{"id":"https://openalex.org/W4323022581","doi":"https://doi.org/10.1109/tim.2023.3251393","title":"Train Wheel Magnetic Flux Leakage Testing Method Based on Local Magnetization Enhancement","display_name":"Train Wheel Magnetic Flux Leakage Testing Method Based on Local Magnetization Enhancement","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4323022581","doi":"https://doi.org/10.1109/tim.2023.3251393"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3251393","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tim.2023.3251393","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102861797","display_name":"Erlong Li","orcid":"https://orcid.org/0000-0001-7480-0308"},"institutions":[{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Erlong Li","raw_affiliation_strings":["School of Mechanical Engineering, Sichun University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-7480-0308","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Sichun University, Chengdu, China","institution_ids":["https://openalex.org/I4210125143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050657067","display_name":"Yiming Chen","orcid":"https://orcid.org/0000-0002-3008-2313"},"institutions":[{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiming Chen","raw_affiliation_strings":["School of Mechanical Engineering, Sichun University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-3008-2313","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Sichun University, Chengdu, China","institution_ids":["https://openalex.org/I4210125143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083729314","display_name":"Zilan Yuan","orcid":"https://orcid.org/0000-0002-6256-6806"},"institutions":[{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zilan Yuan","raw_affiliation_strings":["School of Mechanical Engineering, Sichun University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-6256-6806","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Sichun University, Chengdu, China","institution_ids":["https://openalex.org/I4210125143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100440072","display_name":"Jie Wang","orcid":"https://orcid.org/0000-0002-3144-6510"},"institutions":[{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Wang","raw_affiliation_strings":["School of Mechanical Engineering, Sichun University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-3144-6510","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Sichun University, Chengdu, China","institution_ids":["https://openalex.org/I4210125143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210125143"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.676,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.60314873,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetic-flux-leakage","display_name":"Magnetic flux leakage","score":0.9538731575012207},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.8017106056213379},{"id":"https://openalex.org/keywords/magnetization","display_name":"Magnetization","score":0.729981541633606},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5966224670410156},{"id":"https://openalex.org/keywords/magnetic-flux","display_name":"Magnetic flux","score":0.5875964760780334},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.5344820022583008},{"id":"https://openalex.org/keywords/magnetic-circuit","display_name":"Magnetic circuit","score":0.5284307599067688},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.513424277305603},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.44594916701316833},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.44421297311782837},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4293630123138428},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.4251341223716736},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.3958599269390106},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35100167989730835},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.3169536888599396},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12968328595161438}],"concepts":[{"id":"https://openalex.org/C20892748","wikidata":"https://www.wikidata.org/wiki/Q4390394","display_name":"Magnetic flux leakage","level":3,"score":0.9538731575012207},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.8017106056213379},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.729981541633606},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5966224670410156},{"id":"https://openalex.org/C157479481","wikidata":"https://www.wikidata.org/wiki/Q177831","display_name":"Magnetic flux","level":3,"score":0.5875964760780334},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.5344820022583008},{"id":"https://openalex.org/C24214142","wikidata":"https://www.wikidata.org/wiki/Q118801","display_name":"Magnetic circuit","level":3,"score":0.5284307599067688},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.513424277305603},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.44594916701316833},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.44421297311782837},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4293630123138428},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.4251341223716736},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.3958599269390106},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35100167989730835},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.3169536888599396},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12968328595161438},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3251393","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tim.2023.3251393","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.47999998927116394,"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities"}],"awards":[{"id":"https://openalex.org/G6231764794","display_name":null,"funder_award_id":"2022CDZG-18","funder_id":"https://openalex.org/F4320322990","funder_display_name":"Sichuan University"},{"id":"https://openalex.org/G8911959610","display_name":null,"funder_award_id":"51907131","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322990","display_name":"Sichuan University","ror":"https://ror.org/011ashp19"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W921668461","https://openalex.org/W1980409962","https://openalex.org/W1988380612","https://openalex.org/W2035742510","https://openalex.org/W2049384457","https://openalex.org/W2064742232","https://openalex.org/W2072435854","https://openalex.org/W2083545965","https://openalex.org/W2170891879","https://openalex.org/W2171414970","https://openalex.org/W2188408465","https://openalex.org/W2321689058","https://openalex.org/W2744245146","https://openalex.org/W2782550915","https://openalex.org/W2789323698","https://openalex.org/W2791894910","https://openalex.org/W2803086989","https://openalex.org/W2808808447","https://openalex.org/W2809093163","https://openalex.org/W2941649051","https://openalex.org/W2953528808","https://openalex.org/W2991376772","https://openalex.org/W3007378949","https://openalex.org/W3031442482","https://openalex.org/W3032973029","https://openalex.org/W3034496636","https://openalex.org/W3117126233"],"related_works":["https://openalex.org/W2902977491","https://openalex.org/W2101676717","https://openalex.org/W4241743597","https://openalex.org/W2165594630","https://openalex.org/W2577089618","https://openalex.org/W3005508687","https://openalex.org/W4383333701","https://openalex.org/W2227486935","https://openalex.org/W2502560395","https://openalex.org/W2012944085"],"abstract_inverted_index":{"Nondestructive":[0],"testing":[1],"(NDT)":[2],"of":[3,127],"train":[4,38,111,130],"wheels":[5],"fatigue":[6,17,39,70],"cracks":[7,18],"is":[8,34,49,100,106],"a":[9,60,91,110],"critical":[10],"technology":[11],"to":[12,23,36,76],"ensure":[13],"railway":[14],"safety.":[15],"Early":[16],"are":[19,74],"small":[20,69],"and":[21,55,72,102],"difficult":[22,75],"detect.":[24],"In":[25],"this":[26,119],"article,":[27],"the":[28,46,79,85,125],"magnetic":[29,52,63],"flux":[30],"leakage":[31,62],"(MFL)":[32],"method":[33,94,120],"proposed":[35,101],"detect":[37,77],"cracks.":[40],"The":[41],"unsaturated":[42],"magnetization":[43,86,98],"state":[44,87],"near":[45,88],"defect":[47,89],"area":[48],"revealed":[50],"through":[51],"circuit":[53],"analysis":[54],"finite":[56],"element":[57],"methods.":[58],"As":[59],"result,":[61],"fields":[64],"will":[65],"decay":[66],"sharply":[67],"for":[68],"cracks,":[71],"they":[73],"by":[78,109],"traditional":[80],"MFL":[81,93],"method.":[82],"To":[83],"improve":[84],"areas,":[90],"novel":[92],"based":[95],"on":[96],"local":[97],"enhancement":[99],"developed.":[103],"Experimental":[104],"verification":[105],"also":[107],"conducted":[108],"wheel":[112],"NDT":[113],"device.":[114],"Testing":[115],"results":[116],"show":[117],"that":[118],"achieves":[121],"excellent":[122],"performance":[123],"in":[124,129],"detection":[126],"defects":[128],"wheels.":[131]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2023,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}
