{"id":"https://openalex.org/W4294664110","doi":"https://doi.org/10.1109/tim.2022.3196738","title":"A Practical Micro Fringe Projection Profilometry for 3-D Automated Optical Inspection","display_name":"A Practical Micro Fringe Projection Profilometry for 3-D Automated Optical Inspection","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4294664110","doi":"https://doi.org/10.1109/tim.2022.3196738"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3196738","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3196738","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041448852","display_name":"Tianle Cheng","orcid":"https://orcid.org/0000-0001-6029-2111"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]},{"id":"https://openalex.org/I196038209","display_name":"Hunan University of Arts and Science","ror":"https://ror.org/01ggnn306","country_code":"CN","type":"education","lineage":["https://openalex.org/I196038209"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianle Cheng","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China","School of Computer and Electrical Engineering, Hunan University of Arts and Science, Changde, China"],"raw_orcid":"https://orcid.org/0000-0001-6029-2111","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]},{"raw_affiliation_string":"School of Computer and Electrical Engineering, Hunan University of Arts and Science, Changde, China","institution_ids":["https://openalex.org/I196038209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077695899","display_name":"Xuewen Liu","orcid":"https://orcid.org/0000-0002-7702-7151"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuewen Liu","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-7702-7151","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062199389","display_name":"Long Qin","orcid":"https://orcid.org/0000-0002-4668-5362"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Long Qin","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-4668-5362","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056952391","display_name":"Minghao Lu","orcid":"https://orcid.org/0000-0003-1494-673X"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Minghao Lu","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-1494-673X","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006723622","display_name":"Changyan Xiao","orcid":"https://orcid.org/0000-0002-4864-5444"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changyan Xiao","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-4864-5444","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067097659","display_name":"Shutao Li","orcid":"https://orcid.org/0000-0002-0585-9848"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shutao Li","raw_affiliation_strings":["College of Electrical and Information Engineering, Hunan University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-0585-9848","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I16609230"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.4368,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.90418649,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bundle-adjustment","display_name":"Bundle adjustment","score":0.7653459310531616},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6701064705848694},{"id":"https://openalex.org/keywords/projector","display_name":"Projector","score":0.6243324279785156},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5846271514892578},{"id":"https://openalex.org/keywords/structured-light-3d-scanner","display_name":"Structured-light 3D scanner","score":0.5712420344352722},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5555567145347595},{"id":"https://openalex.org/keywords/structured-light","display_name":"Structured light","score":0.552436888217926},{"id":"https://openalex.org/keywords/camera-resectioning","display_name":"Camera resectioning","score":0.5284785032272339},{"id":"https://openalex.org/keywords/profilometer","display_name":"Profilometer","score":0.5284621119499207},{"id":"https://openalex.org/keywords/lens","display_name":"Lens (geology)","score":0.5203040242195129},{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.5121011734008789},{"id":"https://openalex.org/keywords/epipolar-geometry","display_name":"Epipolar geometry","score":0.4919430911540985},{"id":"https://openalex.org/keywords/depth-of-field","display_name":"Depth of field","score":0.4666837155818939},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4640082120895386},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.44498351216316223},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.4194888770580292},{"id":"https://openalex.org/keywords/photogrammetry","display_name":"Photogrammetry","score":0.2852729856967926},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23218685388565063},{"id":"https://openalex.org/keywords/scanner","display_name":"Scanner","score":0.1755262017250061},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13831132650375366},{"id":"https://openalex.org/keywords/surface-finish","display_name":"Surface finish","score":0.12918564677238464},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.12043827772140503}],"concepts":[{"id":"https://openalex.org/C179458375","wikidata":"https://www.wikidata.org/wiki/Q1020763","display_name":"Bundle adjustment","level":3,"score":0.7653459310531616},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6701064705848694},{"id":"https://openalex.org/C2776865275","wikidata":"https://www.wikidata.org/wiki/Q311666","display_name":"Projector","level":2,"score":0.6243324279785156},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5846271514892578},{"id":"https://openalex.org/C184577583","wikidata":"https://www.wikidata.org/wiki/Q1485537","display_name":"Structured-light 