{"id":"https://openalex.org/W4312404854","doi":"https://doi.org/10.1109/tim.2022.3216670","title":"Wire Rope Damage Detection Signal Processing Using K-Singular Value Decomposition and Optimized Double-Tree Complex Wavelet Transform","display_name":"Wire Rope Damage Detection Signal Processing Using K-Singular Value Decomposition and Optimized Double-Tree Complex Wavelet Transform","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4312404854","doi":"https://doi.org/10.1109/tim.2022.3216670"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3216670","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3216670","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/10072/429389","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027458613","display_name":"Hongyao Wang","orcid":"https://orcid.org/0000-0002-6407-5103"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hongyao Wang","raw_affiliation_strings":["Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China","School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001822825","display_name":"Qinyi Li","orcid":"https://orcid.org/0000-0002-1064-2600"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qinyi Li","raw_affiliation_strings":["Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China","School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040136087","display_name":"Shuang Han","orcid":"https://orcid.org/0000-0001-9082-6487"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuang Han","raw_affiliation_strings":["Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China","Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008769120","display_name":"Pengbo Li","orcid":"https://orcid.org/0000-0003-2025-5951"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengbo Li","raw_affiliation_strings":["Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China","School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084143157","display_name":"Jie Tian","orcid":"https://orcid.org/0000-0003-2224-3428"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Tian","raw_affiliation_strings":["School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China","Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052895298","display_name":"Shijing Zhang","orcid":"https://orcid.org/0000-0001-7876-4789"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]},{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shijing Zhang","raw_affiliation_strings":["Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China","Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang Hangkong University, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"School of Mechanical Electronic and Information Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]},{"raw_affiliation_string":"Key Laboratory of Nondestructive Testing (Nanchang Hangkong University), Ministry of Education, Nanchang, China","institution_ids":["https://openalex.org/I927504317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5027458613"],"corresponding_institution_ids":["https://openalex.org/I25757504","https://openalex.org/I927504317"],"apc_list":null,"apc_paid":null,"fwci":1.5758,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.82584248,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.6498249769210815},{"id":"https://openalex.org/keywords/wire-rope","display_name":"Wire rope","score":0.6429854035377502},{"id":"https://openalex.org/keywords/singular-value-decomposition","display_name":"Singular value decomposition","score":0.5952543020248413},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5849930047988892},{"id":"https://openalex.org/keywords/complex-wavelet-transform","display_name":"Complex wavelet transform","score":0.5333760976791382},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5273191332817078},{"id":"https://openalex.org/keywords/smoothing","display_name":"Smoothing","score":0.518008291721344},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.5147119164466858},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4975464642047882},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.49645358324050903},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49182605743408203},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.45727044343948364},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"Signal-to-noise ratio (imaging)","score":0.4456862211227417},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.41705793142318726},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.40766197443008423},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.37764984369277954},{"id":"https://openalex.org/keywords/wavelet-packet-decomposition","display_name":"Wavelet packet decomposition","score":0.35502007603645325},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21029937267303467},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.13236907124519348},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.1150166392326355},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.07482624053955078}],"concepts":[{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.6498249769210815},{"id":"https://openalex.org/C2781373598","wikidata":"https://www.wikidata.org/wiki/Q552034","display_name":"Wire rope","level":2,"score":0.6429854035377502},{"id":"https://openalex.org/C22789450","wikidata":"https://www.wikidata.org/wiki/Q420904","display_name":"Singular value decomposition","level":2,"score":0.5952543020248413},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5849930047988892},{"id":"https://openalex.org/C2777885455","wikidata":"https://www.wikidata.org/wiki/Q5156615","display_name":"Complex wavelet transform","level":5,"score":0.5333760976791382},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5273191332817078},{"id":"https://openalex.org/C3770464","wikidata":"https://www.wikidata.org/wiki/Q775963","display_name":"Smoothing","level":2,"score":0.518008291721344},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.5147119164466858},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4975464642047882},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.49645358324050903},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49182605743408203},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.45727044343948364},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.4456862211227417},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.41705793142318726},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.40766197443008423},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.37764984369277954},{"id":"https://openalex.org/C155777637","wikidata":"https://www.wikidata.org/wiki/Q2736187","display_name":"Wavelet