{"id":"https://openalex.org/W4288779689","doi":"https://doi.org/10.1109/tim.2022.3194890","title":"BIT-Based Intermittent Fault Diagnosis of Analog Circuits by Improved Deep Forest Classifier","display_name":"BIT-Based Intermittent Fault Diagnosis of Analog Circuits by Improved Deep Forest Classifier","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4288779689","doi":"https://doi.org/10.1109/tim.2022.3194890"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3194890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3194890","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045468873","display_name":"Congzhi Huang","orcid":"https://orcid.org/0000-0003-0693-5256"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Congzhi Huang","raw_affiliation_strings":["Key Laboratory of Power Station Energy Transfer Conversion and System, School of Control and Computer Engineering, North China Electric Power University, Beijing, China","School of Control and Computer Engineering, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-0693-5256","affiliations":[{"raw_affiliation_string":"Key Laboratory of Power Station Energy Transfer Conversion and System, School of Control and Computer Engineering, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]},{"raw_affiliation_string":"School of Control and Computer Engineering, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073900209","display_name":"Zhendong Shen","orcid":"https://orcid.org/0000-0003-0198-0541"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhendong Shen","raw_affiliation_strings":["School of Control and Computer Engineering, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-0198-0541","affiliations":[{"raw_affiliation_string":"School of Control and Computer Engineering, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101864715","display_name":"Jianhua Zhang","orcid":"https://orcid.org/0000-0001-8828-3751"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianhua Zhang","raw_affiliation_strings":["School of Control and Computer Engineering, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8828-3751","affiliations":[{"raw_affiliation_string":"School of Control and Computer Engineering, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045575845","display_name":"Guolian Hou","orcid":"https://orcid.org/0000-0003-3221-3329"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guolian Hou","raw_affiliation_strings":["School of Control and Computer Engineering, North China Electric Power University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3221-3329","affiliations":[{"raw_affiliation_string":"School of Control and Computer Engineering, North China Electric Power University, Beijing, China","institution_ids":["https://openalex.org/I153473198"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I153473198"],"apc_list":null,"apc_paid":null,"fwci":2.8271,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.91167783,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6173898577690125},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5443278551101685},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5006577968597412},{"id":"https://openalex.org/keywords/particle-swarm-optimization","display_name":"Particle swarm optimization","score":0.4823991060256958},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4771653711795807},{"id":"https://openalex.org/keywords/digital-biquad-filter","display_name":"Digital biquad filter","score":0.4748968183994293},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4717560410499573},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.46782273054122925},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2642849087715149},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.24278497695922852},{"id":"https://openalex.org/keywords/low-pass-filter","display_name":"Low-pass filter","score":0.23214146494865417},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.22413110733032227},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.08947473764419556}],"concepts":[{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6173898577690125},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5443278551101685},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5006577968597412},{"id":"https://openalex.org/C85617194","wikidata":"https://www.wikidata.org/wiki/Q2072794","display_name":"Particle swarm optimization","level":2,"score":0.4823991060256958},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4771653711795807},{"id":"https://openalex.org/C14455310","wikidata":"https://www.wikidata.org/wiki/Q5276043","display_name":"Digital biquad filter","level":4,"score":0.4748968183994293},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4717560410499573},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.46782273054122925},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2642849087715149},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.24278497695922852},{"id":"https://openalex.org/C44682112","wikidata":"https://www.wikidata.org/wiki/Q918242","display_name":"Low-pass