3D scanner","level":3,"score":0.5712420344352722},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5555567145347595},{"id":"https://openalex.org/C193581530","wikidata":"https://www.wikidata.org/wiki/Q683778","display_name":"Structured light","level":2,"score":0.552436888217926},{"id":"https://openalex.org/C110898773","wikidata":"https://www.wikidata.org/wiki/Q2933935","display_name":"Camera resectioning","level":2,"score":0.5284785032272339},{"id":"https://openalex.org/C79261456","wikidata":"https://www.wikidata.org/wiki/Q443756","display_name":"Profilometer","level":3,"score":0.5284621119499207},{"id":"https://openalex.org/C15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","level":2,"score":0.5203040242195129},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.5121011734008789},{"id":"https://openalex.org/C23379248","wikidata":"https://www.wikidata.org/wiki/Q200904","display_name":"Epipolar geometry","level":3,"score":0.4919430911540985},{"id":"https://openalex.org/C183072630","wikidata":"https://www.wikidata.org/wiki/Q215932","display_name":"Depth of field","level":2,"score":0.4666837155818939},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4640082120895386},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.44498351216316223},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.4194888770580292},{"id":"https://openalex.org/C117455697","wikidata":"https://www.wikidata.org/wiki/Q190149","display_name":"Photogrammetry","level":2,"score":0.2852729856967926},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23218685388565063},{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.1755262017250061},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13831132650375366},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.12918564677238464},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.12043827772140503},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3196738","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3196738","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.4099999964237213,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1935638792","display_name":null,"funder_award_id":"6207020955","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1520829806","https://openalex.org/W2008373329","https://openalex.org/W2009678897","https://openalex.org/W2022191744","https://openalex.org/W2022846870","https://openalex.org/W2029923266","https://openalex.org/W2048089113","https://openalex.org/W2059342612","https://openalex.org/W2071159235","https://openalex.org/W2077615127","https://openalex.org/W2120270858","https://openalex.org/W2167667767","https://openalex.org/W2177478906","https://openalex.org/W2267018648","https://openalex.org/W2417510486","https://openalex.org/W2419076151","https://openalex.org/W2775298686","https://openalex.org/W2804654620","https://openalex.org/W3039405393"],"related_works":["https://openalex.org/W2751063144","https://openalex.org/W1985830928","https://openalex.org/W2406670120","https://openalex.org/W2383398123","https://openalex.org/W3018486819","https://openalex.org/W2934814663","https://openalex.org/W3044644045","https://openalex.org/W2004690548","https://openalex.org/W2007011109","https://openalex.org/W2904305803"],"abstract_inverted_index":{"As":[0],"an":[1,67,71,124],"important":[2],"defect":[3],"detection":[4],"technology,":[5],"automated":[6],"Optical":[7],"Inspection":[8],"(AOI)":[9],"is":[10,56,81,112,128,161,175,192],"widely":[11],"used":[12],"in":[13,163],"the":[14,29,51,62,95,120,133,138,149,172,197],"quality":[15],"control":[16],"of":[17,31,90,97,181,183,196],"Printed":[18],"Circuit":[19],"Board":[20],"Assembly":[21],"(PCBA)":[22],"and":[23,40,76,106,168],"precision":[24],"electronic":[25],"manufacturing.":[26],"To":[27,58,136],"meet":[28],"requirement":[30],"3D":[32,139],"AOI":[33,65],"with":[34,61,70,178],"large":[35,88],"measurable":[36],"volume,":[37],"high":[38,41],"speed":[39],"precision,":[42],"a":[43,77,87,104,144,155,179],"practical":[44],"structured":[45],"light":[46],"imaging":[47],"system":[48,173],"based":[49],"on":[50],"micro":[52],"fringe":[53],"projection":[54],"profilometry":[55],"proposed.":[57],"be":[59],"compatible":[60],"traditional":[63,198],"2D":[64],"system,":[66],"optical":[68],"configuration":[69],"axial":[72],"bi-telecentric":[73],"lens":[74],"camera":[75,109,158],"lateral":[78],"Scheimpflug":[79],"projector":[80],"adopted,":[82],"which":[83,114],"helps":[84],"to":[85,94,130,194],"achieve":[86],"Depth":[89],"Field":[91,180],"(DOF).":[92],"Adapting":[93],"constraint":[96],"limited":[98],"space":[99],"for":[100],"calibration":[101,110,134],"target":[102],"movement,":[103],"simplified":[105],"precise":[107],"telecentric":[108,157],"method":[111,127],"proposed,":[113],"requires":[115],"no":[116],"auxiliary":[117],"device":[118],"like":[119],"micro-positioning":[121],"stage.":[122],"Then,":[123],"improved":[125],"Bundle-Adjustment":[126],"introduced":[129],"globally":[131],"optimize":[132],"parameters.":[135],"accelerate":[137],"reconstruction,":[140],"we":[141],"further":[142],"propose":[143],"ray":[145],"backtracking":[146],"algorithm":[147],"after":[148],"corresponding":[150],"point":[151],"matching":[152],"by":[153],"using":[154,165],"modified":[156],"model.":[159],"It":[160],"demonstrated":[162],"experiments":[164],"real":[166],"PCBA":[167],"micro-structure":[169],"components":[170],"that":[171],"DOF":[174],"8":[176],"mm":[177,185],"View":[182],"32":[184],"×":[186],"28":[187],"mm.":[188],"The":[189],"reconstruction":[190],"time":[191],"shortened":[193],"40%":[195],"method.":[199]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":9}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}