packet decomposition","level":4,"score":0.35502007603645325},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21029937267303467},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13236907124519348},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.1150166392326355},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.07482624053955078},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2022.3216670","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3216670","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:research-repository.griffith.edu.au:10072/429389","is_oa":true,"landing_page_url":"http://hdl.handle.net/10072/429389","pdf_url":null,"source":{"id":"https://openalex.org/S4306402548","display_name":"Griffith Research Online (Griffith University, Queensland, Australia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I11701301","host_organization_name":"Griffith University","host_organization_lineage":["https://openalex.org/I11701301"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Journal article"}],"best_oa_location":{"id":"pmh:oai:research-repository.griffith.edu.au:10072/429389","is_oa":true,"landing_page_url":"http://hdl.handle.net/10072/429389","pdf_url":null,"source":{"id":"https://openalex.org/S4306402548","display_name":"Griffith Research Online (Griffith University, Queensland, Australia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I11701301","host_organization_name":"Griffith University","host_organization_lineage":["https://openalex.org/I11701301"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Journal article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1079396561","display_name":null,"funder_award_id":"2022YJSJD09","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G4936743967","display_name":null,"funder_award_id":"2022JCCXJD02","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G5576168841","display_name":null,"funder_award_id":"EW202180222","funder_id":"https://openalex.org/F4320311649","funder_display_name":"Ministry of Education"},{"id":"https://openalex.org/G8093064272","display_name":null,"funder_award_id":"51774293","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320311649","display_name":"Ministry of Education","ror":"https://ror.org/036nq5137"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2038013785","https://openalex.org/W2160547390","https://openalex.org/W2177599466","https://openalex.org/W2798749866","https://openalex.org/W2943417237","https://openalex.org/W2957207672","https://openalex.org/W2967260943","https://openalex.org/W2982584111","https://openalex.org/W3070672310","https://openalex.org/W3086283800","https://openalex.org/W3086919531","https://openalex.org/W3119248182","https://openalex.org/W3120496187","https://openalex.org/W3120888714","https://openalex.org/W3179070965","https://openalex.org/W3186480546","https://openalex.org/W3211611099","https://openalex.org/W4280529003","https://openalex.org/W4292962402","https://openalex.org/W6803577556"],"related_works":["https://openalex.org/W2384638757","https://openalex.org/W2792520941","https://openalex.org/W1974556001","https://openalex.org/W2368855668","https://openalex.org/W2095606712","https://openalex.org/W2313881943","https://openalex.org/W2129282069","https://openalex.org/W2059599172","https://openalex.org/W2349365525","https://openalex.org/W2553920834"],"abstract_inverted_index":{"Steel":[0],"wire":[1,120,193],"ropes":[2],"are":[3,37,47,82],"used":[4,93,111],"for":[5,105],"transporting":[6],"personnel":[7],"and":[8,22,181],"materials":[9],"in":[10,80,177],"coal":[11],"mines.":[12],"Its":[13],"quality":[14],"directly":[15],"affects":[16],"the":[17,30,33,69,73,86,96,114,119,130,137,144,156,169,175,178,189,192],"safety":[18,190],"of":[19,42,72,76,191],"mining":[20],"operation":[21],"hence,":[23],"it":[24],"is":[25,92,140,151,159],"important":[26],"to":[27,84,94,112,132,161],"accurately":[28],"identify":[29],"defects.":[31],"Since":[32],"electromagnetic":[34],"detection":[35,116,179],"methods":[36],"affected":[38],"by":[39],"large":[40],"amounts":[41],"noise,":[43],"more":[44,163],"precise":[45],"strategies":[46],"required.":[48],"This":[49],"paper":[50],"proposes":[51],"a":[52],"noise":[53,106,123,133,176],"reduction":[54],"method":[55,139],"based":[56],"on":[57],"K-singular":[58],"value":[59],"decomposition":[60,78,88],"(K-SVD)":[61],"optimized":[62,104],"double-tree":[63],"complex":[64],"wavelet":[65],"transform":[66],"(DTCWT).":[67],"Firstly,":[68],"discrete":[70],"coefficients":[71],"evaluation":[74],"index":[75],"different":[77],"levels":[79],"DTCWT":[81,109],"calculated":[83],"obtain":[85],"optimal":[87],"levels.":[89],"Afterwards,":[90],"K-SVD":[91],"update":[95],"sparse":[97],"dictionary.":[98],"The":[99,125,147],"decomposed":[100],"high-frequency":[101],"modes":[102],"were":[103],"reduction.":[107,124],"Finally,":[108],"was":[110],"reconstruct":[113],"damage":[115],"signal":[117,131,180],"from":[118],"rope,":[121],"after":[122],"experimental":[126],"results":[127],"show":[128],"that":[129,168],"ratio":[134],"obtained":[135,150],"using":[136],"proposed":[138,170],"30%":[141],"higher":[142],"than":[143,153,164],"other":[145],"algorithms.":[146],"smoothing":[148],"coefficient":[149,158],"lower":[152],"0.01,":[154],"whereas":[155],"correlation":[157],"found":[160],"be":[162],"0.95,":[165],"which":[166],"indicates":[167],"algorithm":[171],"can":[172],"effectively":[173],"reduce":[174],"significantly":[182],"retain":[183],"its":[184],"original":[185],"characteristics,":[186],"thereby":[187],"improving":[188],"rope.":[194]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":6}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}