{"id":"https://openalex.org/W4292264776","doi":"https://doi.org/10.1109/tim.2022.3199272","title":"A Novel Eddy Current Method for Defect Detection Immune to Lift-Off","display_name":"A Novel Eddy Current Method for Defect Detection Immune to Lift-Off","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4292264776","doi":"https://doi.org/10.1109/tim.2022.3199272"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3199272","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3199272","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101992450","display_name":"Pu Huang","orcid":"https://orcid.org/0000-0002-7057-5462"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pu Huang","raw_affiliation_strings":["School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7057-5462","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072868904","display_name":"Hang Pu","orcid":"https://orcid.org/0000-0002-6087-8523"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hang Pu","raw_affiliation_strings":["School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-6087-8523","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101733280","display_name":"Jiyao Li","orcid":"https://orcid.org/0000-0002-2060-769X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiyao Li","raw_affiliation_strings":["School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-2060-769X","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009659263","display_name":"Yiqing Ding","orcid":"https://orcid.org/0000-0003-1048-8487"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiqing Ding","raw_affiliation_strings":["ShenYuan Honors College, Beihang University, Beijing, China","SHENYUAN Honors College, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-1048-8487","affiliations":[{"raw_affiliation_string":"ShenYuan Honors College, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"SHENYUAN Honors College, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101893972","display_name":"Wanpeng Zhang","orcid":"https://orcid.org/0000-0002-7548-5220"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wanpeng Zhang","raw_affiliation_strings":["School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7548-5220","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043551995","display_name":"Lijun Xu","orcid":"https://orcid.org/0000-0003-0488-9604"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun Xu","raw_affiliation_strings":["School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-0488-9604","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058642753","display_name":"Yuedong Xie","orcid":"https://orcid.org/0000-0001-9535-0764"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuedong Xie","raw_affiliation_strings":["School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-9535-0764","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Opto-Electronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.886,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.91089244,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lift","display_name":"Lift (data mining)","score":0.7647898197174072},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.76311194896698},{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.7515627145767212},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.7447877526283264},{"id":"https://openalex.org/keywords/eddy-current-sensor","display_name":"Eddy-current sensor","score":0.7439336180686951},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.7282514572143555},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5176877975463867},{"id":"https://openalex.org/keywords/logarithm","display_name":"Logarithm","score":0.4743332266807556},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43662720918655396},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.38333332538604736},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.28726089000701904},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2821625769138336},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2543542981147766},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24057504534721375},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.172292560338974},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14591136574745178}],"concepts":[{"id":"https://openalex.org/C139002025","wikidata":"https://www.wikidata.org/wiki/Q3001212","display_name":"Lift (data mining)","level":2,"score":0.7647898197174072},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.76311194896698},{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.7515627145767212},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.7447877526283264},{"id":"https://openalex.org/C2777897478","wikidata":"https://www.wikidata.org/wiki/Q23718891","display_name":"Eddy-current sensor","level":3,"score":0.7439336180686951},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.7282514572143555},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5176877975463867},{"id":"https://openalex.org/C39927690","wikidata":"https://www.wikidata.org/wiki/Q11197","display_name":"Logarithm","level":2,"score":0.4743332266807556},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43662720918655396},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.38333332538604736},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.28726089000701904},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2821625769138336},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2543542981147766},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24057504534721375},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.172292560338974},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14591136574745178},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3199272","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3199272","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6899999976158142}],"awards":[{"id":"https://openalex.org/G6313276247","display_name":null,"funder_award_id":"61901022","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8140746502","display_name":null,"funder_award_id":"KG12-1124-01","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1838347106","https://openalex.org/W1964438555","https://openalex.org/W1980221648","https://openalex.org/W2000246877","https://openalex.org/W2000421548","https://openalex.org/W2003075287","https://openalex.org/W2054142131","https://openalex.org/W2089938574","https://openalex.org/W2100788482","https://openalex.org/W2115542470","https://openalex.org/W2132603731","https://openalex.org/W2156319784","https://openalex.org/W2189987460","https://openalex.org/W2259438584","https://openalex.org/W2526322432","https://openalex.org/W2529815979","https://openalex.org/W2592227720","https://openalex.org/W2605029695","https://openalex.org/W2900055970","https://openalex.org/W2903173638","https://openalex.org/W2939600114","https://openalex.org/W2945259249","https://openalex.org/W2965712182","https://openalex.org/W2974585036","https://openalex.org/W2981824710","https://openalex.org/W2987457490","https://openalex.org/W2997725000","https://openalex.org/W3000915711","https://openalex.org/W3007404342","https://openalex.org/W3020988937","https://openalex.org/W3026404110","https://openalex.org/W3111756770","https://openalex.org/W3118509760","https://openalex.org/W3170356703","https://openalex.org/W3186326530","https://openalex.org/W3202666732","https://openalex.org/W3207087430","https://openalex.org/W3212537596","https://openalex.org/W3213800274"],"related_works":["https://openalex.org/W2085805524","https://openalex.org/W2003522138","https://openalex.org/W4296871629","https://openalex.org/W2551942315","https://openalex.org/W2333795440","https://openalex.org/W2325202533","https://openalex.org/W2744634501","https://openalex.org/W1973763794","https://openalex.org/W4384009611","https://openalex.org/W2120224426"],"abstract_inverted_index":{"Eddy":[0],"current":[1,44],"(EC)":[2],"sensors":[3],"have":[4],"been":[5],"applied":[6],"to":[7,22,29,52,65,83,132,142,179],"detect":[8,133],"defects":[9,15,161],"in":[10,89],"many":[11],"years.":[12],"Since":[13],"both":[14],"and":[16,34,72,174],"the":[17,31,67,70,73,79,84,100,114,120,127,134,137,153,168],"lift-off":[18,35,53,71,80],"variation":[19,36,88],"will":[20],"lead":[21],"measurement":[23],"signal":[24],"fluctuation,":[25],"it":[26],"is":[27,46,63,77,81,117,148],"necessary":[28],"distinguish":[30],"defect":[32,49,176],"response":[33],"response.":[37],"In":[38,95],"this":[39],"work,":[40],"a":[41,55,59,157],"novel":[42],"eddy":[43],"method":[45,147,170],"proposed":[47,146,169],"for":[48],"detection":[50,177],"immune":[51,178],"via":[54],"triple-coil":[56,101],"structure.":[57],"Firstly,":[58],"simplified":[60],"theoretical":[61],"model":[62],"built":[64],"investigate":[66],"relationship":[68],"between":[69],"inductance":[74,87],"variation.":[75],"It":[76],"found":[78],"proportional":[82],"logarithm":[85],"of":[86,97,104,107,113,162],"real":[90],"part":[91],"under":[92],"high":[93],"frequency.":[94],"terms":[96],"sensor":[98,102,125,154],"design,":[99],"consists":[103],"two":[105],"pairs":[106],"transmitting-receiving":[108],"coils,":[109],"from":[110],"which":[111],"one":[112],"receiving":[115],"coils":[116],"larger":[118,138],"than":[119],"other":[121],"one.":[122],"With":[123],"such":[124],"structure,":[126],"small":[128],"size":[129,139],"coil":[130,140],"aims":[131,141],"defect,":[135],"while":[136],"calibrate":[143],"lift-off.":[144,180],"The":[145,165],"verified":[149],"by":[150],"experiments":[151],"with":[152,160],"scanning":[155],"over":[156],"Titanium":[158],"specimen":[159],"different":[163],"sizes.":[164],"results":[166],"indicate":[167],"can":[171],"achieve":[172],"efficient":[173],"precise":[175]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":14},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":8}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}