{"id":"https://openalex.org/W4375928989","doi":"https://doi.org/10.1109/tim.2023.3273681","title":"Self-Supervised Surface Defect Localization via Joint De-Anomaly Reconstruction and Saliency-Guided Segmentation","display_name":"Self-Supervised Surface Defect Localization via Joint De-Anomaly Reconstruction and Saliency-Guided Segmentation","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4375928989","doi":"https://doi.org/10.1109/tim.2023.3273681"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3273681","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3273681","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019655277","display_name":"Hanyue Yang","orcid":"https://orcid.org/0000-0001-8545-2943"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hanyue Yang","raw_affiliation_strings":["Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8545-2943","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China","institution_ids":["https://openalex.org/I21193070"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101867605","display_name":"Zhenfeng Zhu","orcid":"https://orcid.org/0000-0001-7315-3276"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenfeng Zhu","raw_affiliation_strings":["Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-7315-3276","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China","institution_ids":["https://openalex.org/I21193070"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100746872","display_name":"Chen Lin","orcid":"https://orcid.org/0000-0003-4739-2999"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chen Lin","raw_affiliation_strings":["Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4739-2999","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China","institution_ids":["https://openalex.org/I21193070"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003043056","display_name":"Wenjun Hui","orcid":"https://orcid.org/0000-0002-2204-4472"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenjun Hui","raw_affiliation_strings":["Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-2204-4472","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China","institution_ids":["https://openalex.org/I21193070"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101845056","display_name":"Shenghui Wang","orcid":"https://orcid.org/0000-0003-3325-0754"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shenghui Wang","raw_affiliation_strings":["Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3325-0754","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China","institution_ids":["https://openalex.org/I21193070"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100362745","display_name":"Yao Zhao","orcid":"https://orcid.org/0000-0002-8581-9554"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Zhao","raw_affiliation_strings":["Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-8581-9554","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory of Advanced Information Science and Network Technology and the Institute of Information Science, Beijing Jiaotong University, Beijing, China","institution_ids":["https://openalex.org/I21193070"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I21193070"],"apc_list":null,"apc_paid":null,"fwci":2.6469,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.90225451,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6867103576660156},{"id":"https://openalex.org/keywords/anomaly","display_name":"Anomaly (physics)","score":0.6560355424880981},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.6551586985588074},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.6375173330307007},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.616062343120575},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5734260082244873},{"id":"https://openalex.org/keywords/embedding","display_name":"Embedding","score":0.46715015172958374},{"id":"https://openalex.org/keywords/encoder","display_name":"Encoder","score":0.46269163489341736},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.43574583530426025},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.4189854562282562},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09410417079925537}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6867103576660156},{"id":"https://openalex.org/C12997251","wikidata":"https://www.wikidata.org/wiki/Q567560","display_name":"Anomaly (physics)","level":2,"score":0.6560355424880981},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.6551586985588074},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.6375173330307007},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.616062343120575},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5734260082244873},{"id":"https://openalex.org/C41608201","wikidata":"https://www.wikidata.org/wiki/Q980509","display_name":"Embedding","level":2,"score":0.46715015172958374},{"id":"https://openalex.org/C118505674","wikidata":"https://www.wikidata.org/wiki/Q42586063","display_name":"Encoder","level":2,"score":0.46269163489341736},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.43574583530426025},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.4189854562282562},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09410417079925537},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3273681","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3273681","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[{"id":"https://openalex.org/G1495355918","display_name":null,"funder_award_id":"7222313","funder_id":"https://openalex.org/F4320322919","funder_display_name":"Natural