{"id":"https://openalex.org/W4366493107","doi":"https://doi.org/10.1109/tim.2023.3268658","title":"Normal Reference Attention and Defective Feature Perception Network for Surface Defect Detection","display_name":"Normal Reference Attention and Defective Feature Perception Network for Surface Defect Detection","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4366493107","doi":"https://doi.org/10.1109/tim.2023.3268658"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3268658","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3268658","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070446818","display_name":"Wei Luo","orcid":"https://orcid.org/0000-0003-3125-054X"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wei Luo","raw_affiliation_strings":["State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","School of Mechanical Science and Engineering, State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"School of Mechanical Science and Engineering, State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076153623","display_name":"Haiming Yao","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiming Yao","raw_affiliation_strings":["Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Precision Instrument, State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080558869","display_name":"Wenyong Yu","orcid":"https://orcid.org/0000-0003-4012-1264"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenyong Yu","raw_affiliation_strings":["State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","School of Mechanical Science and Engineering, State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"School of Mechanical Science and Engineering, State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5070446818"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":5.8773,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.96181454,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9812999963760376,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11605","display_name":"Visual Attention and Saliency Detection","score":0.9603999853134155,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discriminative-model","display_name":"Discriminative model","score":0.7984795570373535},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7268842458724976},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6888604164123535},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5422036051750183},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.5217543244361877},{"id":"https://openalex.org/keywords/leverage","display_name":"Leverage (statistics)","score":0.48781540989875793},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4839327931404114},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.48219814896583557},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.47083520889282227},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4704008996486664},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.43425488471984863}],"concepts":[{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.7984795570373535},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7268842458724976},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6888604164123535},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5422036051750183},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.5217543244361877},{"id":"https://openalex.org/C153083717","wikidata":"https://www.wikidata.org/wiki/Q6535263","display_name":"Leverage (statistics)","level":2,"score":0.48781540989875793},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4839327931404114},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.48219814896583557},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.47083520889282227},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4704008996486664},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.43425488471984863},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3268658","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3268658","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","score":0.6600000262260437,"display_name":"Reduced inequalities"}],"awards":[{"id":"https://openalex.org/G7189361811","display_name":null,"funder_award_id":"51775214","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":61,"referenced_works":["https://openalex.org/W1977556410","https://openalex.org/W1988299413","https://openalex.org/W2026445526","https://openalex.org/W2088252378","https://openalex.org/W2100495367","https://openalex.org/W2113101204","https://openalex.org/W2117539524","https://openalex.org/W2125027820","https://openalex.org/W2133665775","https://openalex.org/W2302255633","https://openalex.org/W2599354622","https://openalex.org/W2784032999","https://openalex.org/W2791709739","https://openalex.org/W2802735793","https://openalex.org/W2809705434","https://openalex.org/W2904559969","https://openalex.org/W2907868778","https://openalex.org/W2914570111","https://openalex.org/W2922509574","https://openalex.org/W2948982773","https://openalex.org/W2962785568","https://openalex.org/W2963045681","https://openalex.org/W2963049059","https://openalex.org/W2963351448","https://openalex.org/W2978971541","https://openalex.org/W2987228832","https://openalex.org/W2994615081","https://openalex.org/W3034314048","https://openalex.org/W3043547428","https://openalex.org/W3048633961","https://openalex.org/W3092704883","https://openalex.org/W3102544523","https://openalex.org/W3106848223","https://openalex.org/W3108566774","https://openalex.org/W3109771882","https://openalex.org/W3121084473","https://openalex.org/W3129082918","https://openalex.org/W3135016687","https://openalex.org/W3147184966","https://openalex.org/W3169077988","https://openalex.org/W3175716777","https://openalex.org/W3177716034","https://openalex.org/W3186300274","https://openalex.org/W3193992273","https://openalex.org/W4214694907","https://openalex.org/W4283380819","https://openalex.org/W4285147180","https://openalex.org/W4289656451","https://openalex.org/W4292264335","https://openalex.org/W4301273569","https://openalex.org/W4301872509","https://openalex.org/W4307474575","https://openalex.org/W4308021623","https://openalex.org/W4393805319","https://openalex.org/W6628877408","https://openalex.org/W6752554887","https://openalex.org/W6771530079","https://openalex.org/W6791586147","https://openalex.org/W6844983469","https://openalex.org/W6846138009","https://openalex.org/W6846430242"],"related_works":["https://openalex.org/W2965546495","https://openalex.org/W4389116644","https://openalex.org/W2153315159","https://openalex.org/W3103844505","https://openalex.org/W259157601","https://openalex.org/W4205463238","https://openalex.org/W2761785940","https://openalex.org/W2378211422","https://openalex.org/W2110523656","https://openalex.org/W1482209366"],"abstract_inverted_index":{"In":[0,46],"the":[1,16,39,57,90,97,123,129,134,137,169,175,182],"context":[2],"of":[3,18,44,89,136,174],"industrial":[4,187],"product":[5],"quality":[6],"control,":[7],"visual":[8],"defect":[9,22,33,99,109,143,151],"detection":[10,23,34,43,152],"plays":[11],"a":[12,20,51,106,113,140],"crucial":[13],"role,":[14],"emphasizing":[15],"importance":[17],"developing":[19],"high-performing":[21],"model.":[24],"Thus,":[25],"it":[26],"is":[27,94,119,147],"imperative":[28],"to":[29,121,127],"propose":[30],"an":[31,81],"exceptional":[32,170],"model":[35],"that":[36,84],"can":[37],"ensure":[38],"reliable":[40],"and":[41,61,105,132,153,166,172],"accurate":[42],"defects.":[45,72,138],"this":[47],"paper,":[48],"we":[49,179],"introduce":[50],"novel":[52,107,114,141],"unsupervised":[53],"reconstruction-based":[54,75],"method,":[55],"called":[56],"Normal":[58],"Reference":[59],"Attention":[60],"Defective":[62],"Feature":[63],"Perception":[64],"Network":[65],"(NDP-Net),":[66],"which":[67,93],"accurately":[68],"detects":[69],"various":[70],"textured":[71],"Unlike":[73],"most":[74],"methods,":[76],"our":[77],"NDP-Net":[78],"first":[79],"employs":[80],"encoding":[82],"module":[83,117,145],"extracts":[85],"multi-scale":[86,142],"discriminative":[87,98],"features":[88,126],"surface":[91],"textures,":[92],"augmented":[95],"with":[96],"ability":[100],"by":[101],"proposed":[102,120,176,183],"artificial":[103],"defects":[104],"pixel-level":[108],"perception":[110],"loss.":[111],"Subsequently,":[112],"reference-based":[115],"attention":[116],"(RBAM)":[118],"leverage":[122],"normal":[124],"reference":[125],"repair":[128],"defective":[130],"ones":[131],"restrain":[133],"reconstruction":[135],"Finally,":[139],"segmentation":[144],"(MSDSM)":[146],"introduced":[148],"for":[149],"precise":[150],"segmentation.":[154],"Exhaustive":[155],"experimental":[156],"results":[157],"obtained":[158],"from":[159],"benchmark":[160],"datasets,":[161],"including":[162],"public":[163],"MVTec":[164],"AD":[165],"DAGM,":[167],"showcase":[168],"performance":[171],"efficiency":[173],"method.":[177],"Furthermore,":[178],"successfully":[180],"implemented":[181],"method":[184],"in":[185,192],"practical":[186],"settings,":[188],"demonstrating":[189],"its":[190],"efficacy":[191],"real-world":[193],"applications.":[194]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}