frontier Science, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5006205140"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.8244,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.85254871,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10977","display_name":"Optical Imaging and Spectroscopy Techniques","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},"topics":[{"id":"https://openalex.org/T10977","display_name":"Optical Imaging and Spectroscopy Techniques","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10378","display_name":"Advanced MRI Techniques and Applications","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.8436033725738525},{"id":"https://openalex.org/keywords/orientation","display_name":"Orientation (vector space)","score":0.7425509691238403},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.7153732776641846},{"id":"https://openalex.org/keywords/sensor-array","display_name":"Sensor array","score":0.6580415964126587},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6244503259658813},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.5949082374572754},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5767331123352051},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5381558537483215},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23322150111198425},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.0867106020450592}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.8436033725738525},{"id":"https://openalex.org/C16345878","wikidata":"https://www.wikidata.org/wiki/Q107472979","display_name":"Orientation (vector space)","level":2,"score":0.7425509691238403},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.7153732776641846},{"id":"https://openalex.org/C66251956","wikidata":"https://www.wikidata.org/wiki/Q7451086","display_name":"Sensor array","level":2,"score":0.6580415964126587},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6244503259658813},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.5949082374572754},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5767331123352051},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5381558537483215},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23322150111198425},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0867106020450592},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3277096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3277096","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1739283308","display_name":null,"funder_award_id":"3222053","funder_id":"https://openalex.org/F4320322919","funder_display_name":"Natural Science Foundation of Beijing Municipality"}],"funders":[{"id":"https://openalex.org/F4320322919","display_name":"Natural Science Foundation of Beijing Municipality","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1987333243","https://openalex.org/W1988874269","https://openalex.org/W2026288163","https://openalex.org/W2026807227","https://openalex.org/W2049981393","https://openalex.org/W2066804398","https://openalex.org/W2084333685","https://openalex.org/W2089468765","https://openalex.org/W2100816864","https://openalex.org/W2103015834","https://openalex.org/W2581653246","https://openalex.org/W2766451117","https://openalex.org/W2791548393","https://openalex.org/W2904035998","https://openalex.org/W2941575009","https://openalex.org/W2949224319","https://openalex.org/W2959017434","https://openalex.org/W2969234156","https://openalex.org/W3008532182","https://openalex.org/W3030601496","https://openalex.org/W3147650375","https://openalex.org/W3183389039","https://openalex.org/W3195913606","https://openalex.org/W4205705494","https://openalex.org/W4241074797","https://openalex.org/W4312950272"],"related_works":["https://openalex.org/W2766932195","https://openalex.org/W2112002268","https://openalex.org/W2295869952","https://openalex.org/W1996490590","https://openalex.org/W1726816713","https://openalex.org/W2566455068","https://openalex.org/W2010809152","https://openalex.org/W2162639903","https://openalex.org/W1865242774","https://openalex.org/W4380433285"],"abstract_inverted_index":{"Accurate":[0],"MEG":[1,11,58,93,176],"localization":[2,178],"of":[3,20,47,53,57,72,79,89,126,132,143,151,159],"neural":[4],"electrical":[5],"activity":[6],"requires":[7],"registration":[8],"between":[9,107],"the":[10,17,21,42,51,54,86,105,108,112,116,135,139,147,157,160,164,175],"sensors":[12,91],"and":[13,24,44,76,111,128,146],"MRI.":[14],"To":[15],"reduce":[16],"geometric":[18,98],"error":[19,71,78],"sensor":[22],"array":[23,29,49,97,110,114,162,166],"realize":[25],"automatic":[26,61],"registration,":[27],"an":[28,129],"geometry":[30],"calibration":[31,46,87,99],"algorithm":[32,100],"based":[33,63],"on":[34,64],"prior":[35],"knowledge":[36],"is":[37,67,101,154],"proposed,":[38],"which":[39],"automatically":[40],"completes":[41],"position":[43,70,124,141],"orientation":[45,77,149],"OPM-MEG":[48],"with":[50,138],"reference":[52],"design":[55],"model":[56],"helmet.":[59],"Full-process":[60],"co-registration":[62],"optical":[65],"scanning":[66],"realized.":[68],"A":[69],"0.23":[73],"\u00b1":[74,81],"0.12mm":[75],"0.34":[80],"0.14\u00b0":[82],"are":[83],"obtained":[84],"in":[85,134,167,174],"results":[88,120],"85":[90],"on-scalp":[92],"system.":[94],"The":[95,119],"proposed":[96],"used":[102],"to":[103],"quantify":[104],"deviation":[106,125,131,142,150],"manufactured":[109,136,161],"theoretical":[113,165],"for":[115],"first":[117],"time.":[118],"show":[121],"a":[122],"mean":[123],"0.57mm":[127],"angle":[130],"0.68\u00b0":[133],"array,":[137],"maximum":[140,148],"1.45":[144],"mm":[145],"2.13\u00b0.":[152],"It":[153],"indicated":[155],"that":[156],"replacement":[158],"by":[163],"previous":[168],"research":[169],"may":[170],"introduce":[171],"significant":[172],"errors":[173],"source":[177],"results.":[179]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":1}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}