Science Foundation of Beijing Municipality"},{"id":"https://openalex.org/G4994914903","display_name":null,"funder_award_id":"61976018","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5655896502","display_name":null,"funder_award_id":"62120106009","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322919","display_name":"Natural Science Foundation of Beijing Municipality","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":51,"referenced_works":["https://openalex.org/W1901129140","https://openalex.org/W1964869106","https://openalex.org/W2047643928","https://openalex.org/W2178948257","https://openalex.org/W2727078075","https://openalex.org/W2809705434","https://openalex.org/W2884585870","https://openalex.org/W2914570111","https://openalex.org/W2923486253","https://openalex.org/W2941813310","https://openalex.org/W2944303778","https://openalex.org/W2948982773","https://openalex.org/W2963045681","https://openalex.org/W2963351448","https://openalex.org/W2987228832","https://openalex.org/W3023868590","https://openalex.org/W3035240825","https://openalex.org/W3035487542","https://openalex.org/W3042782200","https://openalex.org/W3092704883","https://openalex.org/W3096831136","https://openalex.org/W3102544523","https://openalex.org/W3104156061","https://openalex.org/W3106848223","https://openalex.org/W3128445833","https://openalex.org/W3147184966","https://openalex.org/W3161141656","https://openalex.org/W3166166117","https://openalex.org/W3169651898","https://openalex.org/W3171079288","https://openalex.org/W3183588514","https://openalex.org/W3186300274","https://openalex.org/W3203828129","https://openalex.org/W3212044949","https://openalex.org/W4214694907","https://openalex.org/W4285276772","https://openalex.org/W4312298392","https://openalex.org/W4312386051","https://openalex.org/W4312772600","https://openalex.org/W4320476215","https://openalex.org/W6639824700","https://openalex.org/W6662259680","https://openalex.org/W6751917112","https://openalex.org/W6752554887","https://openalex.org/W6753412334","https://openalex.org/W6777869702","https://openalex.org/W6779937703","https://openalex.org/W6790530467","https://openalex.org/W6797053244","https://openalex.org/W6801763914","https://openalex.org/W6810267170"],"related_works":["https://openalex.org/W2806741695","https://openalex.org/W3210364259","https://openalex.org/W4290647774","https://openalex.org/W3189286258","https://openalex.org/W3207797160","https://openalex.org/W2143820878","https://openalex.org/W2912112202","https://openalex.org/W2667207928","https://openalex.org/W4300558037","https://openalex.org/W4377864969"],"abstract_inverted_index":{"Anomaly":[0],"localization":[1,34],"plays":[2],"one":[3],"of":[4,23,51,66,73,115,182],"significant":[5],"roles":[6],"in":[7,70,118,135],"practical":[8],"industrial":[9],"applications,":[10],"but":[11],"still":[12],"faces":[13],"some":[14],"unique":[15],"challenges":[16],"due":[17],"to":[18,62,84,102,120,159],"the":[19,48,81,85,98,105,109,113,123,137,140,157,167,173],"rarity":[20],"and":[21,40,75,108,143,172],"diversity":[22],"anomalies.To":[24],"address":[25],"this":[26],"issue,":[27],"we":[28,88],"propose":[29],"a":[30,71,90],"self-supervised":[31],"surface":[32,124],"defect":[33],"method":[35],"via":[36],"Joint":[37],"De-anomaly":[38],"Reconstruction":[39],"Saliency-guided":[41],"Segmentation,":[42],"also":[43],"named":[44],"by":[45,96],"JDRSS.":[46],"Considering":[47],"severe":[49],"lack":[50],"anomalous":[52,58,77,127],"images,":[53],"an":[54,126],"approach":[55],"for":[56,179],"synthesizing":[57],"samples":[59],"is":[60,133],"proposed":[61,174],"simulate":[63],"different":[64,180],"types":[65],"anomalies,":[67],"which":[68,136],"results":[69],"variety":[72],"realistic":[74],"diverse":[76],"images.":[78],"To":[79],"promote":[80],"reconstruction":[82,94,110],"quality":[83],"normal":[86],"reference,":[87],"develop":[89],"novel":[91],"auto-encoder":[92],"based":[93],"network":[95,132],"applying":[97],"bundled":[99],"de-anomaly":[100],"constraint":[101],"refrain":[103],"both":[104],"embedding":[106],"space":[107,111],"from":[112,139],"interference":[114],"abnormality.":[116],"Furthermore,":[117],"order":[119],"accurately":[121],"localize":[122],"defect,":[125],"saliency":[128],"map":[129],"guided":[130],"segmentation":[131,150],"proposed,":[134],"residuals":[138],"reconstructed":[141],"image":[142],"input":[144],"are":[145],"dexterously":[146],"injected":[147],"into":[148],"each":[149],"layer":[151],"as":[152],"spatial":[153],"attention,":[154],"thus":[155],"enhancing":[156],"sensitivity":[158],"anomalies.":[160],"We":[161],"have":[162],"conducted":[163],"extensive":[164],"experiments":[165],"on":[166],"MVTec":[168],"anomaly":[169,183],"detection":[170],"dataset":[171],"model":[175],"achieves":[176],"considerable":[177],"performance":[178],"classes":[181],"localization.":[184]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}