{"id":"https://openalex.org/W4297310186","doi":"https://doi.org/10.1109/tim.2022.3207796","title":"Design of a High Linearity Sinusoidal Current Generator Using Shifting Current Mirror Architecture","display_name":"Design of a High Linearity Sinusoidal Current Generator Using Shifting Current Mirror Architecture","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4297310186","doi":"https://doi.org/10.1109/tim.2022.3207796"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3207796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3207796","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078462204","display_name":"Jiajie Huang","orcid":"https://orcid.org/0000-0003-4343-0425"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jiajie Huang","raw_affiliation_strings":["Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039030164","display_name":"Ting Zhou","orcid":"https://orcid.org/0000-0001-5887-3590"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ting Zhou","raw_affiliation_strings":["Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100407087","display_name":"Chao Wang","orcid":"https://orcid.org/0000-0003-0526-0250"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Wang","raw_affiliation_strings":["Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056077578","display_name":"Zhiwen Gu","orcid":"https://orcid.org/0000-0002-1734-389X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiwen Gu","raw_affiliation_strings":["Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100764158","display_name":"Yongfu Li","orcid":"https://orcid.org/0000-0002-6322-8614"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongfu Li","raw_affiliation_strings":["Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100350985","display_name":"Yan Liu","orcid":"https://orcid.org/0000-0001-5616-9428"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Liu","raw_affiliation_strings":["Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and the MoE Key Laboratory of Artificial Intelligence, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5078462204"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":0.2761,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.53415581,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11255","display_name":"Microfluidic and Bio-sensing Technologies","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.787376880645752},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6200416684150696},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.613336980342865},{"id":"https://openalex.org/keywords/signal-generator","display_name":"Signal generator","score":0.5554404258728027},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5436943173408508},{"id":"https://openalex.org/keywords/output-impedance","display_name":"Output impedance","score":0.5416444540023804},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5356881618499756},{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.5065377950668335},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.4872947931289673},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.44732803106307983},{"id":"https://openalex.org/keywords/current-mirror","display_name":"Current mirror","score":0.43024134635925293},{"id":"https://openalex.org/keywords/current-source","display_name":"Current source","score":0.4186785817146301},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40862080454826355},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3534018397331238},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35118308663368225},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2408440113067627},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.24080601334571838},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1634475588798523},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.1063392162322998},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.10535559058189392},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.07576322555541992}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.787376880645752},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6200416684150696},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.613336980342865},{"id":"https://openalex.org/C207912722","wikidata":"https://www.wikidata.org/wiki/Q1259123","display_name":"Signal generator","level":3,"score":0.5554404258728027},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5436943173408508},{"id":"https://openalex.org/C58112919","wikidata":"https://www.wikidata.org/wiki/Q631203","display_name":"Output impedance","level":3,"score":0.5416444540023804},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5356881618499756},{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.5065377950668335},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.4872947931289673},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.44732803106307983},{"id":"https://openalex.org/C173966970","wikidata":"https://www.wikidata.org/wiki/Q786012","display_name":"Current mirror","level":4,"score":0.43024134635925293},{"id":"https://openalex.org/C2781331714","wikidata":"https://www.wikidata.org/wiki/Q1163768","display_name":"Current source","level":3,"score":0.4186785817146301},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40862080454826355},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3534018397331238},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35118308663368225},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2408440113067627},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.24080601334571838},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1634475588798523},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1063392162322998},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.10535559058189392},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.07576322555541992},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3207796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3207796","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7799999713897705}],"awards":[{"id":"https://openalex.org/G5098878155","display_name":null,"funder_award_id":"2020YFB2205600","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1509148781","https://openalex.org/W2024643824","https://openalex.org/W2027965779","https://openalex.org/W2140281076","https://openalex.org/W2140823559","https://openalex.org/W2508589716","https://openalex.org/W2761309853","https://openalex.org/W2778261080","https://openalex.org/W2783139694","https://openalex.org/W2790666456","https://openalex.org/W2790871116","https://openalex.org/W2794894542","https://openalex.org/W2896989731","https://openalex.org/W2900424154","https://openalex.org/W2911264013","https://openalex.org/W2913886006","https://openalex.org/W2921577698","https://openalex.org/W2958068914","https://openalex.org/W3025413255","https://openalex.org/W3097609090","https://openalex.org/W3168462270","https://openalex.org/W3179978636","https://openalex.org/W3192355450","https://openalex.org/W4206766197","https://openalex.org/W4231312653","https://openalex.org/W4254603833"],"related_works":["https://openalex.org/W2058355111","https://openalex.org/W4251646330","https://openalex.org/W2324548459","https://openalex.org/W2034948716","https://openalex.org/W2887775208","https://openalex.org/W3210784113","https://openalex.org/W2026522882","https://openalex.org/W2366357579","https://openalex.org/W2185593054","https://openalex.org/W2107940745"],"abstract_inverted_index":{"To":[0],"develop":[1],"a":[2,20,26],"simple":[3],"current":[4,61],"generator":[5,62],"(CG)":[6],"for":[7,80,90],"bio-impedance":[8],"(BioZ)":[9],"and":[10,86,98,108],"electrical":[11],"impedance":[12],"tomography":[13],"(EIT)":[14],"systems,":[15],"this":[16],"paper":[17],"proposes":[18],"using":[19,46],"shifting-current-mirror":[21],"(S-CM)":[22],"architecture":[23],"to":[24,75,83,93],"realize":[25],"high":[27,88],"linearity":[28,89],"sinusoidal":[29],"CG.":[30],"The":[31,59],"proposed":[32,60],"S-CM":[33],"CG":[34],"controls":[35],"the":[36,43,57,68],"amplitude":[37],"of":[38,73,105],"its":[39],"output":[40],"by":[41],"selecting":[42],"unit":[44],"elements":[45],"data":[47],"weighted":[48],"averaging":[49],"(DWA)":[50],"at":[51],"every":[52],"clock":[53],"cycle,":[54],"thus":[55],"suppressing":[56],"mismatch.":[58],"has":[63,87],"shown":[64],"an":[65],"improvement":[66],"in":[67],"average":[69],"signal-to-noise-and-distortion":[70],"ratio":[71],"(SNDR)":[72],"up":[74,82,92],"4.78":[76],"dB":[77],"with":[78],"DWA":[79],"resolutions":[81,91],"14":[84,94],"bits":[85,100],"bits,":[95,97],"12":[96],"10":[99],"while":[101],"having":[102],"area":[103],"savings":[104],"5\u00d7,":[106],"10\u00d7,":[107],"20\u00d7,":[109],"respectively.":[110]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}