{"id":"https://openalex.org/W4375929185","doi":"https://doi.org/10.1109/tim.2023.3273669","title":"Demagnetization Fault Diagnosis for Magnetically Suspended PMSM Using Rotor Displacement Signals","display_name":"Demagnetization Fault Diagnosis for Magnetically Suspended PMSM Using Rotor Displacement Signals","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4375929185","doi":"https://doi.org/10.1109/tim.2023.3273669"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3273669","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3273669","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006170103","display_name":"Qing Zhong","orcid":"https://orcid.org/0000-0003-1237-6198"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qing Zhong","raw_affiliation_strings":["School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059466069","display_name":"Kun Mao","orcid":"https://orcid.org/0000-0001-5620-959X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kun Mao","raw_affiliation_strings":["School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100635678","display_name":"Kun Wang","orcid":"https://orcid.org/0000-0003-3159-3702"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kun Wang","raw_affiliation_strings":["School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067481326","display_name":"Yun Le","orcid":"https://orcid.org/0000-0002-0371-6069"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yun Le","raw_affiliation_strings":["School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087292345","display_name":"Shiqiang Zheng","orcid":"https://orcid.org/0000-0002-2842-9699"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiqiang Zheng","raw_affiliation_strings":["School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5006170103"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":2.9258,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.90937495,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10278","display_name":"Electric Motor Design and Analysis","score":0.9904999732971191,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5670679807662964},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5237460136413574},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.507630467414856},{"id":"https://openalex.org/keywords/rotor","display_name":"Rotor (electric)","score":0.4787849187850952},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.46430638432502747},{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.4134318232536316},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34346240758895874},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3380201458930969},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33609098196029663},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17954331636428833},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11563554406166077},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.08128121495246887}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5670679807662964},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5237460136413574},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.507630467414856},{"id":"https://openalex.org/C17281054","wikidata":"https://www.wikidata.org/wiki/Q193466","display_name":"Rotor (electric)","level":2,"score":0.4787849187850952},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.46430638432502747},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.4134318232536316},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34346240758895874},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3380201458930969},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33609098196029663},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17954331636428833},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11563554406166077},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.08128121495246887},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3273669","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3273669","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5870970863","display_name":null,"funder_award_id":"82027802","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8432336823","display_name":null,"funder_award_id":"51925501","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W2000982976","https://openalex.org/W2014526686","https://openalex.org/W2333775360","https://openalex.org/W2587592459","https://openalex.org/W2616602696","https://openalex.org/W2759431767","https://openalex.org/W2779615422","https://openalex.org/W2788295705","https://openalex.org/W2810057162","https://openalex.org/W2895616589","https://openalex.org/W2905966591","https://openalex.org/W2961950980","https://openalex.org/W2969449914","https://openalex.org/W2996103965","https://openalex.org/W2998318059","https://openalex.org/W3033165355","https://openalex.org/W3044003250","https://openalex.org/W3044869293","https://openalex.org/W3081100854","https://openalex.org/W3090013827","https://openalex.org/W3094354051","https://openalex.org/W3107289158","https://openalex.org/W3113242822","https://openalex.org/W3132276430","https://openalex.org/W3166010619","https://openalex.org/W3166597303","https://openalex.org/W3186324237","https://openalex.org/W3206609021","https://openalex.org/W3215688814","https://openalex.org/W4206180414","https://openalex.org/W4210552169","https://openalex.org/W4226495041","https://openalex.org/W4285213331","https://openalex.org/W4285271797","https://openalex.org/W4295789383"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2381426581","https://openalex.org/W2024370140","https://openalex.org/W2159705349","https://openalex.org/W2125678830","https://openalex.org/W601048412","https://openalex.org/W4210698599","https://openalex.org/W3166930015","https://openalex.org/W2189092311","https://openalex.org/W2350459724"],"abstract_inverted_index":{"Demagnetization":[0],"fault":[1,23,42,83,102,138],"diagnosis":[2],"is":[3,37,103,109,131,141,150,172],"a":[4,18,63,120],"significant":[5],"issue":[6],"in":[7],"magnetically":[8],"suspended":[9],"permanent":[10,19],"magnet":[11,20],"synchronous":[12],"motor":[13,26],"(PMSM).":[14],"The":[15],"occurrence":[16],"of":[17,89,122],"(PM)":[21],"demagnetization":[22,82,101,160,169],"reduces":[24],"the":[25,31,41,46,52,57,67,81,86,90,95,100,113,134,144,153,158,163],"efficiency":[27],"and":[28,44,56,73,116,137],"even":[29],"disables":[30],"whole":[32],"power":[33],"system.":[34],"Unfortunately,":[35],"it":[36],"challenging":[38],"to":[39,51,79,111,156],"extract":[40],"feature":[43,139],"evaluate":[45,157],"exact":[47,159],"severity":[48],"precisely":[49],"due":[50],"rich":[53],"environmental":[54],"noise":[55],"coupling":[58],"faults.":[59],"This":[60],"article":[61],"proposes":[62],"novel":[64],"strategy":[65],"using":[66],"improved":[68,106],"variational":[69],"mode":[70,125],"decomposition":[71],"(VMD)":[72],"energy":[74],"moment":[75],"relative":[76],"entropy":[77],"(EMRE)":[78],"achieve":[80],"diagnosis,":[84],"facilitating":[85],"timely":[87],"implementation":[88],"corresponding":[91],"control":[92],"strategies.":[93],"Firstly,":[94],"harmonic":[96],"component":[97],"caused":[98],"by":[99],"studied.":[104],"An":[105],"VMD":[107],"algorithm":[108],"proposed":[110,151],"preprocess":[112],"displacement":[114],"signals":[115],"decompose":[117],"them":[118],"into":[119],"series":[121],"mutually-exclusive":[123],"intrinsic":[124],"functions":[126],"(IMFs).":[127],"Secondly,":[128],"signal":[129],"reconstruction":[130],"performed":[132],"on":[133],"selected":[135],"IMFs,":[136],"extraction":[140],"accomplished":[142],"utilizing":[143],"Teager":[145],"enhancement":[146],"spectrum.":[147],"Thirdly,":[148],"EMRE":[149],"as":[152],"evaluation":[154],"indicator":[155],"severity.":[161],"Finally,":[162],"system":[164],"experimental":[165],"platform":[166],"with":[167],"different":[168],"degree":[170],"prototypes":[171],"constructed":[173],"for":[174],"validation.":[175]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}