{"id":"https://openalex.org/W4313055724","doi":"https://doi.org/10.1109/tim.2022.3225926","title":"Complex Permittivity Measurement Utilizing Multiple Modes of a Rectangular Cavity","display_name":"Complex Permittivity Measurement Utilizing Multiple Modes of a Rectangular Cavity","publication_year":2022,"publication_date":"2022-12-01","ids":{"openalex":"https://openalex.org/W4313055724","doi":"https://doi.org/10.1109/tim.2022.3225926"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3225926","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3225926","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085180899","display_name":"Qin Shi","orcid":"https://orcid.org/0000-0003-4352-8035"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qin Shi","raw_affiliation_strings":["School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-4352-8035","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000882997","display_name":"Qing\u2010Xin Chu","orcid":"https://orcid.org/0000-0002-5807-0365"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing-Xin Chu","raw_affiliation_strings":["School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-5807-0365","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013310340","display_name":"Meizhen Xiao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mei-Zhen Xiao","raw_affiliation_strings":["China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-6020-832X","affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035519477","display_name":"Fu\u2010Chang Chen","orcid":"https://orcid.org/0000-0001-9866-091X"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fu-Chang Chen","raw_affiliation_strings":["School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-9866-091X","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084151642","display_name":"Xue-Quan Huang","orcid":"https://orcid.org/0000-0002-3634-8610"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xue-Quan Huang","raw_affiliation_strings":["School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-3634-8610","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049759161","display_name":"Xiao He","orcid":"https://orcid.org/0000-0001-5969-3495"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao He","raw_affiliation_strings":["China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-5969-3495","affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China","institution_ids":["https://openalex.org/I4210113818"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2003,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.78358227,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":100},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.7434933185577393},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.7054157257080078},{"id":"https://openalex.org/keywords/dissipation-factor","display_name":"Dissipation factor","score":0.6799410581588745},{"id":"https://openalex.org/keywords/microwave-cavity","display_name":"Microwave cavity","score":0.5967758297920227},{"id":"https://openalex.org/keywords/q-factor","display_name":"Q factor","score":0.5024740695953369},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5020415782928467},{"id":"https://openalex.org/keywords/resonant-cavity","display_name":"Resonant cavity","score":0.49956583976745605},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4760708212852478},{"id":"https://openalex.org/keywords/tangent","display_name":"Tangent","score":0.47419482469558716},{"id":"https://openalex.org/keywords/perturbation","display_name":"Perturbation (astronomy)","score":0.45615142583847046},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4427972137928009},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38491734862327576},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.38363319635391235},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.3319670557975769},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.3183216452598572},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3134866952896118},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2876812517642975},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2101152241230011},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1940426230430603},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.1073198914527893},{"id":"https://openalex.org/keywords/resonator","display_name":"Resonator","score":0.0860883891582489}],"concepts":[{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.7434933185577393},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.7054157257080078},{"id":"https://openalex.org/C97274863","wikidata":"https://www.wikidata.org/wiki/Q1040795","display_name":"Dissipation factor","level":3,"score":0.6799410581588745},{"id":"https://openalex.org/C186397771","wikidata":"https://www.wikidata.org/wiki/Q5759014","display_name":"Microwave cavity","level":3,"score":0.5967758297920227},{"id":"https://openalex.org/C187725362","wikidata":"https://www.wikidata.org/wiki/Q830521","display_name":"Q factor","level":3,"score":0.5024740695953369},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5020415782928467},{"id":"https://openalex.org/C2989223519","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonant cavity","level":3,"score":0.49956583976745605},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4760708212852478},{"id":"https://openalex.org/C138187205","wikidata":"https://www.wikidata.org/wiki/Q131251","display_name":"Tangent","level":2,"score":0.47419482469558716},{"id":"https://openalex.org/C177918212","wikidata":"https://www.wikidata.org/wiki/Q803623","display_name":"Perturbation (astronomy)","level":2,"score":0.45615142583847046},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4427972137928009},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38491734862327576},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.38363319635391235},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.3319670557975769},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.3183216452598572},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3134866952896118},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2876812517642975},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2101152241230011},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1940426230430603},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.1073198914527893},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.0860883891582489},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3225926","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3225926","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1853196333","display_name":null,"funder_award_id":"2021YFA1003404","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1977742963","https://openalex.org/W1977748722","https://openalex.org/W2009300823","https://openalex.org/W2010093927","https://openalex.org/W2014093670","https://openalex.org/W2044617818","https://openalex.org/W2071180104","https://openalex.org/W2076483204","https://openalex.org/W2102331451","https://openalex.org/W2133526612","https://openalex.org/W2149638733","https://openalex.org/W2149666187","https://openalex.org/W2150293638","https://openalex.org/W2151224241","https://openalex.org/W2159290301","https://openalex.org/W2295322321","https://openalex.org/W2333230365","https://openalex.org/W2537241445","https://openalex.org/W2590618506","https://openalex.org/W2802855942","https://openalex.org/W2998996420","https://openalex.org/W3012165323","https://openalex.org/W3033148849","https://openalex.org/W3123607960","https://openalex.org/W3159603472","https://openalex.org/W3215198835","https://openalex.org/W4205648553","https://openalex.org/W4210300463","https://openalex.org/W4210322355","https://openalex.org/W4211244693","https://openalex.org/W4213427849","https://openalex.org/W4214895847","https://openalex.org/W4225763442","https://openalex.org/W4283718815"],"related_works":["https://openalex.org/W2381876901","https://openalex.org/W1704187135","https://openalex.org/W2019466808","https://openalex.org/W2387629855","https://openalex.org/W2018527114","https://openalex.org/W2543970195","https://openalex.org/W1523192158","https://openalex.org/W2392884703","https://openalex.org/W2157890918","https://openalex.org/W3156907320"],"abstract_inverted_index":{"A":[0],"novel":[1],"method":[2],"for":[3,66],"measuring":[4],"the":[5,23,36,51,59,70,75,80,101,104],"dielectric":[6,12],"constant":[7],"and":[8,30,64,97],"loss":[9],"tangent":[10],"of":[11,22,46,54,103],"substrates":[13],"is":[14,95],"presented":[15],"in":[16,79],"this":[17],"article.":[18],"Four":[19],"resonant":[20,25,93],"modes":[21,61],"rectangular":[24],"cavity,":[26],"TE101,":[27],"TE105,":[28],"TE109,":[29],"TE1015,":[31],"are":[32,84],"utilized":[33],"to":[34,41,86,99],"realize":[35],"multiband":[37],"measurement":[38],"from":[39],"0.9":[40],"10":[42],"GHz.":[43],"The":[44],"introduction":[45],"additional":[47],"slots":[48],"cuts":[49],"down":[50],"quality":[52],"factor":[53],"some":[55],"miscellaneous":[56],"modes,":[57],"making":[58],"working":[60],"more":[62,88],"obvious":[63],"convenient":[65],"extraction.":[67],"Based":[68],"on":[69],"traditional":[71],"perturbation":[72],"formulas,":[73],"considering":[74],"sinusoidal":[76],"field":[77],"distribution":[78],"sample,":[81],"modified":[82],"formulas":[83],"deduced":[85],"obtain":[87],"accurate":[89],"results.":[90],"An":[91],"experimental":[92],"cavity":[94],"fabricated":[96],"measured":[98],"demonstrate":[100],"effectivity":[102],"proposed":[105],"method.":[106]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":7}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}