{"id":"https://openalex.org/W4362501012","doi":"https://doi.org/10.1109/tim.2023.3264021","title":"Broadband Calculable Coaxial Resistors","display_name":"Broadband Calculable Coaxial Resistors","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4362501012","doi":"https://doi.org/10.1109/tim.2023.3264021"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3264021","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2023.3264021","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/4407674/10091123.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/19/4407674/10091123.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076800343","display_name":"Marco Agustoni","orcid":"https://orcid.org/0000-0003-4060-0134"},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Marco Agustoni","raw_affiliation_strings":["Federal Institute of Metrology METAS, Bern-Wabern, Switzerland"],"raw_orcid":"https://orcid.org/0000-0003-4060-0134","affiliations":[{"raw_affiliation_string":"Federal Institute of Metrology METAS, Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040117163","display_name":"Sophie De Pr\u00e9ville","orcid":"https://orcid.org/0000-0001-8122-7765"},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Sophie De Pr\u00e9ville","raw_affiliation_strings":["Federal Institute of Metrology METAS, Bern-Wabern, Switzerland"],"raw_orcid":"https://orcid.org/0000-0001-8122-7765","affiliations":[{"raw_affiliation_string":"Federal Institute of Metrology METAS, Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054781013","display_name":"F. Overney","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Fr\u00e9d\u00e9ric Overney","raw_affiliation_strings":["Federal Institute of Metrology METAS, Bern-Wabern, Switzerland"],"raw_orcid":"https://orcid.org/0000-0002-6845-3132","affiliations":[{"raw_affiliation_string":"Federal Institute of Metrology METAS, Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210103407"],"apc_list":null,"apc_paid":null,"fwci":0.3637,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.57025626,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.933372974395752},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.7710697054862976},{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.6528418660163879},{"id":"https://openalex.org/keywords/broadband","display_name":"Broadband","score":0.6110087037086487},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6007086038589478},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5161091089248657},{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.501042366027832},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46504369378089905},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.44968053698539734},{"id":"https://openalex.org/keywords/input-impedance","display_name":"Input impedance","score":0.4446382522583008},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.441751092672348},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.4363410472869873},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.40638014674186707},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.284053236246109},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.18389353156089783},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07276371121406555}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.933372974395752},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.7710697054862976},{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.6528418660163879},{"id":"https://openalex.org/C509933004","wikidata":"https://www.wikidata.org/wiki/Q194163","display_name":"Broadband","level":2,"score":0.6110087037086487},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6007086038589478},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5161091089248657},{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.501042366027832},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46504369378089905},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.44968053698539734},{"id":"https://openalex.org/C26262908","wikidata":"https://www.wikidata.org/wiki/Q1307489","display_name":"Input impedance","level":3,"score":0.4446382522583008},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.441751092672348},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4363410472869873},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.40638014674186707},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.284053236246109},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18389353156089783},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07276371121406555},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3264021","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2023.3264021","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/4407674/10091123.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tim.2023.3264021","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2023.3264021","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/4407674/10091123.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6299999952316284}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4362501012.pdf","grobid_xml":"https://content.openalex.org/works/W4362501012.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W1502785712","https://openalex.org/W1963648875","https://openalex.org/W1966644166","https://openalex.org/W2010378848","https://openalex.org/W2034640938","https://openalex.org/W2040053173","https://openalex.org/W2056436836","https://openalex.org/W2073155184","https://openalex.org/W2102380647","https://openalex.org/W2108000622","https://openalex.org/W2111621226","https://openalex.org/W2122415381","https://openalex.org/W2141707986","https://openalex.org/W2314723747","https://openalex.org/W2329346089","https://openalex.org/W2333500657","https://openalex.org/W2516207202","https://openalex.org/W2516758608","https://openalex.org/W2595330208","https://openalex.org/W2810958412","https://openalex.org/W2898819714","https://openalex.org/W2899387822","https://openalex.org/W2978478967","https://openalex.org/W3095853697","https://openalex.org/W4248288458"],"related_works":["https://openalex.org/W2378709054","https://openalex.org/W4380301954","https://openalex.org/W2803090313","https://openalex.org/W1482465488","https://openalex.org/W2052375654","https://openalex.org/W2376767034","https://openalex.org/W4205643331","https://openalex.org/W2090239554","https://openalex.org/W2058115773","https://openalex.org/W2789727165"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,10,15,85,92],"method":[4],"to":[5,21,117],"model":[6],"the":[7,47,52,56,66,70,75,79,102,111,114,122,129],"impedance":[8,100,126],"of":[9,35,49,113,124],"Haddad":[11],"type":[12],"resistor":[13,33],"over":[14,101],"frequency":[16,105],"interval":[17],"ranging":[18],"from":[19],"10":[20],"200":[22],"MHz,":[23],"hereafter":[24],"defined":[25],"as":[26],"LF-RF":[27,130],"range.":[28,106,131],"To":[29],"this":[30],"end,":[31],"novel":[32],"standards,":[34],"1":[36],"k\u03a9":[37],"and":[38,44,74,84,98,120],"100":[39],"\u03a9,":[40],"have":[41],"been":[42],"designed":[43],"manufactured":[45],"with":[46],"aim":[48],"sharply":[50],"identifying":[51],"nodes":[53],"that":[54],"define":[55],"impedance.":[57],"Resistor":[58],"modelling":[59],"is":[60],"divided":[61],"into":[62],"two":[63],"main":[64],"parts:":[65],"first":[67],"one,":[68],"describing":[69,78],"central":[71],"coaxial":[72],"core":[73],"second":[76],"part,":[77],"connectors":[80],"through":[81],"physical":[82],"simulations":[83],"subsequent":[86],"analytical":[87],"approach.":[88],"The":[89],"results":[90],"show":[91],"remarkable":[93],"good":[94],"agreement":[95],"between":[96],"measured":[97],"modelled":[99],"whole":[103],"considered":[104],"Uncertainty":[107],"values":[108],"allow":[109],"for":[110,121],"traceability":[112],"resistors":[115],"up":[116],"high":[118],"frequencies":[119],"calibration":[123],"commercial":[125],"analyzers":[127],"within":[128]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}