{"id":"https://openalex.org/W4367721656","doi":"https://doi.org/10.1109/tim.2023.3272391","title":"PD Signal Detection Model Based on Multiscale Simulation of EM Generation and Transmission","display_name":"PD Signal Detection Model Based on Multiscale Simulation of EM Generation and Transmission","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4367721656","doi":"https://doi.org/10.1109/tim.2023.3272391"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3272391","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3272391","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083753288","display_name":"Quanfu Zheng","orcid":"https://orcid.org/0000-0002-9540-3499"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Quanfu Zheng","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-9540-3499","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073403936","display_name":"Miao Wang","orcid":"https://orcid.org/0000-0001-6540-6958"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Miao Wang","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-6540-6958","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101686016","display_name":"Lingen Luo","orcid":"https://orcid.org/0000-0002-9662-9668"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lingen Luo","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-9662-9668","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111959438","display_name":"Gehao Sheng","orcid":"https://orcid.org/0000-0002-9454-5284"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gehao Sheng","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-9454-5284","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038426348","display_name":"Xiuchen Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiuchen Jiang","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-5439-6942","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":0.2425,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.5062237,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/finite-difference-time-domain-method","display_name":"Finite-difference time-domain method","score":0.8225517272949219},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5636591911315918},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5504721403121948},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.547383725643158},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.5302635431289673},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5257932543754578},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.49927616119384766},{"id":"https://openalex.org/keywords/void","display_name":"Void (composites)","score":0.4838670492172241},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4486801028251648},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.44358229637145996},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.31036707758903503},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25610238313674927},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22815465927124023},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.22295713424682617},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15577039122581482},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12695461511611938},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10317867994308472}],"concepts":[{"id":"https://openalex.org/C184880428","wikidata":"https://www.wikidata.org/wiki/Q1417308","display_name":"Finite-difference time-domain method","level":2,"score":0.8225517272949219},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5636591911315918},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5504721403121948},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.547383725643158},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.5302635431289673},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5257932543754578},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.49927616119384766},{"id":"https://openalex.org/C2779772531","wikidata":"https://www.wikidata.org/wiki/Q19689164","display_name":"Void (composites)","level":2,"score":0.4838670492172241},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4486801028251648},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.44358229637145996},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.31036707758903503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25610238313674927},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22815465927124023},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22295713424682617},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15577039122581482},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12695461511611938},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10317867994308472},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3272391","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3272391","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.75,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1496638441","display_name":null,"funder_award_id":"5700-202118193A-0-0-00","funder_id":"https://openalex.org/F4320326707","funder_display_name":"State Grid Corporation of China"}],"funders":[{"id":"https://openalex.org/F4320326707","display_name":"State Grid Corporation of China","ror":"https://ror.org/05twwhs70"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W2011643344","https://openalex.org/W2014135986","https://openalex.org/W2072115702","https://openalex.org/W2145038522","https://openalex.org/W2160705268","https://openalex.org/W2167320299","https://openalex.org/W2513854653","https://openalex.org/W2514017607","https://openalex.org/W2553049631","https://openalex.org/W2788885327","https://openalex.org/W2899170477","https://openalex.org/W2939487178","https://openalex.org/W2981216000","https://openalex.org/W3008876591","https://openalex.org/W3019570803","https://openalex.org/W3023514908","https://openalex.org/W3037414163","https://openalex.org/W3043112380","https://openalex.org/W3084694397","https://openalex.org/W3120227567","https://openalex.org/W3137007140","https://openalex.org/W3160161643","https://openalex.org/W3166048217","https://openalex.org/W3200363842","https://openalex.org/W3202687522","https://openalex.org/W4200546072","https://openalex.org/W4237840213","https://openalex.org/W6668786537","https://openalex.org/W6681923498","https://openalex.org/W6683700159"],"related_works":["https://openalex.org/W2393409683","https://openalex.org/W2834849852","https://openalex.org/W4282008660","https://openalex.org/W2488364933","https://openalex.org/W4313520351","https://openalex.org/W2133619274","https://openalex.org/W1588534042","https://openalex.org/W2349783610","https://openalex.org/W2170346603","https://openalex.org/W2389638540"],"abstract_inverted_index":{"Nowadays,":[0],"the":[1,20,31,47,62,68,73,89,101,108,115,128,136,140,148,152,155,161,164,172,175,180,200,205,211,235],"digital":[2,21,242],"twin":[3,22,243],"method":[4,112],"has":[5],"been":[6],"gradually":[7],"applied":[8,86],"to":[9,38,45,87,147],"power":[10,181],"equipment":[11,182],"condition":[12],"monitoring.":[13],"Since":[14],"a":[15,24,41,196],"main":[16],"fundamental":[17],"part":[18],"of":[19,51,130,139,214],"is":[23,36,98,113,192],"simulation":[25,103,129,156],"process":[26,71,75,142,177,213],"with":[27,72],"better":[28],"fitting":[29],"for":[30,100,114,226,241],"real":[32],"one,":[33],"this":[34,190],"paper":[35,191],"devoted":[37],"building":[39,195],"up":[40],"PD":[42,102,149,215,227],"detection":[43,150],"model":[44,66,97],"simulate":[46,88],"generation":[48],"and":[49,171,185,204,233,237],"transmission":[50,74,118,141,176],"electromagnetic":[52],"(EM)":[53],"wave":[54],"signals":[55],"caused":[56,167,178],"by":[57,144,168,179],"PDs,":[58],"especially":[59],"those":[60],"inside":[61,76,104],"void":[63,105],"defects.":[64],"This":[65],"combines":[67],"micro":[69,206],"discharge":[70,95,122,165,207],"certain":[77],"geometry":[78,183],"structures.":[79],"Specifically,":[80],"two":[81],"commonly":[82],"used":[83,99],"methods":[84],"are":[85,158],"processes":[90],"correspondingly.":[91],"The":[92,120],"dielectric":[93],"barrier":[94],"(DBD)":[96],"defects,":[106],"while":[107],"finite-difference":[109],"time-domain":[110],"(FDTD)":[111],"EM":[116,202],"signal":[117,203,216],"process.":[119],"pulsed":[121],"current":[123,166],"can":[124,133,222],"be":[125],"obtained":[126],"during":[127],"DBD,":[131],"which":[132,209],"function":[134],"as":[135],"excitation":[137],"source":[138],"solved":[143],"FDTD.":[145],"According":[146],"model,":[151],"influences":[153],"on":[154,163,174],"results":[157],"discussed,":[159],"including":[160],"impact":[162,173],"coefficient":[169],"variation":[170],"structure":[184],"materials.":[186],"As":[187],"mentioned":[188],"above,":[189],"aimed":[193],"at":[194],"direct":[197],"relationship":[198],"between":[199],"observed":[201],"process,":[208],"reveals":[210],"physical":[212],"measurement":[217],"in":[218],"virtual":[219],"space":[220],"that":[221],"provide":[223],"more":[224],"features":[225],"pattern":[228],"recognition":[229],"or":[230],"noise":[231],"elimination,":[232],"further":[234],"mechanism":[236],"theoretical":[238],"analysis":[239],"support":[240],"application.":[244]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}