filter","level":3,"score":0.23214146494865417},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.22413110733032227},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.08947473764419556},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3194890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3194890","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Life in Land","score":0.7400000095367432,"id":"https://metadata.un.org/sdg/15"}],"awards":[{"id":"https://openalex.org/G8627993427","display_name":null,"funder_award_id":"2017-V-0010-0061","funder_id":"https://openalex.org/F4320329860","funder_display_name":"National Science and Technology Major Project"}],"funders":[{"id":"https://openalex.org/F4320329860","display_name":"National Science and Technology Major Project","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W2022892003","https://openalex.org/W2051401724","https://openalex.org/W2086409142","https://openalex.org/W2093266575","https://openalex.org/W2143612262","https://openalex.org/W2150757437","https://openalex.org/W2317602876","https://openalex.org/W2325207965","https://openalex.org/W2333775357","https://openalex.org/W2353139612","https://openalex.org/W2468457481","https://openalex.org/W2521265470","https://openalex.org/W2524782376","https://openalex.org/W2562167384","https://openalex.org/W2592340788","https://openalex.org/W2592345322","https://openalex.org/W2604523962","https://openalex.org/W2755147188","https://openalex.org/W2782219786","https://openalex.org/W2784215704","https://openalex.org/W2805966918","https://openalex.org/W2833939425","https://openalex.org/W2883495697","https://openalex.org/W2901240338","https://openalex.org/W2913495039","https://openalex.org/W2913690321","https://openalex.org/W2922660557","https://openalex.org/W2929815085","https://openalex.org/W2963554131","https://openalex.org/W3000835335","https://openalex.org/W3015604674","https://openalex.org/W3016016303","https://openalex.org/W3080387499","https://openalex.org/W3083676672","https://openalex.org/W3104997747","https://openalex.org/W3110757820","https://openalex.org/W3120741450","https://openalex.org/W3155823187","https://openalex.org/W3204624331","https://openalex.org/W3210281972","https://openalex.org/W7015003904"],"related_works":["https://openalex.org/W2538593453","https://openalex.org/W2357947109","https://openalex.org/W2944010983","https://openalex.org/W1912477014","https://openalex.org/W2078387327","https://openalex.org/W2015413700","https://openalex.org/W2133409816","https://openalex.org/W2385628479","https://openalex.org/W4382204737","https://openalex.org/W2375192119"],"abstract_inverted_index":{"In":[0],"order":[1,107],"to":[2,76,87,108,151],"reduce":[3],"the":[4,37,55,63,73,78,82,89,93,97,103,110,114,120,142,148,152,163,178,186],"high":[5],"built-in":[6],"test":[7,183],"(BIT)":[8],"false":[9],"alarms":[10],"of":[11,96,113,122,125,139],"analog":[12,26,98],"circuits":[13,27,99],"caused":[14],"by":[15,28,102,129,177],"intermittent":[16,21,94,118,149,156,198],"faults,":[17,119],"a":[18],"BIT":[19],"based":[20],"fault":[22,199],"diagnosis":[23,143,200],"method":[24,159],"for":[25,47,117],"improved":[29],"deep":[30],"forest":[31],"(DF)":[32],"classifier":[33,91,116],"is":[34,69,160,175],"proposed.":[35],"Firstly,":[36],"local":[38],"mean":[39],"decomposition":[40],"and":[41,58,92,133,145],"multi-scale":[42,48,74],"entropy":[43],"(LMD-MSE)":[44],"are":[45,85,100,127],"employed":[46],"time-frequency":[49],"analysis":[50],"since":[51],"it":[52,174],"can":[53,146],"handle":[54],"data":[56],"nonlinearity":[57],"eliminate":[59],"redundant":[60],"information.":[61],"Secondly,":[62],"particle":[64],"swarm":[65],"optimization":[66],"(PSO)":[67],"algorithm":[68],"adopted":[70],"in":[71,106,197],"optimizing":[72],"factors":[75],"form":[77],"feature":[79,83],"sets.":[80],"Then,":[81],"sets":[84],"used":[86],"train":[88],"DF":[90,115,126,140],"faults":[95,150],"diagnosed":[101],"classifier.":[104],"Meanwhile,":[105],"improve":[109],"diagnostic":[111,192],"accuracy":[112,144],"classifiers":[121],"each":[123],"level":[124],"replaced":[128],"extreme":[130],"random":[131],"forests":[132],"rotation":[134],"forests.":[135],"The":[136,158],"optimized":[137],"characteristic":[138],"improves":[141],"locate":[147],"circuit":[153],"branch":[154],"with":[155,162,170,201],"faults.":[157],"evaluated":[161],"four-opamp":[164],"biquad":[165],"high-pass":[166],"filter":[167],"circuit.":[168],"Compared":[169],"other":[171],"common":[172],"methods,":[173],"shown":[176],"given":[179],"extensive":[180],"comparative":[181],"experiment":[182],"results":[184],"that":[185],"proposed":[187],"approach":[188],"has":[189],"achieved":[190],"better":[191],"results,":[193],"exhibiting":[194],"greater":[195],"advantages":[196],"small":[202],"sample":[203],"data.":[204]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":13},{"year":2023,"cited_by_count":8}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}