{"id":"https://openalex.org/W4295934965","doi":"https://doi.org/10.1109/tim.2022.3204322","title":"Assembly Monitoring Using Semantic Segmentation Network Based on Multiscale Feature Maps and Trainable Guided Filter","display_name":"Assembly Monitoring Using Semantic Segmentation Network Based on Multiscale Feature Maps and Trainable Guided Filter","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4295934965","doi":"https://doi.org/10.1109/tim.2022.3204322"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3204322","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3204322","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090502855","display_name":"Chengjun Chen","orcid":"https://orcid.org/0000-0003-3185-1062"},"institutions":[{"id":"https://openalex.org/I44468530","display_name":"Qingdao University of Technology","ror":"https://ror.org/01qzc0f54","country_code":"CN","type":"education","lineage":["https://openalex.org/I44468530"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chengjun Chen","raw_affiliation_strings":["School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, China","School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, Shandong, China"],"raw_orcid":"https://orcid.org/0000-0003-3185-1062","affiliations":[{"raw_affiliation_string":"School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, China","institution_ids":["https://openalex.org/I44468530"]},{"raw_affiliation_string":"School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, Shandong, China","institution_ids":["https://openalex.org/I44468530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027635184","display_name":"Chunlin Zhang","orcid":"https://orcid.org/0000-0002-8561-7098"},"institutions":[{"id":"https://openalex.org/I44468530","display_name":"Qingdao University of Technology","ror":"https://ror.org/01qzc0f54","country_code":"CN","type":"education","lineage":["https://openalex.org/I44468530"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunlin Zhang","raw_affiliation_strings":["School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, China","School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, Shandong, China"],"raw_orcid":"https://orcid.org/0000-0002-8561-7098","affiliations":[{"raw_affiliation_string":"School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, China","institution_ids":["https://openalex.org/I44468530"]},{"raw_affiliation_string":"School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, Shandong, China","institution_ids":["https://openalex.org/I44468530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101573587","display_name":"LI Chang-zhi","orcid":"https://orcid.org/0000-0003-0676-3589"},"institutions":[{"id":"https://openalex.org/I44468530","display_name":"Qingdao University of Technology","ror":"https://ror.org/01qzc0f54","country_code":"CN","type":"education","lineage":["https://openalex.org/I44468530"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changzhi Li","raw_affiliation_strings":["School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, China","School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, Shandong, China"],"raw_orcid":"https://orcid.org/0000-0003-0676-3589","affiliations":[{"raw_affiliation_string":"School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, China","institution_ids":["https://openalex.org/I44468530"]},{"raw_affiliation_string":"School of Mechanical and Automotive Engineering, Qingdao University of Technology, Qingdao, Shandong, China","institution_ids":["https://openalex.org/I44468530"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027754907","display_name":"Jun Hong","orcid":"https://orcid.org/0000-0001-9556-9619"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Hong","raw_affiliation_strings":["School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-9556-9619","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5090502855"],"corresponding_institution_ids":["https://openalex.org/I44468530"],"apc_list":null,"apc_paid":null,"fwci":1.3554,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.83278493,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.8090311884880066},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.746996283531189},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6761595606803894},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.65946364402771},{"id":"https://openalex.org/keywords/segmentation-based-object-categorization","display_name":"Segmentation-based object categorization","score":0.618414580821991},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.5976124405860901},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5938860177993774},{"id":"https://openalex.org/keywords/scale-space-segmentation","display_name":"Scale-space segmentation","score":0.5894548892974854},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.568699836730957},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5592460632324219},{"id":"https://openalex.org/keywords/pooling","display_name":"Pooling","score":0.5337669849395752},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4697485566139221}],"concepts":[{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.8090311884880066},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.746996283531189},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6761595606803894},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.65946364402771},{"id":"https://openalex.org/C25694479","wikidata":"https://www.wikidata.org/wiki/Q7446278","display_name":"Segmentation-based