{"id":"https://openalex.org/W4226061774","doi":"https://doi.org/10.1109/tim.2023.3244255","title":"A Novel Deep Parallel Time-Series Relation Network for Fault Diagnosis","display_name":"A Novel Deep Parallel Time-Series Relation Network for Fault Diagnosis","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4226061774","doi":"https://doi.org/10.1109/tim.2023.3244255"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3244255","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3244255","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005471572","display_name":"Chun Yang","orcid":"https://orcid.org/0000-0003-3549-9318"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chun Yang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-3549-9318","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082534075","display_name":"Jiyang Zhang","orcid":"https://orcid.org/0000-0003-3563-3708"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiyang Zhang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-3563-3708","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101781929","display_name":"Yang Chang","orcid":"https://orcid.org/0000-0002-8482-9208"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yang Chang","raw_affiliation_strings":["Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0002-8482-9208","affiliations":[{"raw_affiliation_string":"Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027642367","display_name":"Jianxiao Zou","orcid":"https://orcid.org/0000-0002-8676-8322"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianxiao Zou","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0002-8676-8322","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003564537","display_name":"Zhiliang Liu","orcid":"https://orcid.org/0000-0002-4133-8230"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiliang Liu","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-4133-8230","affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019841300","display_name":"Shicai Fan","orcid":"https://orcid.org/0000-0003-2548-3689"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shicai Fan","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0003-2548-3689","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1104,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.80186961,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12205","display_name":"Time Series Analysis and Forecasting","score":0.9854999780654907,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9710999727249146,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interpretability","display_name":"Interpretability","score":0.9120023250579834},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7301156520843506},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6501438617706299},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5644972920417786},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.5443347096443176},{"id":"https://openalex.org/keywords/relation","display_name":"Relation (database)","score":0.5338512659072876},{"id":"https://openalex.org/keywords/time-series","display_name":"Time series","score":0.5170627236366272},{"id":"https://openalex.org/keywords/embedding","display_name":"Embedding","score":0.516600489616394},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5073415637016296},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4606807827949524},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4340088963508606},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.43320903182029724}],"concepts":[{"id":"https://openalex.org/C2781067378","wikidata":"https://www.wikidata.org/wiki/Q17027399","display_name":"Interpretability","level":2,"score":0.9120023250579834},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7301156520843506},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6501438617706299},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5644972920417786},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5443347096443176},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.5338512659072876},{"id":"https://openalex.org/C151406439","wikidata":"https://www.wikidata.org/wiki/Q186588","display_name":"Time series","level":2,"score":0.5170627236366272},{"id":"https://openalex.org/C41608201","wikidata":"https://www.wikidata.org/wiki/Q980509","display_name":"Embedding","level":2,"score":0.516600489616394},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5073415637016296},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4606807827949524},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4340088963508606},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.43320903182029724},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3244255","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3244255","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/1","display_name":"No poverty","score":0.41999998688697815}],"awards":[{"id":"https://openalex.org/G4588399375","display_name":"\u57fa\u4e8e\u6269\u5c55DNA\u7532\u57fa\u5316\u6570\u636e\u7684\u764c\u75c7\u6807\u5fd7\u7269\u6316\u6398\u7814\u7a76","funder_award_id":"61872063","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1999427165","https://openalex.org/W2004186751","https://openalex.org/W2078365611","https://openalex.org/W2132915908","https://openalex.org/W2770437138","https://openalex.org/W2898760173","https://openalex.org/W2922660557","https://openalex.org/W2946493557","https://openalex.org/W2964336507","https://openalex.org/W2966507006","https://openalex.org/W2970787446","https://openalex.org/W2983948788","https://openalex.org/W2995524811","https://openalex.org/W2999414679","https://openalex.org/W3015704045","https://openalex.org/W3033236487","https://openalex.org/W3089140114","https://openalex.org/W3090238656","https://openalex.org/W3109842401","https://openalex.org/W3111635293","https://openalex.org/W3120487494","https://openalex.org/W3130785848","https://openalex.org/W3134164546","https://openalex.org/W3142292878","https://openalex.org/W3145770415","https://openalex.org/W3154687200","https://openalex.org/W3157506437","https://openalex.org/W3162090017","https://openalex.org/W3173539083","https://openalex.org/W3176041833","https://openalex.org/W3215886817","https://openalex.org/W4210741351","https://openalex.org/W4220669499","https://openalex.org/W4293583366","https://openalex.org/W4385245566","https://openalex.org/W6795140394","https://openalex.org/W6795146805","https://openalex.org/W6796417832"],"related_works":["https://openalex.org/W2905433371","https://openalex.org/W4390569940","https://openalex.org/W2888392564","https://openalex.org/W4361193272","https://openalex.org/W4310278675","https://openalex.org/W4388422664","https://openalex.org/W2806259446","https://openalex.org/W2963326959","https://openalex.org/W4247136043","https://openalex.org/W4312407344"],"abstract_inverted_index":{"Currently,":[0],"deep":[1,23,48,141],"learning-based":[2,142],"methods":[3],"are":[4,60],"widely":[5],"used":[6],"in":[7,56,92,135],"the":[8,19,40,47,65,87,98,105,145,162,168],"fault":[9,25,43,90,120],"diagnosis":[10,26,44,91,121,154],"of":[11,21,64,81,167],"time-series":[12,50,83],"data":[13],"for":[14,119],"their":[15,31],"high":[16],"precision.":[17],"However,":[18],"application":[20],"traditional":[22,140],"learning":[24],"models":[27],"is":[28,54],"limited":[29],"by":[30,103],"calculational":[32],"efficiency":[33,100],"and":[34,96,122,165],"poor":[35],"interpretation":[36],"ability.":[37],"To":[38],"address":[39],"problems,":[41],"a":[42,82,93],"model":[45,147],"named":[46],"parallel":[49,94],"relation":[51],"network":[52],"(DPTRN)":[53],"proposed":[55,69,129,169],"this":[57],"article.":[58],"There":[59],"three":[61],"main":[62],"advantages":[63],"DPTRN.":[66],"First,":[67],"our":[68,109,128],"time":[70,79],"relationship":[71],"unit":[72,114],"can":[73,115,123],"perform":[74],"feature":[75,136],"extraction":[76],"on":[77,148],"each":[78],"node":[80],"sample":[84],"simultaneously;":[85],"therefore,":[86],"DPTRN":[88,130,146,170],"performs":[89],"way":[95],"improves":[97],"computing":[99],"significantly.":[101],"Second,":[102],"improving":[104],"absolute":[106],"position":[107,112],"embedding,":[108],"novel":[110],"decoupling":[111],"embedding":[113],"be":[116],"directly":[117],"applied":[118],"learn":[124],"contextual":[125],"information.":[126],"Third,":[127],"has":[131],"an":[132],"obvious":[133],"advantage":[134],"interpretability":[137,166],"compared":[138],"with":[139,156],"models.":[143],"Applying":[144],"four":[149],"datasets,":[150],"we":[151],"achieved":[152],"higher":[153],"performance":[155],"much":[157],"lower":[158],"cost,":[159],"which":[160],"indicates":[161],"effectiveness,":[163],"efficiency,":[164],"model.":[171]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}