{"id":"https://openalex.org/W4319999802","doi":"https://doi.org/10.1109/tim.2023.3240199","title":"Micro-Newton Thrust Stand Calibration Using Electrostatic Lantern Rings","display_name":"Micro-Newton Thrust Stand Calibration Using Electrostatic Lantern Rings","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4319999802","doi":"https://doi.org/10.1109/tim.2023.3240199"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2023.3240199","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3240199","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020002679","display_name":"Jianchao Mu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jianchao Mu","raw_affiliation_strings":["School of Physical Sciences and the Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0093-7675","affiliations":[{"raw_affiliation_string":"School of Physical Sciences and the Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081356483","display_name":"Linxiao Cong","orcid":"https://orcid.org/0000-0001-9558-0180"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linxiao Cong","raw_affiliation_strings":["School of Physical Sciences and the Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-9558-0180","affiliations":[{"raw_affiliation_string":"School of Physical Sciences and the Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069730876","display_name":"Qi-Wei Hu","orcid":"https://orcid.org/0000-0001-5319-2219"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiwei Hu","raw_affiliation_strings":["School of Physical Sciences and the Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-5319-2219","affiliations":[{"raw_affiliation_string":"School of Physical Sciences and the Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110198602","display_name":"Cong\u2010Feng Qiao","orcid":"https://orcid.org/0000-0002-9174-7307"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Congfeng Qiao","raw_affiliation_strings":["School of Physical Sciences and the Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-9174-7307","affiliations":[{"raw_affiliation_string":"School of Physical Sciences and the Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5020002679"],"corresponding_institution_ids":["https://openalex.org/I4210165038"],"apc_list":null,"apc_paid":null,"fwci":0.6388,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.66341475,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12776","display_name":"Electrohydrodynamics and Fluid Dynamics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lantern","display_name":"Lantern","score":0.6825048923492432},{"id":"https://openalex.org/keywords/electrostatics","display_name":"Electrostatics","score":0.6622166633605957},{"id":"https://openalex.org/keywords/electrostatic-force-microscope","display_name":"Electrostatic force microscope","score":0.5907658338546753},{"id":"https://openalex.org/keywords/deflection","display_name":"Deflection (physics)","score":0.5904005765914917},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.5747360587120056},{"id":"https://openalex.org/keywords/thrust","display_name":"Thrust","score":0.5405977368354797},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.5282914638519287},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4767264425754547},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46814873814582825},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4211265444755554},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3952007591724396},{"id":"https://openalex.org/keywords/classical-mechanics","display_name":"Classical mechanics","score":0.3252601623535156},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2549905776977539},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2219763994216919},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21304363012313843},{"id":"https://openalex.org/keywords/ring","display_name":"Ring (chemistry)","score":0.15044227242469788},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.11022117733955383},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.09515205025672913},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.08393779397010803}],"concepts":[{"id":"https://openalex.org/C2777414711","wikidata":"https://www.wikidata.org/wiki/Q862454","display_name":"Lantern","level":3,"score":0.6825048923492432},{"id":"https://openalex.org/C117626034","wikidata":"https://www.wikidata.org/wiki/Q26336","display_name":"Electrostatics","level":2,"score":0.6622166633605957},{"id":"https://openalex.org/C147230242","wikidata":"https://www.wikidata.org/wiki/Q5358564","display_name":"Electrostatic force microscope","level":3,"score":0.5907658338546753},{"id":"https://openalex.org/C2781355719","wikidata":"https://www.wikidata.org/wiki/Q2080698","display_name":"Deflection (physics)","level":2,"score":0.5904005765914917},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.5747360587120056},{"id":"https://openalex.org/C79420006","wikidata":"https://www.wikidata.org/wiki/Q533668","display_name":"Thrust","level":2,"score":0.5405977368354797},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.5282914638519287},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4767264425754547},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46814873814582825},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4211265444755554},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3952007591724396},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.3252601623535156},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2549905776977539},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2219763994216919},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21304363012313843},{"id":"https://openalex.org/C2780378348","wikidata":"https://www.wikidata.org/wiki/Q25351438","display_name":"Ring (chemistry)","level":2,"score":0.15044227242469788},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.11022117733955383},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.09515205025672913},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.08393779397010803},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2023.3240199","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2023.3240199","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5932956024","display_name":null,"funder_award_id":"E0EK0201","funder_id":"https://openalex.org/F4320321133","funder_display_name":"Chinese Academy of Sciences"}],"funders":[{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1961975015","https://openalex.org/W2064617409","https://openalex.org/W2077141052","https://openalex.org/W2085190728","https://openalex.org/W2141718151","https://openalex.org/W2143180769","https://openalex.org/W2148232877","https://openalex.org/W2322726605","https://openalex.org/W2612075907","https://openalex.org/W2788036211","https://openalex.org/W2792994456","https://openalex.org/W2815202474","https://openalex.org/W3172006219","https://openalex.org/W4210279461","https://openalex.org/W6677061118","https://openalex.org/W6678353669"],"related_works":["https://openalex.org/W4206883360","https://openalex.org/W4300125884","https://openalex.org/W2472351237","https://openalex.org/W2161246773","https://openalex.org/W2556084069","https://openalex.org/W2067589734","https://openalex.org/W2991810111","https://openalex.org/W2063375921","https://openalex.org/W2671070711","https://openalex.org/W1969007906"],"abstract_inverted_index":{"Numerical":[0],"research":[1],"on":[2],"an":[3,13,124],"electrostatic":[4,14,28,46,65,70,77,113],"lantern":[5,43,66,121],"rings":[6,91,122],"calibration":[7],"structure":[8],"is":[9,26,35,73,92,116],"conducted":[10],"to":[11,60],"produce":[12],"driving":[15,24],"force":[16,25,52,71,78,114],"in":[17,81],"the":[18,27,61,68,76,82,86,90,96,104,112],"range":[19],"of":[20,40,64,89],"0\u20132.25":[21],"mN.":[22],"The":[23,45],"attraction":[29],"generated":[30,53],"when":[31],"a":[32,38],"potential":[33],"difference":[34],"applied":[36],"between":[37],"set":[39],"oppositely":[41],"arranged":[42],"rings.":[44],"potential,":[47],"electric":[48],"field":[49],"distribution,":[50],"and":[51,75,126],"at":[54],"different":[55],"voltages":[56],"are":[57],"obtained.":[58],"Due":[59],"axial":[62,83],"symmetry":[63],"rings,":[67],"radial":[69,105],"component":[72],"balanced":[74],"mainly":[79],"acts":[80],"direction.":[84],"When":[85],"engagement":[87],"distance":[88],"within":[93],"3\u20136":[94],"mm,":[95,111],"deflection":[97],"angle":[98],"does":[99,107],"not":[100,108],"exceed":[101,109],"2\u00b0,":[102],"or":[103],"offset":[106],"0.3":[110],"deviation":[115],"less":[117],"than":[118],"5%.":[119],"Electrostatic":[120],"provide":[123],"accurate":[125],"practical":[127],"alternative":[128],"method":[129],"for":[130],"thrust":[131],"stand":[132],"calibration.":[133]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}