object categorization","level":5,"score":0.618414580821991},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.5976124405860901},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5938860177993774},{"id":"https://openalex.org/C65885262","wikidata":"https://www.wikidata.org/wiki/Q7429708","display_name":"Scale-space segmentation","level":4,"score":0.5894548892974854},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.568699836730957},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5592460632324219},{"id":"https://openalex.org/C70437156","wikidata":"https://www.wikidata.org/wiki/Q7228652","display_name":"Pooling","level":2,"score":0.5337669849395752},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4697485566139221},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3204322","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3204322","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G2614841395","display_name":null,"funder_award_id":"52175471","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1159302035","https://openalex.org/W1677182931","https://openalex.org/W1686810756","https://openalex.org/W1861492603","https://openalex.org/W1901129140","https://openalex.org/W1903029394","https://openalex.org/W1923697677","https://openalex.org/W1997709480","https://openalex.org/W2058887147","https://openalex.org/W2122374500","https://openalex.org/W2124592697","https://openalex.org/W2129440600","https://openalex.org/W2133059825","https://openalex.org/W2152632881","https://openalex.org/W2560023338","https://openalex.org/W2563705555","https://openalex.org/W2565639579","https://openalex.org/W2605929543","https://openalex.org/W2609822318","https://openalex.org/W2630837129","https://openalex.org/W2735039185","https://openalex.org/W2770180314","https://openalex.org/W2787091153","https://openalex.org/W2798791840","https://openalex.org/W2962914239","https://openalex.org/W2963222130","https://openalex.org/W2963563573","https://openalex.org/W2963728677","https://openalex.org/W2963881378","https://openalex.org/W2965391153","https://openalex.org/W2985459778","https://openalex.org/W3045965960","https://openalex.org/W3048145096","https://openalex.org/W3102494826","https://openalex.org/W3105636206","https://openalex.org/W3107660495","https://openalex.org/W3159637683","https://openalex.org/W3184878892","https://openalex.org/W3202487219","https://openalex.org/W4255421341","https://openalex.org/W6637373629","https://openalex.org/W6640295612","https://openalex.org/W6739696289","https://openalex.org/W6745842894"],"related_works":["https://openalex.org/W3144569342","https://openalex.org/W2185902295","https://openalex.org/W2945274617","https://openalex.org/W2103507220","https://openalex.org/W2785294226","https://openalex.org/W1999008862","https://openalex.org/W2371519352","https://openalex.org/W4205800335","https://openalex.org/W2386644571","https://openalex.org/W2551987074"],"abstract_inverted_index":{"Timely":[0],"detection":[1],"of":[2,43,50,86,99,111,121,131,159,168],"errors":[3],"in":[4,93,115,176],"assembly":[5,11,24,30,33,51,142,161,202],"process":[6],"is":[7,46,126],"important":[8],"for":[9,25,80,82],"ensuring":[10],"quality":[12],"and":[13,32,39,70,162],"efficiency.":[14],"Image":[15],"segmentation":[16,37,41,85,123,157,166,177,188,197],"technology":[17],"can":[18,104],"be":[19,105],"used":[20],"to":[21],"monitor":[22],"mechanical":[23,87,141,160,201],"missing":[26],"assembly,":[27,29],"wrong":[28],"sequence,":[31],"pose.":[34],"However,":[35],"unclear":[36],"boundaries":[38],"low":[40],"accuracy":[42],"small":[44,181],"parts":[45],"the":[47,94,109,129,156,165,195,200],"main":[48],"limit":[49],"depth":[52,83,143,169,203],"image":[53,84,122,144,204],"segmentation.":[54],"Therefore,":[55],"this":[56,137],"study":[57,138],"proposes":[58],"a":[59,71,132,140],"skip":[60,91,151,190],"Fully":[61],"Convolutional":[62],"Network":[63],"(FCN)":[64],"with":[65,78,153,185,192],"Multi-scale":[66],"Feature":[67],"maps":[68],"(MF)":[69],"Trainable":[72],"Guided":[73],"Filter":[74],"(TGF)":[75],"(skip":[76],"FCN":[77,152,191],"MF&TGF":[79,154,193],"short)":[81],"assembly.":[88],"By":[89],"adding":[90],"connections":[92],"second":[95],"maximum":[96],"pooling":[97],"layer":[98],"FCN,":[100],"additional":[101],"low-level":[102],"features":[103],"obtained,":[106],"which":[107],"compensates":[108],"problem":[110,120],"insufficient":[112],"detailed":[113],"information":[114],"feature":[116],"map":[117],"prediction.":[118],"The":[119,146],"edge":[124],"blur":[125],"mitigated":[127],"by":[128],"integration":[130],"trainable":[133],"guided":[134],"filter.":[135],"Moreover,":[136],"establishes":[139],"dataset.":[145,205],"experimental":[147],"results":[148],"show":[149],"that":[150],"enhances":[155],"precision":[158],"significantly":[163],"improves":[164],"edges":[167],"images.":[170],"Furthermore,":[171],"it":[172],"shows":[173],"significant":[174],"improvement":[175],"performance":[178,198],"when":[179],"segmenting":[180],"parts.":[182],"Finally,":[183],"compared":[184],"other":[186],"semantic":[187],"networks,":[189],"achieves":[194],"best":[196],"on":[199]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}