{"id":"https://openalex.org/W4366386365","doi":"https://doi.org/10.1109/tim.2023.3268461","title":"An Open-Circuit Fault Diagnosis Algorithm Based on Signal Normalization Preprocessing for Motor Drive Inverter","display_name":"An Open-Circuit Fault Diagnosis Algorithm Based on Signal Normalization Preprocessing for Motor Drive Inverter","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4366386365","doi":"https://doi.org/10.1109/tim.2023.3268461"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3268461","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3268461","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057378243","display_name":"Xianrui Sun","orcid":"https://orcid.org/0000-0002-1531-5393"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianrui Sun","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-1531-5393","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016520319","display_name":"Chonghui Song","orcid":"https://orcid.org/0000-0002-5625-948X"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chonghui Song","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-5625-948X","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101808276","display_name":"Yingwei Zhang","orcid":"https://orcid.org/0000-0001-9736-6583"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingwei Zhang","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0001-9736-6583","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025670267","display_name":"Xin Sha","orcid":"https://orcid.org/0000-0003-2167-3127"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Sha","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0003-2167-3127","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001915389","display_name":"Naizhe Diao","orcid":"https://orcid.org/0000-0002-0171-7455"},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Naizhe Diao","raw_affiliation_strings":["College of Electrical Engineering, Yanshan University, Qinhuangdao, China","Collage of Electrical Engineering, Yanshan University, Qinhuangdao, China"],"raw_orcid":"https://orcid.org/0000-0002-0171-7455","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]},{"raw_affiliation_string":"Collage of Electrical Engineering, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.7823,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":{"value":0.93917912,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/normalization","display_name":"Normalization (sociology)","score":0.7612472772598267},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.611285924911499},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.524999737739563},{"id":"https://openalex.org/keywords/preprocessor","display_name":"Preprocessor","score":0.5175958871841431},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.494535893201828},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4943070411682129},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4914907217025757},{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.4374735355377197},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38037431240081787},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3357037901878357},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3276931047439575},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.20436251163482666},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08739572763442993}],"concepts":[{"id":"https://openalex.org/C136886441","wikidata":"https://www.wikidata.org/wiki/Q926129","display_name":"Normalization (sociology)","level":2,"score":0.7612472772598267},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.611285924911499},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.524999737739563},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.5175958871841431},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.494535893201828},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4943070411682129},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4914907217025757},{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.4374735355377197},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38037431240081787},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3357037901878357},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3276931047439575},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.20436251163482666},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08739572763442993},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C19165224","wikidata":"https://www.wikidata.org/wiki/Q23404","display_name":"Anthropology","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3268461","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3268461","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6136032839","display_name":null,"funder_award_id":"2022JH/6100100022","funder_id":"https://openalex.org/F4320323086","funder_display_name":"Natural Science Foundation of Liaoning Province"},{"id":"https://openalex.org/G977624719","display_name":null,"funder_award_id":"2022YFE0102500","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320323086","display_name":"Natural Science Foundation of Liaoning Province","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W2001262230","https://openalex.org/W2010300984","https://openalex.org/W2035777085","https://openalex.org/W2049532493","https://openalex.org/W2060912452","https://openalex.org/W2061487652","https://openalex.org/W2090184613","https://openalex.org/W2122714101","https://openalex.org/W2131789431","https://openalex.org/W2229285543","https://openalex.org/W2313595969","https://openalex.org/W2336820976","https://openalex.org/W2368523619","https://openalex.org/W2507034709","https://openalex.org/W2519348275","https://openalex.org/W2769863434","https://openalex.org/W2770358545","https://openalex.org/W2782665642","https://openalex.org/W2795053955","https://openalex.org/W2886435115","https://openalex.org/W2900854308","https://openalex.org/W2902295052","https://openalex.org/W3088843445","https://openalex.org/W3165481132","https://openalex.org/W3216194285","https://openalex.org/W4225758930","https://openalex.org/W4237923008","https://openalex.org/W4309325275"],"related_works":["https://openalex.org/W2318746575","https://openalex.org/W3164416905","https://openalex.org/W2394855236","https://openalex.org/W2385832380","https://openalex.org/W2060044332","https://openalex.org/W2380046073","https://openalex.org/W2320548181","https://openalex.org/W2146642246","https://openalex.org/W2162081524","https://openalex.org/W2149388787"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"an":[3],"open-circuit":[4],"(OC)":[5],"fault":[6,39,134,171],"diagnosis":[7,40,172],"algorithm":[8],"for":[9],"power":[10],"switch":[11],"in":[12,80,154,168],"the":[13,28,33,37,43,49,55,60,66,73,76,81,84,87,93,101,106,111,114,117,122,133,137,141,151,155,169,174],"motor":[14],"drive":[15,156],"inverter":[16],"system":[17],"is":[18,63,90,98,108,119,129],"proposed,":[19],"which":[20,52],"uses":[21],"signal":[22],"normalization":[23,70],"preprocessing":[24],"to":[25,71,131],"deal":[26],"with":[27],"current":[29],"fluctuation":[30],"caused":[31,146],"by":[32,48,65,110,121,147],"load":[34,77,96,152],"change.":[35,78],"For":[36],"proposed":[38],"algorithm,":[41],"firstly,":[42],"three-phase":[44],"currents":[45,149],"are":[46],"sampled":[47,61],"sliding":[50],"window,":[51],"can":[53,139],"improve":[54],"timeliness":[56,167],"of":[57,75,86,95,105,116,143,173],"diagnosis.":[58],"Then,":[59],"data":[62,88,107],"preprocessed":[64],"variable":[67],"modulus":[68],"length":[69],"eliminate":[72],"influence":[74],"Especially":[79],"transient":[82,148],"state,":[83],"information":[85],"feature":[89,104],"retained":[91],"and":[92,125,160,166],"impact":[94],"change":[97],"removed.":[99],"Moreover,":[100,136],"frequency":[102],"domain":[103],"extracted":[109],"DFT.":[112],"Finally,":[113],"dimension":[115],"features":[118],"reduced":[120],"PCA":[123],"method":[124,138],"its":[126,164],"contribution":[127],"graph":[128],"used":[130],"locate":[132],"IGBT.":[135],"overcome":[140],"misjudgment":[142],"IGBT":[144],"failure":[145],"when":[150],"changes":[153],"system.":[157],"The":[158],"simulation":[159],"experiment":[161],"results":[162],"show":[163],"effectiveness":[165],"OC":[170],"inverter.":[175]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":15},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":2}],"updated_date":"2026-06-18T10:00:31.954636","created_date":"2025-10-10T00:00:00"}