{"id":"https://openalex.org/W4319069099","doi":"https://doi.org/10.1109/tim.2023.3242017","title":"Decoupling Conductivity and Permeability Using Sweep-Frequency Eddy Current Method","display_name":"Decoupling Conductivity and Permeability Using Sweep-Frequency Eddy Current Method","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4319069099","doi":"https://doi.org/10.1109/tim.2023.3242017"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3242017","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3242017","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101992450","display_name":"Pu Huang","orcid":"https://orcid.org/0000-0002-7057-5462"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pu Huang","raw_affiliation_strings":["School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7057-5462","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101800444","display_name":"Jingyu Zhao","orcid":"https://orcid.org/0000-0002-0386-2736"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingyu Zhao","raw_affiliation_strings":["Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0386-2736","affiliations":[{"raw_affiliation_string":"Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050586872","display_name":"Zhiying Li","orcid":"https://orcid.org/0000-0003-3022-4956"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiying Li","raw_affiliation_strings":["School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3022-4956","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072868904","display_name":"Hang Pu","orcid":"https://orcid.org/0000-0002-6087-8523"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hang Pu","raw_affiliation_strings":["School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-6087-8523","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009659263","display_name":"Yiqing Ding","orcid":"https://orcid.org/0000-0003-1048-8487"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiqing Ding","raw_affiliation_strings":["SHENYUAN Honors College, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-1048-8487","affiliations":[{"raw_affiliation_string":"SHENYUAN Honors College, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043551995","display_name":"Lijun Xu","orcid":"https://orcid.org/0000-0003-0488-9604"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun Xu","raw_affiliation_strings":["School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-0488-9604","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058642753","display_name":"Yuedong Xie","orcid":"https://orcid.org/0000-0001-9535-0764"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuedong Xie","raw_affiliation_strings":["School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-9535-0764","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.05,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.85011236,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.8337839841842651},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.6533640623092651},{"id":"https://openalex.org/keywords/conductivity","display_name":"Conductivity","score":0.6167974472045898},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.551987886428833},{"id":"https://openalex.org/keywords/permeability","display_name":"Permeability (electromagnetism)","score":0.5513132810592651},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5296040773391724},{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.5199355483055115},{"id":"https://openalex.org/keywords/decoupling","display_name":"Decoupling (probability)","score":0.427813857793808},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.41459816694259644},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.38570427894592285},{"id":"https://openalex.org/keywords/nuclear-magnetic-resonance","display_name":"Nuclear magnetic resonance","score":0.35053905844688416},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3017212152481079},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2986229956150055},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25430911779403687},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20566269755363464},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.17506375908851624},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.11139070987701416}],"concepts":[{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.8337839841842651},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.6533640623092651},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.6167974472045898},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.551987886428833},{"id":"https://openalex.org/C120882062","wikidata":"https://www.wikidata.org/wiki/Q28352","display_name":"Permeability (electromagnetism)","level":3,"score":0.5513132810592651},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5296040773391724},{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.5199355483055115},{"id":"https://openalex.org/C205606062","wikidata":"https://www.wikidata.org/wiki/Q5249645","display_name":"Decoupling (probability)","level":2,"score":0.427813857793808},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.41459816694259644},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.38570427894592285},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.35053905844688416},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3017212152481079},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2986229956150055},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25430911779403687},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20566269755363464},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17506375908851624},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.11139070987701416},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C41625074","wikidata":"https://www.wikidata.org/wiki/Q176088","display_name":"Membrane","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3242017","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3242017","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6000000238418579,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G6313276247","display_name":null,"funder_award_id":"61901022","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G632183737","display_name":null,"funder_award_id":"62201022","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8140746502","display_name":null,"funder_award_id":"KG12-1124-01","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W425268100","https://openalex.org/W561046860","https://openalex.org/W1145079248","https://openalex.org/W1966598840","https://openalex.org/W1970556747","https://openalex.org/W1992174151","https://openalex.org/W1992910465","https://openalex.org/W2100788482","https://openalex.org/W2106735597","https://openalex.org/W2189987460","https://openalex.org/W2318413470","https://openalex.org/W2889917954","https://openalex.org/W2903808615","https://openalex.org/W2903936619","https://openalex.org/W2904905938","https://openalex.org/W2981824710","https://openalex.org/W2983477691","https://openalex.org/W3000165570","https://openalex.org/W3000915711","https://openalex.org/W3029003893","https://openalex.org/W3038471904","https://openalex.org/W3081814639","https://openalex.org/W3092086034","https://openalex.org/W3119941294","https://openalex.org/W3137711935","https://openalex.org/W3195684922","https://openalex.org/W4281673312","https://openalex.org/W4285131199","https://openalex.org/W4285227495"],"related_works":["https://openalex.org/W2152950565","https://openalex.org/W1617565119","https://openalex.org/W160381218","https://openalex.org/W2512958550","https://openalex.org/W2099777870","https://openalex.org/W2329266651","https://openalex.org/W3103825105","https://openalex.org/W2004102934","https://openalex.org/W4366455350","https://openalex.org/W4321844193"],"abstract_inverted_index":{"Electromagnetic":[0],"coupling":[1],"and":[2,25,42,81,90,111,128,150,154,157],"liftoff":[3,167],"variation":[4,164],"are":[5,133,152],"obstacles":[6],"in":[7],"the":[8,53,70,77,85,100,120,139,146,158],"eddy":[9,19,35],"current":[10,20,36],"method.":[11,141],"In":[12,67,96],"this":[13],"article,":[14],"we":[15],"proposed":[16,140],"a":[17,104,162],"sweep-frequency":[18],"method":[21,130],"to":[22,30,62,76,98,117,137],"achieve":[23],"conductivity":[24,89,149],"permeability":[26,63,80,91,151],"simultaneous":[27],"measurements":[28],"immune":[29],"liftoff.":[31,126],"The":[32,142],"relationship":[33],"between":[34],"detection":[37],"signals":[38],"of":[39,45,56,79,102,148,166],"different":[40],"frequencies":[41],"electromagnetic":[43],"parameters":[44],"magnetic":[46],"materials":[47],"has":[48],"been":[49],"found,":[50],"that":[51,145],"is,":[52],"real":[54],"part":[55],"mutual":[57,121],"inductance":[58,122],"is":[59,74,115],"mainly":[60],"related":[61],"at":[64],"low":[65],"frequencies.":[66],"high":[68],"frequency,":[69],"zero":[71],"crossover":[72],"frequency":[73],"proportional":[75],"ratio":[78],"conductivity.":[82],"By":[83],"combining":[84],"analysis":[86],"mentioned":[87],"above,":[88],"can":[92,168],"be":[93,169],"estimated":[94],"simultaneously.":[95],"order":[97],"eliminate":[99],"interference":[101],"liftoff,":[103],"sensor":[105],"structure":[106],"with":[107],"one":[108],"excitation":[109],"coil":[110],"two":[112],"receiving":[113],"coils":[114],"designed":[116],"compensate":[118],"for":[119],"changes":[123],"caused":[124,160],"by":[125,161],"Experiments":[127],"finite-element":[129],"(FEM)":[131],"simulations":[132],"also":[134],"carried":[135],"out":[136],"verify":[138],"results":[143],"show":[144],"errors":[147],"1.3%":[153],"3.9%,":[155],"respectively,":[156],"error":[159],"reasonable":[163],"range":[165],"significantly":[170],"reduced.":[171]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":6}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}