{"id":"https://openalex.org/W4292347930","doi":"https://doi.org/10.1109/tim.2022.3200429","title":"Construction and Evolution of Fault Diagnosis Knowledge Graph in Industrial Process","display_name":"Construction and Evolution of Fault Diagnosis Knowledge Graph in Industrial Process","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4292347930","doi":"https://doi.org/10.1109/tim.2022.3200429"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3200429","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3200429","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086454990","display_name":"Huihui Han","orcid":"https://orcid.org/0000-0001-7285-9824"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huihui Han","raw_affiliation_strings":["Computer Integrated Manufacturing System Research Center, College of Electronics and Information Engineering, Tongji University, Shanghai, China","College of Electronics and Information Engineering, Computer Integrated Manufacturing System Research Center, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-7285-9824","affiliations":[{"raw_affiliation_string":"Computer Integrated Manufacturing System Research Center, College of Electronics and Information Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"College of Electronics and Information Engineering, Computer Integrated Manufacturing System Research Center, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100370424","display_name":"Jian Wang","orcid":"https://orcid.org/0000-0002-2922-7861"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Wang","raw_affiliation_strings":["Computer Integrated Manufacturing System Research Center, College of Electronics and Information Engineering, Tongji University, Shanghai, China","College of Electronics and Information Engineering, Computer Integrated Manufacturing System Research Center, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-2922-7861","affiliations":[{"raw_affiliation_string":"Computer Integrated Manufacturing System Research Center, College of Electronics and Information Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"College of Electronics and Information Engineering, Computer Integrated Manufacturing System Research Center, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016915081","display_name":"Xiaowen Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaowen Wang","raw_affiliation_strings":["Tsinghua Shenzhen International Graduate School, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-9192-4086","affiliations":[{"raw_affiliation_string":"Tsinghua Shenzhen International Graduate School, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100658277","display_name":"Sen Chen","orcid":"https://orcid.org/0000-0002-1256-3105"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sen Chen","raw_affiliation_strings":["Computer Integrated Manufacturing System Research Center, College of Electronics and Information Engineering, Tongji University, Shanghai, China","College of Electronics and Information Engineering, Computer Integrated Manufacturing System Research Center, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-1256-3105","affiliations":[{"raw_affiliation_string":"Computer Integrated Manufacturing System Research Center, College of Electronics and Information Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"College of Electronics and Information Engineering, Computer Integrated Manufacturing System Research Center, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.3334,"has_fulltext":false,"cited_by_count":54,"citation_normalized_percentile":{"value":0.96246169,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11273","display_name":"Advanced Graph Neural Networks","score":0.9725000262260437,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11273","display_name":"Advanced Graph Neural Networks","score":0.9725000262260437,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11063","display_name":"Rough Sets and Fuzzy Logic","score":0.948199987411499,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10028","display_name":"Topic Modeling","score":0.9416999816894531,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5838904976844788},{"id":"https://openalex.org/keywords/relation","display_name":"Relation (database)","score":0.5642783045768738},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.554884135723114},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.4815866947174072},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.48062270879745483},{"id":"https://openalex.org/keywords/embedding","display_name":"Embedding","score":0.46975234150886536},{"id":"https://openalex.org/keywords/maintenance-engineering","display_name":"Maintenance engineering","score":0.4537113904953003},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4335237741470337},{"id":"https://openalex.org/keywords/production-line","display_name":"Production line","score":0.4324060380458832},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.431018590927124},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4288170337677002},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3726222515106201},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3681536316871643},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3231533169746399},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3173878490924835},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.2905202805995941}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5838904976844788},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.5642783045768738},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.554884135723114},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.4815866947174072},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.48062270879745483},{"id":"https://openalex.org/C41608201","wikidata":"https://www.wikidata.org/wiki/Q980509","display_name":"Embedding","level":2,"score":0.46975234150886536},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.4537113904953003},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4335237741470337},{"id":"https://openalex.org/C99862985","wikidata":"https://www.wikidata.org/wiki/Q10858068","display_name":"Production