{"id":"https://openalex.org/W4292348070","doi":"https://doi.org/10.1109/tim.2022.3198716","title":"Improved Position Estimation Method for SRM Considering Current Measurement Errors","display_name":"Improved Position Estimation Method for SRM Considering Current Measurement Errors","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4292348070","doi":"https://doi.org/10.1109/tim.2022.3198716"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3198716","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3198716","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081360337","display_name":"Guoqiang Han","orcid":"https://orcid.org/0000-0002-9670-4285"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guoqiang Han","raw_affiliation_strings":["School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-9670-4285","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002984287","display_name":"Zhe Lu","orcid":"https://orcid.org/0000-0002-8726-4417"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhe Lu","raw_affiliation_strings":["School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-8726-4417","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031160107","display_name":"Menglin Wu","orcid":"https://orcid.org/0000-0002-5431-203X"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Menglin Wu","raw_affiliation_strings":["School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-5431-203X","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072065857","display_name":"Shuai Xu","orcid":"https://orcid.org/0000-0002-6943-7396"},"institutions":[{"id":"https://openalex.org/I38877650","display_name":"Zhengzhou University","ror":"https://ror.org/04ypx8c21","country_code":"CN","type":"education","lineage":["https://openalex.org/I38877650"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuai Xu","raw_affiliation_strings":["School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-6943-7396","affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou, China","institution_ids":["https://openalex.org/I38877650"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048151187","display_name":"Beibei Zhu","orcid":"https://orcid.org/0000-0002-2536-5490"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Beibei Zhu","raw_affiliation_strings":["School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-2536-5490","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, China University of Mining and Technology, Xuzhou, China","institution_ids":["https://openalex.org/I25757504"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9718,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.7363849,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10278","display_name":"Electric Motor Design and Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10278","display_name":"Electric Motor Design and Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.8440561294555664},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.7929795980453491},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.5349181294441223},{"id":"https://openalex.org/keywords/rotor","display_name":"Rotor (electric)","score":0.5229105353355408},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.49097874760627747},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.4883589446544647},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.4463313817977905},{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.42482393980026245},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34248778223991394},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.34051966667175293},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.321224570274353},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2547909915447235},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21620622277259827},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11783450841903687},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07548710703849792},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.07539224624633789}],"concepts":[{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.8440561294555664},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.7929795980453491},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.5349181294441223},{"id":"https://openalex.org/C17281054","wikidata":"https://www.wikidata.org/wiki/Q193466","display_name":"Rotor (electric)","level":2,"score":0.5229105353355408},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.49097874760627747},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.4883589446544647},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.4463313817977905},{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.42482393980026245},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34248778223991394},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.34051966667175293},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.321224570274353},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2547909915447235},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21620622277259827},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11783450841903687},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07548710703849792},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.07539224624633789},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3198716","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3198716","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G474761803","display_name":null,"funder_award_id":"52007189","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5367562713","display_name":null,"funder_award_id":"52107215","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G990565496","display_name":null,"funder_award_id":"2020M682343","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1973369145","https://openalex.org/W1993837596","https://openalex.org/W2012690535","https://openalex.org/W2037360734","https://openalex.org/W2044999635","https://openalex.org/W2097925871","https://openalex.org/W2122766117","https://openalex.org/W2130081736","https://openalex.org/W2139629883","https://openalex.org/W2146922908","https://openalex.org/W2162048758","https://openalex.org/W2343007692","https://openalex.org/W2344632057","https://openalex.org/W2533256569","https://openalex.org/W2591460697","https://openalex.org/W2732141574","https://openalex.org/W2795244737","https://openalex.org/W2890781737","https://openalex.org/W2890907306","https://openalex.org/W2907982933","https://openalex.org/W2942905344","https://openalex.org/W2948165802","https://openalex.org/W2990849008"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2371304091","https://openalex.org/W2387913980","https://openalex.org/W2606355273","https://openalex.org/W1496710700","https://openalex.org/W2072843072","https://openalex.org/W2351633113","https://openalex.org/W2364239049","https://openalex.org/W2511684689","https://openalex.org/W2070090633"],"abstract_inverted_index":{"Saturation":[0],"and":[1,43,161,168],"current":[2,36,116,169],"measurement":[3,37,117,170],"errors":[4,118,171],"will":[5],"decrease":[6],"the":[7,20,29,40,54,62,69,72,80,85,94,106,113,133,146,164,176,179],"accuracy":[8],"of":[9,90,109,115,136,148,166,178],"rotor":[10,23,96,120],"position":[11,24,97,108,121],"estimation":[12,25,122],"for":[13],"switched":[14],"reluctance":[15],"motor":[16],"(SRM).":[17],"To":[18,67],"avoid":[19,68,163],"drawbacks,":[21],"a":[22],"method":[26,155],"based":[27],"on":[28,119],"unsaturated":[30,44,49,82,151],"inductance":[31,50,64,83,87],"reconstruction":[32],"is":[33,51,76,102,123,128,142],"proposed":[34,154,180],"considering":[35],"errors.":[38],"Firstly,":[39],"incremental,":[41],"apparent":[42],"inductances":[45],"are":[46],"analyzed.":[47,124],"The":[48,125,139,153],"calculated":[52],"with":[53],"similar":[55],"triangle":[56],"solution":[57],"in":[58,84,98],"normal":[59],"condition":[60],"during":[61],"linear":[63,73,86],"rising":[65],"region.":[66],"pulse":[70],"injection,":[71],"regression":[74],"algorithm":[75],"used":[77],"to":[78],"calculate":[79],"virtual":[81],"falling":[88],"region":[89,135],"adjacent":[91],"phase.":[92],"Then":[93],"complete":[95],"each":[99],"electric":[100],"period":[101],"obtained":[103],"by":[104,131,144],"combining":[105],"estimated":[107],"three":[110,149],"phases.":[111],"Secondly,":[112],"influence":[114,165],"offset":[126],"error":[127,141],"directly":[129],"avoided":[130],"detecting":[132],"zero-value":[134],"phase":[137,150],"currents.":[138],"scaling":[140],"compensated":[143],"balancing":[145],"amplitudes":[147],"inductances.":[152],"does":[156],"not":[157],"need":[158],"additional":[159],"hardware":[160],"can":[162],"saturation":[167],"simultaneously.":[172],"Experimental":[173],"results":[174],"validate":[175],"effectiveness":[177],"method.":[181]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}