{"id":"https://openalex.org/W4365801721","doi":"https://doi.org/10.1109/tim.2023.3267364","title":"Measurement of Moisture in Transformer Insulation Using the Intelligent High-Frequency Sensor System","display_name":"Measurement of Moisture in Transformer Insulation Using the Intelligent High-Frequency Sensor System","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4365801721","doi":"https://doi.org/10.1109/tim.2023.3267364"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3267364","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3267364","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004485818","display_name":"Shufali Ashraf Wani","orcid":"https://orcid.org/0000-0002-9309-5963"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Shufali Ashraf Wani","raw_affiliation_strings":["Department of Electrical Engineering, IIT Madras, Chennai, India"],"raw_orcid":"https://orcid.org/0000-0002-9309-5963","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, IIT Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Anjali Murugan","orcid":"https://orcid.org/0000-0002-6960-4799"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anjali Murugan","raw_affiliation_strings":["Department of Physics, IIT Madras, Chennai, India"],"raw_orcid":"https://orcid.org/0000-0002-6960-4799","affiliations":[{"raw_affiliation_string":"Department of Physics, IIT Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043130075","display_name":"R. Sarathi","orcid":"https://orcid.org/0000-0002-1353-9588"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"R. Sarathi","raw_affiliation_strings":["Department of Electrical Engineering, IIT Madras, Chennai, India"],"raw_orcid":"https://orcid.org/0000-0002-1353-9588","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, IIT Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009694201","display_name":"V. Subramanian","orcid":"https://orcid.org/0000-0001-5548-694X"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Venkatachalam Subramanian","raw_affiliation_strings":["Department of Physics, IIT Madras, Chennai, India"],"raw_orcid":"https://orcid.org/0000-0001-5548-694X","affiliations":[{"raw_affiliation_string":"Department of Physics, IIT Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5004485818"],"corresponding_institution_ids":["https://openalex.org/I24676775"],"apc_list":null,"apc_paid":null,"fwci":0.7665,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.70200277,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.589774489402771},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.5812733769416809},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5602258443832397},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.5585767030715942},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5376049280166626},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.48016422986984253},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4671252369880676},{"id":"https://openalex.org/keywords/moisture","display_name":"Moisture","score":0.4641697406768799},{"id":"https://openalex.org/keywords/current-transformer","display_name":"Current transformer","score":0.43538570404052734},{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.4322754442691803},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3340790271759033},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3336721956729889},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3294675946235657},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32392916083335876},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14433634281158447},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08468648791313171}],"concepts":[{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.589774489402771},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.5812733769416809},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5602258443832397},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.5585767030715942},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5376049280166626},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.48016422986984253},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4671252369880676},{"id":"https://openalex.org/C176864760","wikidata":"https://www.wikidata.org/wiki/Q217651","display_name":"Moisture","level":2,"score":0.4641697406768799},{"id":"https://openalex.org/C133770746","wikidata":"https://www.wikidata.org/wiki/Q856535","display_name":"Current transformer","level":4,"score":0.43538570404052734},{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.4322754442691803},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3340790271759033},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3336721956729889},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3294675946235657},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32392916083335876},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14433634281158447},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08468648791313171},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3267364","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3267364","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8199999928474426,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W239147966","https://openalex.org/W1990250229","https://openalex.org/W2060155842","https://openalex.org/W2067965505","https://openalex.org/W2137549868","https://openalex.org/W2138124784","https://openalex.org/W2142158067","https://openalex.org/W2162656595","https://openalex.org/W2496110330","https://openalex.org/W2516733153","https://openalex.org/W2517018913","https://openalex.org/W2778447344","https://openalex.org/W2845292846","https://openalex.org/W2946758030","https://openalex.org/W2978818448","https://openalex.org/W3000681817","https://openalex.org/W3047535991","https://openalex.org/W3092488955","https://openalex.org/W3173228300","https://openalex.org/W3200047621","https://openalex.org/W3201023846","https://openalex.org/W4211049880","https://openalex.org/W4211202386","https://openalex.org/W4225836271"],"related_works":["https://openalex.org/W2220451197","https://openalex.org/W2370122455","https://openalex.org/W3049121420","https://openalex.org/W1600397729","https://openalex.org/W2326770010","https://openalex.org/W2360832559","https://openalex.org/W4284698423","https://openalex.org/W1989588780","https://openalex.org/W2386418312","https://openalex.org/W3128781877"],"abstract_inverted_index":{"High-frequency":[0],"sensor-based":[1],"system":[2,21],"is":[3,34,70,91,122,147],"proposed":[4,20],"for":[5,150],"evaluating":[6],"the":[7,10,14,49,55,65,82,85,88,109,136],"degradation":[8],"of":[9,16,98,111,118,138],"transformer":[11,151],"insulation":[12],"through":[13],"measurement":[15,63,110,140],"moisture":[17,112],"concentration.":[18],"The":[19,96],"employs":[22],"an":[23,99],"intelligent":[24,100],"open-ended":[25],"coaxial":[26],"probe":[27,89],"microwave":[28],"technique.":[29,67],"An":[30],"optimized":[31],"ANN":[32,68],"model":[33,69],"designed":[35],"by":[36,84],"selecting":[37],"appropriate":[38],"features":[39],"to":[40,60,81,93,104,124,130,135],"obtain":[41],"accurate":[42],"dielectric":[43],"characterisation.":[44],"Redundant":[45],"feature":[46],"elimination":[47],"reduces":[48],"computational":[50],"burden":[51],"and":[52,127,141],"also":[53],"bypasses":[54],"repeated":[56],"calibration":[57],"refresh":[58],"required":[59],"complete":[61],"RF":[62],"in":[64,72,108],"conventional":[66],"trained":[71],"such":[73],"a":[74,105,116],"way":[75],"that":[76],"measured":[77],"impedance":[78],"mismatch":[79],"due":[80],"termination":[83],"sample":[86],"at":[87],"end":[90],"related":[92],"its":[94],"permittivity.":[95],"introduction":[97],"standardization":[101],"procedure":[102],"led":[103],"low":[106,142],"error":[107],"(<":[113],"\u00b13%)":[114],"with":[115],"sensitivity":[117],"0.027/ppm.":[119],"This":[120],"method":[121],"found":[123],"be":[125],"simple":[126],"faster":[128],"compared":[129],"other":[131],"existing":[132],"techniques.":[133],"Due":[134],"advantage":[137],"high-speed":[139],"error,":[143],"this":[144],"sensing":[145],"technique":[146],"very":[148],"suitable":[149],"condition":[152],"monitoring.":[153]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}