line","level":2,"score":0.4324060380458832},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.431018590927124},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4288170337677002},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3726222515106201},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3681536316871643},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3231533169746399},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3173878490924835},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.2905202805995941},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3200429","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3200429","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5899999737739563,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":58,"referenced_works":["https://openalex.org/W1999954155","https://openalex.org/W2146574666","https://openalex.org/W2243512948","https://openalex.org/W2283196293","https://openalex.org/W2728059831","https://openalex.org/W2774837955","https://openalex.org/W2791980909","https://openalex.org/W2806341246","https://openalex.org/W2891935547","https://openalex.org/W2896457183","https://openalex.org/W2908098104","https://openalex.org/W2921223492","https://openalex.org/W2950898568","https://openalex.org/W2962886429","https://openalex.org/W2962913831","https://openalex.org/W2963406064","https://openalex.org/W2976429401","https://openalex.org/W2981986127","https://openalex.org/W2994001811","https://openalex.org/W2997876626","https://openalex.org/W2998741377","https://openalex.org/W3003265726","https://openalex.org/W3035219457","https://openalex.org/W3038768897","https://openalex.org/W3047144459","https://openalex.org/W3080238567","https://openalex.org/W3099387504","https://openalex.org/W3106720267","https://openalex.org/W3116427155","https://openalex.org/W3155657938","https://openalex.org/W3171160983","https://openalex.org/W3174267585","https://openalex.org/W3175124413","https://openalex.org/W3187495970","https://openalex.org/W3198512483","https://openalex.org/W3202973654","https://openalex.org/W3213089766","https://openalex.org/W3213855194","https://openalex.org/W4200281664","https://openalex.org/W4205108290","https://openalex.org/W4205139417","https://openalex.org/W4206097129","https://openalex.org/W4206821701","https://openalex.org/W4207011458","https://openalex.org/W4213048779","https://openalex.org/W4214587127","https://openalex.org/W4214745526","https://openalex.org/W4225508536","https://openalex.org/W4226343570","https://openalex.org/W4226462449","https://openalex.org/W6678830454","https://openalex.org/W6686133869","https://openalex.org/W6690457987","https://openalex.org/W6690815549","https://openalex.org/W6696085341","https://openalex.org/W6739901393","https://openalex.org/W6752554729","https://openalex.org/W6755207826"],"related_works":["https://openalex.org/W2081900870","https://openalex.org/W2183306018","https://openalex.org/W2549990292","https://openalex.org/W2345479200","https://openalex.org/W2951819827","https://openalex.org/W2849310602","https://openalex.org/W2419146053","https://openalex.org/W2088247287","https://openalex.org/W3006008237","https://openalex.org/W2963903416"],"abstract_inverted_index":{"The":[0],"steel":[1,44,165],"industry":[2],"production":[3,45,166],"line":[4,46,167],"is":[5,75,88,106],"complicated":[6],"and":[7,29,35,68,90,156,181],"contains":[8,92],"a":[9,43,55,102],"substantial":[10],"amount":[11],"of":[12,130,134],"equipment,":[13],"leading":[14],"to":[15,108,113,125,148],"serious":[16],"problems":[17],"in":[18],"fault":[19,26,38,48,96,178],"diagnosis":[20,49,179],"such":[21],"as":[22],"wrong":[23],"inspection":[24],"strategies,":[25],"location,":[27],"maintenance,":[28],"so":[30],"on.":[31],"To":[32,98],"realize":[33],"accurate":[34,157],"efficient":[36],"equipment":[37,47,168],"diagnosis,":[39],"this":[40,85,100],"paper":[41],"proposes":[42],"knowledge":[50,112],"graph":[51,120],"(SPLEFD-KG)":[52],"based":[53],"on":[54,163],"novel":[56,174],"relation-oriented":[57],"model":[58],"with":[59],"global":[60],"context":[61],"information":[62],"for":[63,95,137],"jointly":[64],"extracting":[65],"overlapping":[66],"relations":[67],"entities":[69,132],"(ROMGCJE).":[70],"A":[71],"low-level":[72,86,144],"self-learning":[73,145],"SPLEFD-KG":[74,87,136,146,175],"first":[76],"constructed":[77],"using":[78],"the":[79,115,119,127,135,143,164,173],"triples":[80],"extracted":[81],"by":[82],"ROMGCJE.":[83],"However,":[84],"incomplete,":[89],"only":[91],"sparse":[93],"paths":[94],"reasoning.":[97],"overcome":[99],"problem,":[101],"reinforcement":[103],"learning":[104],"framework":[105],"applied":[107],"mine":[109],"hidden":[110],"semantic":[111],"complete":[114],"missing":[116,140],"relation.":[117],"Besides,":[118],"neural":[121],"networks":[122],"are":[123],"introduced":[124],"compute":[126],"embedding":[128],"vector":[129],"new":[131],"outside":[133],"continuously":[138],"completing":[139],"entities.":[141],"Finally,":[142],"evolves":[147],"one":[149],"high-level":[150],"SPLEFD-KG,":[151],"which":[152],"can":[153],"provide":[154],"information-rich":[155],"fault-related":[158],"knowledge.":[159],"Extensive":[160],"experiments":[161],"conducted":[162],"failure":[169],"dataset":[170],"indicate":[171],"that":[172],"significantly":[176],"improves":[177],"results":[180],"provides":[182],"effective":[183],"maintenance":[184],"programs.":[185]},"counts_by_year":[{"year":2026,"cited_by_count":8},{"year":2025,"cited_by_count":21},{"year":2024,"cited_by_count":16},{"year":2023,"cited_by_count":9}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}