{"id":"https://openalex.org/W4376603108","doi":"https://doi.org/10.1109/tim.2023.3276017","title":"Stable Voltage Generation With a Josephson Voltage Standard Device Cooled at a 4 K Stage in a Dilution Refrigerator","display_name":"Stable Voltage Generation With a Josephson Voltage Standard Device Cooled at a 4 K Stage in a Dilution Refrigerator","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4376603108","doi":"https://doi.org/10.1109/tim.2023.3276017"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3276017","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2023.3276017","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/10012124/10124453.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/19/10012124/10124453.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028087512","display_name":"Daiki Matsumaru","orcid":"https://orcid.org/0000-0003-0474-0471"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Daiki Matsumaru","raw_affiliation_strings":["National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan"],"raw_orcid":"https://orcid.org/0000-0003-0474-0471","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021607947","display_name":"Shuji Nakamura","orcid":"https://orcid.org/0000-0002-0195-1428"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shuji Nakamura","raw_affiliation_strings":["National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan"],"raw_orcid":"https://orcid.org/0000-0002-0195-1428","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053181770","display_name":"Michitaka Maruyama","orcid":"https://orcid.org/0000-0003-4699-8331"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Michitaka Maruyama","raw_affiliation_strings":["National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan"],"raw_orcid":"https://orcid.org/0000-0003-4699-8331","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089866154","display_name":"Nobu\u2010Hisa Kaneko","orcid":"https://orcid.org/0000-0003-3857-7940"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobu-Hisa Kaneko","raw_affiliation_strings":["National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan"],"raw_orcid":"https://orcid.org/0000-0003-3857-7940","affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.3637,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.57487528,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10037","display_name":"Physics of Superconductivity and Magnetism","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9739999771118164,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dilution-refrigerator","display_name":"Dilution refrigerator","score":0.743419885635376},{"id":"https://openalex.org/keywords/josephson-effect","display_name":"Josephson effect","score":0.6972794532775879},{"id":"https://openalex.org/keywords/dilution","display_name":"Dilution","score":0.648262619972229},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.49549710750579834},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.4506126940250397},{"id":"https://openalex.org/keywords/superconductivity","display_name":"Superconductivity","score":0.4254877269268036},{"id":"https://openalex.org/keywords/niobium","display_name":"Niobium","score":0.4129182696342468},{"id":"https://openalex.org/keywords/flatness","display_name":"Flatness (cosmology)","score":0.4106448292732239},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3860645294189453},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.380509614944458},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.37768346071243286},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3596164584159851},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.34279775619506836},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.2698427736759186},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.24220755696296692},{"id":"https://openalex.org/keywords/refrigerator-car","display_name":"Refrigerator car","score":0.23689979314804077},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.22233271598815918},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.18373003602027893},{"id":"https://openalex.org/keywords/organic-chemistry","display_name":"Organic chemistry","score":0.14828118681907654},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13131660223007202}],"concepts":[{"id":"https://openalex.org/C8258855","wikidata":"https://www.wikidata.org/wiki/Q229468","display_name":"Dilution refrigerator","level":3,"score":0.743419885635376},{"id":"https://openalex.org/C12038964","wikidata":"https://www.wikidata.org/wiki/Q764228","display_name":"Josephson effect","level":3,"score":0.6972794532775879},{"id":"https://openalex.org/C96618451","wikidata":"https://www.wikidata.org/wiki/Q3028008","display_name":"Dilution","level":2,"score":0.648262619972229},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.49549710750579834},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4506126940250397},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.4254877269268036},{"id":"https://openalex.org/C507968137","wikidata":"https://www.wikidata.org/wiki/Q1046","display_name":"Niobium","level":2,"score":0.4129182696342468},{"id":"https://openalex.org/C2778530986","wikidata":"https://www.wikidata.org/wiki/Q5457948","display_name":"Flatness (cosmology)","level":3,"score":0.4106448292732239},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3860645294189453},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.380509614944458},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.37768346071243286},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3596164584159851},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.34279775619506836},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.2698427736759186},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.24220755696296692},{"id":"https://openalex.org/C125557594","wikidata":"https://www.wikidata.org/wiki/Q1796972","display_name":"Refrigerator car","level":2,"score":0.23689979314804077},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.22233271598815918},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.18373003602027893},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.14828118681907654},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13131660223007202},{"id":"https://openalex.org/C26405456","wikidata":"https://www.wikidata.org/wiki/Q338","display_name":"Cosmology","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3276017","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2023.3276017","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/10012124/10124453.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tim.2023.3276017","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2023.3276017","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/10012124/10124453.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8600000143051147}],"awards":[{"id":"https://openalex.org/G3666971577","display_name":"Difference voltage tracking in quantum metrology triangle","funder_award_id":"19K23527","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G7140790074","display_name":null,"funder_award_id":"JP18H05258","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4376603108.pdf","grobid_xml":"https://content.openalex.org/works/W4376603108.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W1967946353","https://openalex.org/W1972299476","https://openalex.org/W1979192444","https://openalex.org/W1983307560","https://openalex.org/W2007506696","https://openalex.org/W2009254132","https://openalex.org/W2010219616","https://openalex.org/W2013746191","https://openalex.org/W2014878368","https://openalex.org/W2017971175","https://openalex.org/W2026658955","https://openalex.org/W2044127202","https://openalex.org/W2064289877","https://openalex.org/W2084310782","https://openalex.org/W2092938290","https://openalex.org/W2094113781","https://openalex.org/W2121060861","https://openalex.org/W2130197096","https://openalex.org/W2566706182","https://openalex.org/W2896469455","https://openalex.org/W3086862622","https://openalex.org/W3095927099","https://openalex.org/W3102328588","https://openalex.org/W3215453980","https://openalex.org/W4229074905"],"related_works":["https://openalex.org/W4250977913","https://openalex.org/W2088160816","https://openalex.org/W4205819008","https://openalex.org/W1964909782","https://openalex.org/W2085355256","https://openalex.org/W2337527129","https://openalex.org/W179112046","https://openalex.org/W2145647832","https://openalex.org/W2041562100","https://openalex.org/W2086876690"],"abstract_inverted_index":{"We":[0,70],"have":[1],"demonstrated":[2],"voltage":[3,12,68],"generation":[4],"in":[5],"a":[6,10],"dilution":[7,35],"refrigerator":[8],"using":[9],"Josephson":[11,20],"standard":[13],"(JVS).":[14],"A":[15],"niobium-nitride":[16],"(NbN)-based":[17],"superconductor-normal":[18],"metal-superconductor":[19],"junction":[21],"(JJ)":[22],"array":[23],"was":[24,42],"placed":[25],"hung":[26],"directly":[27],"under":[28],"the":[29,34,49,55,63,66,72],"4":[30,56],"K":[31,57],"stage":[32],"of":[33,40,48,54,65,76,88,102],"refrigerator.":[36],"The":[37],"thermal":[38],"design":[39],"wiring":[41],"optimized":[43],"to":[44],"achieve":[45],"stable":[46],"operation":[47],"JVS":[50],"and":[51,90,106],"temperature":[52],"stability":[53],"stage.":[58],"After":[59],"that,":[60],"we":[61],"measured":[62],"flatness":[64],"quantized":[67],"steps.":[69],"obtained":[71],"combined":[73],"relative":[74],"uncertainty":[75],"<inline-formula":[77,91],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[78,92],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[79,93],"<tex-math":[80,94],"notation=\"LaTeX\">$2.4\\times":[81],"10^{-10}$":[82],"</tex-math></inline-formula>":[83,97],"V/V":[84,98],"within":[85,99],"40":[86],"min":[87],"accumulation":[89,103],"notation=\"LaTeX\">$2.1\\times":[95],"10^{-8}$":[96],"13":[100],"h":[101],"for":[104],"1028":[105],"2":[107],"mV":[108],"generation,":[109],"respectively.":[110]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}