{"id":"https://openalex.org/W4365801657","doi":"https://doi.org/10.1109/tim.2023.3267366","title":"Two-Dimensional Low-Frequency Optical Accelerometer With High Accuracy and Low Cross-Axis Sensitivity","display_name":"Two-Dimensional Low-Frequency Optical Accelerometer With High Accuracy and Low Cross-Axis Sensitivity","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4365801657","doi":"https://doi.org/10.1109/tim.2023.3267366"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3267366","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3267366","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100750025","display_name":"Ying-Jun Lei","orcid":"https://orcid.org/0000-0001-9482-9976"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying-Jun Lei","raw_affiliation_strings":["Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-9482-9976","affiliations":[{"raw_affiliation_string":"Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086502740","display_name":"Liansheng Zhang","orcid":"https://orcid.org/0000-0002-6536-0571"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lian-Sheng Zhang","raw_affiliation_strings":["Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-6536-0571","affiliations":[{"raw_affiliation_string":"Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060100661","display_name":"Qiaosheng Pan","orcid":"https://orcid.org/0000-0002-3072-7265"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiao-Sheng Pan","raw_affiliation_strings":["Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-3072-7265","affiliations":[{"raw_affiliation_string":"Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007303636","display_name":"Penghao Hu","orcid":"https://orcid.org/0000-0001-6014-1567"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng-Hao Hu","raw_affiliation_strings":["Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-6014-1567","affiliations":[{"raw_affiliation_string":"Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047493121","display_name":"Qiangxian Huang","orcid":"https://orcid.org/0000-0003-0965-5110"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang-Xian Huang","raw_affiliation_strings":["Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-0965-5110","affiliations":[{"raw_affiliation_string":"Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100750027","display_name":"Ruijun Li","orcid":"https://orcid.org/0000-0002-3743-6567"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui-Jun Li","raw_affiliation_strings":["Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-3743-6567","affiliations":[{"raw_affiliation_string":"Anhui Province Key Laboratory of Measuring Theory and Precision Instrument,School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.859,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.72323119,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13885","display_name":"Geophysics and Sensor Technology","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/accelerometer","display_name":"Accelerometer","score":0.9488847255706787},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.8004779815673828},{"id":"https://openalex.org/keywords/pickup","display_name":"Pickup","score":0.6062344312667847},{"id":"https://openalex.org/keywords/vibration","display_name":"Vibration","score":0.4984264373779297},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.4261772334575653},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.37278079986572266},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3486800193786621},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3337879776954651},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.25634831190109253},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17399197816848755},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1636357605457306},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.06940925121307373}],"concepts":[{"id":"https://openalex.org/C89805583","wikidata":"https://www.wikidata.org/wiki/Q192940","display_name":"Accelerometer","level":2,"score":0.9488847255706787},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.8004779815673828},{"id":"https://openalex.org/C2776221269","wikidata":"https://www.wikidata.org/wiki/Q572648","display_name":"Pickup","level":3,"score":0.6062344312667847},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.4984264373779297},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4261772334575653},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.37278079986572266},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3486800193786621},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3337879776954651},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.25634831190109253},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17399197816848755},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1636357605457306},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.06940925121307373},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3267366","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3267366","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4399999976158142}],"awards":[{"id":"https://openalex.org/G7266052511","display_name":null,"funder_award_id":"52175506","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7875482899","display_name":null,"funder_award_id":"2019YFB2004900","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1981026302","https://openalex.org/W1985484642","https://openalex.org/W1986576482","https://openalex.org/W1997513826","https://openalex.org/W2007030286","https://openalex.org/W2020552491","https://openalex.org/W2022887434","https://openalex.org/W2040650521","https://openalex.org/W2044537873","https://openalex.org/W2059594496","https://openalex.org/W2065644840","https://openalex.org/W2069698225","https://openalex.org/W2082047674","https://openalex.org/W2090123502","https://openalex.org/W2101431763","https://openalex.org/W2139892018","https://openalex.org/W2144416428","https://openalex.org/W2463228956","https://openalex.org/W2507947026","https://openalex.org/W2625355471","https://openalex.org/W2740039005","https://openalex.org/W2889407118","https://openalex.org/W2891343228","https://openalex.org/W2911761162","https://openalex.org/W2912063174","https://openalex.org/W2943395536","https://openalex.org/W2961994168","https://openalex.org/W2963666586","https://openalex.org/W3005635980","https://openalex.org/W3096893615","https://openalex.org/W3127172666","https://openalex.org/W3132857786","https://openalex.org/W3142511774","https://openalex.org/W3163922009","https://openalex.org/W3200142515","https://openalex.org/W4205645209","https://openalex.org/W6742355874"],"related_works":["https://openalex.org/W2185313546","https://openalex.org/W2185850456","https://openalex.org/W2994962043","https://openalex.org/W2351571732","https://openalex.org/W1496169957","https://openalex.org/W2765080098","https://openalex.org/W2385749422","https://openalex.org/W2359831757","https://openalex.org/W2241383474","https://openalex.org/W2379703454"],"abstract_inverted_index":{"Two-dimensional":[0],"(2D)":[1],"accelerometer":[2,38,78,87,142,153,170],"is":[3,103,114,126],"a":[4,34,41,48,55],"commonly":[5],"used":[6,187],"sensor":[7,52],"for":[8,188],"detecting":[9],"horizontal":[10],"vibrations.":[11],"However,":[12],"their":[13],"low":[14,25,90,180],"frequency":[15,91],"response":[16,92],"characteristics":[17,93],"are":[18],"limited":[19],"by":[20],"high":[21,177],"cross-axis":[22,112,181],"sensitivity":[23,102,113],"and":[24,47,71,73,123,147,179,183],"resolution.":[26],"To":[27],"address":[28],"this":[29,31,164],"challenge,":[30],"study":[32],"proposes":[33],"new":[35],"2D":[36,43,50,64,168],"optical":[37,169],"based":[39,156],"on":[40,157],"symmetric":[42],"vibration":[44,190],"pickup":[45,57,65],"unit":[46,66],"high-sensitivity":[49],"angle":[51],"modified":[53],"from":[54,97],"DVD":[56],"head.":[58],"The":[59],"parameters":[60],"of":[61,76,138,140,151],"the":[62,74,77,86,95,124,136,141,148,152,166,173],"symmetrical":[63],"were":[67,143],"determined":[68],"through":[69],"modeling":[70],"simulation,":[72],"performance":[75],"was":[79,154],"tested":[80],"experimentally.":[81],"Experimental":[82],"data":[83],"show":[84],"that":[85],"has":[88,171],"good":[89],"in":[94,145,163,192],"range":[96],"1":[98],"to":[99],"10":[100],"Hz,":[101],"better":[104,127],"than":[105,116,128],"2.5":[106],"V/(m/s":[107,118],"<sup":[108,119,131],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[109,120,132],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[110,121,133],"),":[111,122],"less":[115],"0.075":[117],"resolution":[125],"0.4":[129],"mm/s":[130],".":[134],"Moreover,":[135],"sources":[137],"uncertainty":[139,150],"analyzed":[144,155],"detail":[146],"synthetic":[149],"experiments.":[158],"Compared":[159],"with":[160],"conventional":[161],"techniques":[162],"area,":[165],"proposed":[167],"featured":[172],"advantages,":[174],"such":[175],"as":[176],"accuracy":[178],"sensitivity,":[182],"can":[184],"be":[185],"widely":[186],"low-frequency":[189],"monitoring":[191],"engineering":[193],"applications.":[194]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}