{"id":"https://openalex.org/W4312916077","doi":"https://doi.org/10.1109/tim.2022.3222506","title":"Interval-Valued-Based Stacked Attention Autoencoder Model for Process Monitoring and Fault Diagnosis of Nonlinear Uncertain Systems","display_name":"Interval-Valued-Based Stacked Attention Autoencoder Model for Process Monitoring and Fault Diagnosis of Nonlinear Uncertain Systems","publication_year":2022,"publication_date":"2022-11-16","ids":{"openalex":"https://openalex.org/W4312916077","doi":"https://doi.org/10.1109/tim.2022.3222506"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3222506","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3222506","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060579817","display_name":"Qiqi Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I143593769","display_name":"East China University of Science and Technology","ror":"https://ror.org/01vyrm377","country_code":"CN","type":"education","lineage":["https://openalex.org/I143593769"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qiqi Wu","raw_affiliation_strings":["Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I143593769"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000809799","display_name":"Xuefeng Yan","orcid":"https://orcid.org/0000-0001-5622-8686"},"institutions":[{"id":"https://openalex.org/I143593769","display_name":"East China University of Science and Technology","ror":"https://ror.org/01vyrm377","country_code":"CN","type":"education","lineage":["https://openalex.org/I143593769"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuefeng Yan","raw_affiliation_strings":["Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I143593769"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5060579817"],"corresponding_institution_ids":["https://openalex.org/I143593769"],"apc_list":null,"apc_paid":null,"fwci":1.446,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.81254017,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14470","display_name":"Advanced Data Processing Techniques","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9642000198364258,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7330707311630249},{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.637029230594635},{"id":"https://openalex.org/keywords/divergence","display_name":"Divergence (linguistics)","score":0.573766827583313},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.5257290601730347},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.49707797169685364},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4892983138561249},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.48191598057746887},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4754597544670105},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.46761593222618103},{"id":"https://openalex.org/keywords/interval","display_name":"Interval (graph theory)","score":0.44609078764915466},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4429687559604645},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.44183316826820374},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4207058250904083},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3903857469558716},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.37810516357421875},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3690248131752014},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3473985195159912},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2846129238605499},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.26629745960235596}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7330707311630249},{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.637029230594635},{"id":"https://openalex.org/C207390915","wikidata":"https://www.wikidata.org/wiki/Q1230525","display_name":"Divergence (linguistics)","level":2,"score":0.573766827583313},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5257290601730347},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.49707797169685364},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4892983138561249},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.48191598057746887},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4754597544670105},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.46761593222618103},{"id":"https://openalex.org/C2778067643","wikidata":"https://www.wikidata.org/wiki/Q166507","display_name":"Interval (graph theory)","level":2,"score":0.44609078764915466},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4429687559604645},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.44183316826820374},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4207058250904083},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3903857469558716},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.37810516357421875},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3690248131752014},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3473985195159912},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2846129238605499},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.26629745960235596},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3222506","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3222506","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2973531520","display_name":null,"funder_award_id":"2021YFC2101100","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G6905653140","display_name":null,"funder_award_id":"21878081","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1496864517","https://openalex.org/W1970537494","https://openalex.org/W1985034083","https://openalex.org/W2004186751","https://openalex.org/W2018458591","https://openalex.org/W2062368510","https://openalex.org/W2083329817","https://openalex.org/W2095182114","https://openalex.org/W2141188346","https://openalex.org/W2166373338","https://openalex.org/W2189324756","https://openalex.org/W2788805965","https://openalex.org/W2793832636","https://openalex.org/W2796942168","https://openalex.org/W2807470138","https://openalex.org/W2888588474","https://openalex.org/W2891335442","https://openalex.org/W2895979522","https://openalex.org/W2904171273","https://openalex.org/W2928156582","https://openalex.org/W3001132955","https://openalex.org/W3020582323","https://openalex.org/W3023317981","https://openalex.org/W3095103355","https://openalex.org/W3097381228","https://openalex.org/W3107625646","https://openalex.org/W3120026198","https://openalex.org/W3123899295","https://openalex.org/W3145350117","https://openalex.org/W3160197820","https://openalex.org/W3205788673","https://openalex.org/W3209561127","https://openalex.org/W4214680255","https://openalex.org/W6721854696"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W3150960233","https://openalex.org/W2107097146","https://openalex.org/W4240473904","https://openalex.org/W3148663848","https://openalex.org/W2905357958","https://openalex.org/W2005680954","https://openalex.org/W2474604829","https://openalex.org/W2024194466","https://openalex.org/W1647641933"],"abstract_inverted_index":{"The":[0],"measurement":[1],"data":[2,35,205],"fluctuate":[3],"up":[4],"and":[5,18,38,75,99,105,135,142],"down":[6],"within":[7],"an":[8,129,150],"interval":[9,104],"centered":[10],"on":[11,33,109,187],"the":[12,46,50,58,63,69,72,78,97,103,110,120,133,136,144,157,165,172,183,188,196,214,217,220],"true":[13],"value":[14],"due":[15],"to":[16,57,62,76,131,206],"disturbances":[17],"noise":[19],"which":[20],"are":[21,30,146],"zero":[22],"mean.":[23],"Meanwhile,":[24],"traditional":[25],"industrial":[26],"process":[27,52,158],"monitoring":[28,66,92],"algorithms":[29],"mostly":[31],"based":[32],"normal":[34],"for":[36],"modeling":[37,51],"rarely":[39],"consider":[40],"fault":[41,121,145,204],"information.":[42,210],"As":[43],"a":[44,87,168,177],"result,":[45],"variables":[47,137,175],"involved":[48],"in":[49,94,156],"may":[53],"contain":[54],"information":[55],"irrelevant":[56],"fault,":[59],"thereby":[60],"leading":[61],"degradation":[64],"of":[65,71,80,96,102,159,198,216],"performance.":[67],"On":[68],"basis":[70],"above":[73],"considerations":[74],"avoid":[77],"occurrence":[79],"major":[81],"safety":[82],"accidents,":[83],"this":[84],"study":[85,212],"proposes":[86],"stacked":[88,161],"attention":[89,151],"autoencoder":[90],"(SAAE)":[91],"model":[93,184],"view":[95],"upper":[98],"lower":[100],"bounds":[101],"fault\u2013related":[106,174,189,209],"variables.":[107],"Based":[108],"viewpoint":[111],"that":[112],"some":[113],"sampled":[114],"variables\u2019":[115],"distribution":[116],"will":[117],"change":[118],"after":[119,143],"occurs,":[122],"Jensen\u2013Shannon":[123],"(JS)":[124],"divergence":[125],"is":[126,154],"used":[127],"as":[128],"indicator":[130],"measure":[132],"difference,":[134],"with":[138,167,171],"significant":[139],"changes":[140],"before":[141],"screened":[147],"out.":[148],"Subsequently,":[149],"mechanism":[152],"(AM)":[153],"introduced":[155],"training":[160],"AE":[162],"(SAE).":[163],"Thus,":[164],"features":[166],"strong":[169],"correlation":[170],"just-screened":[173],"have":[176],"larger":[178],"weight.":[179],"In":[180],"other":[181],"words,":[182],"focuses":[185],"more":[186],"features.":[190],"This":[191,211],"method":[192],"not":[193],"only":[194],"reduces":[195],"influence":[197],"uncertainty,":[199],"but":[200],"also":[201],"uses":[202],"historical":[203],"pick":[207],"out":[208],"demonstrates":[213],"performance":[215],"algorithm":[218],"through":[219],"Tennessee":[221],"Eastman":[222],"(TE)":[223],"process.":[224]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}