{"id":"https://openalex.org/W4286377372","doi":"https://doi.org/10.1109/tim.2022.3193178","title":"Nonintrusive Measurements for Detecting Progressive Equipment Faults","display_name":"Nonintrusive Measurements for Detecting Progressive Equipment Faults","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4286377372","doi":"https://doi.org/10.1109/tim.2022.3193178"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3193178","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3193178","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042057106","display_name":"Daisy H. Green","orcid":"https://orcid.org/0000-0002-9309-0097"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daisy H. Green","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":"https://orcid.org/0000-0002-9309-0097","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010035185","display_name":"Devin W. Quinn","orcid":"https://orcid.org/0000-0001-5704-1477"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Devin W. Quinn","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":"https://orcid.org/0000-0001-5704-1477","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037742794","display_name":"Samuel Madden","orcid":null},"institutions":[{"id":"https://openalex.org/I13383945","display_name":"Exponent (United States)","ror":"https://ror.org/04wzb3z02","country_code":"US","type":"company","lineage":["https://openalex.org/I13383945"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Samuel Madden","raw_affiliation_strings":["Exponent, Inc., Natick, MA, USA"],"raw_orcid":"https://orcid.org/0000-0003-1097-0732","affiliations":[{"raw_affiliation_string":"Exponent, Inc., Natick, MA, USA","institution_ids":["https://openalex.org/I13383945"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028652476","display_name":"Peter Lindahl","orcid":"https://orcid.org/0000-0001-5364-3868"},"institutions":[{"id":"https://openalex.org/I13383945","display_name":"Exponent (United States)","ror":"https://ror.org/04wzb3z02","country_code":"US","type":"company","lineage":["https://openalex.org/I13383945"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter A. Lindahl","raw_affiliation_strings":["Exponent, Inc., Natick, MA, USA"],"raw_orcid":"https://orcid.org/0000-0001-5364-3868","affiliations":[{"raw_affiliation_string":"Exponent, Inc., Natick, MA, USA","institution_ids":["https://openalex.org/I13383945"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090151020","display_name":"Steven B. Leeb","orcid":"https://orcid.org/0000-0002-3856-6005"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Steven B. Leeb","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":"https://orcid.org/0000-0002-3856-6005","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0295,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.71620922,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.9812999963760376,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.9812999963760376,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9800000190734863,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9778000116348267,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.6622382402420044},{"id":"https://openalex.org/keywords/electrical-equipment","display_name":"Electrical equipment","score":0.6133362650871277},{"id":"https://openalex.org/keywords/catastrophic-failure","display_name":"Catastrophic failure","score":0.5063158273696899},{"id":"https://openalex.org/keywords/lead","display_name":"Lead (geology)","score":0.4486270248889923},{"id":"https://openalex.org/keywords/electrical-wiring","display_name":"Electrical wiring","score":0.44812601804733276},{"id":"https://openalex.org/keywords/guard","display_name":"Guard (computer science)","score":0.43532076478004456},{"id":"https://openalex.org/keywords/forensic-engineering","display_name":"Forensic engineering","score":0.4327854812145233},{"id":"https://openalex.org/keywords/corrosion","display_name":"Corrosion","score":0.4262164235115051},{"id":"https://openalex.org/keywords/vibration","display_name":"Vibration","score":0.42391911149024963},{"id":"https://openalex.org/keywords/electrical-resistivity-tomography","display_name":"Electrical resistivity tomography","score":0.4111561179161072},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3629930317401886},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.34781569242477417},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3121121823787689},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2745334804058075},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.22161757946014404},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.1741020679473877},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.10573908686637878},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.0914425253868103}],"concepts":[{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.6622382402420044},{"id":"https://openalex.org/C162175671","wikidata":"https://www.wikidata.org/wiki/Q3749263","display_name":"Electrical equipment","level":2,"score":0.6133362650871277},{"id":"https://openalex.org/C112987892","wikidata":"https://www.wikidata.org/wiki/Q5051574","display_name":"Catastrophic failure","level":2,"score":0.5063158273696899},{"id":"https://openalex.org/C2777093003","wikidata":"https://www.wikidata.org/wiki/Q6508345","display_name":"Lead (geology)","level":2,"score":0.4486270248889923},{"id":"https://openalex.org/C506575596","wikidata":"https://www.wikidata.org/wiki/Q192043","display_name":"Electrical wiring","level":2,"score":0.44812601804733276},{"id":"https://openalex.org/C141141315","wikidata":"https://www.wikidata.org/wiki/Q2379942","display_name":"Guard (computer science)","level":2,"score":0.43532076478004456},{"id":"https://openalex.org/C77595967","wikidata":"https://www.wikidata.org/wiki/Q3151013","display_name":"Forensic engineering","level":1,"score":0.4327854812145233},{"id":"https://openalex.org/C20625102","wikidata":"https://www.wikidata.org/wiki/Q137056","display_name":"Corrosion","level":2,"score":0.4262164235115051},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.42391911149024963},{"id":"https://openalex.org/C60591178","wikidata":"https://www.wikidata.org/wiki/Q488986","display_name":"Electrical resistivity tomography","level":3,"score":0.4111561179161072},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3629930317401886},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34781569242477417},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3121121823787689},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2745334804058075},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.22161757946014404},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.1741020679473877},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.10573908686637878},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0914425253868103},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C114793014","wikidata":"https://www.wikidata.org/wiki/Q52109","display_name":"Geomorphology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3193178","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3193178","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.75,"id":"https://metadata.un.org/sdg/14","display_name":"Life below water"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320310230","display_name":"Grainger Foundation","ror":"https://ror.org/0139q7h64"},{"id":"https://openalex.org/F4320337345","display_name":"Office of Naval Research","ror":"https://ror.org/00rk2pe57"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1589185566","https://openalex.org/W1981953422","https://openalex.org/W2015621384","https://openalex.org/W2037072846","https://openalex.org/W2108281209","https://openalex.org/W2121813087","https://openalex.org/W2128078163","https://openalex.org/W2325097803","https://openalex.org/W2573177109","https://openalex.org/W2741144289","https://openalex.org/W2750974817","https://openalex.org/W2806858326","https://openalex.org/W2889749712","https://openalex.org/W2901111076","https://openalex.org/W2909455612","https://openalex.org/W2921594629","https://openalex.org/W3008901316","https://openalex.org/W3020125122","https://openalex.org/W3046071693","https://openalex.org/W3081850291","https://openalex.org/W3095472304","https://openalex.org/W3116979932","https://openalex.org/W3169607733","https://openalex.org/W3169907473","https://openalex.org/W3196347386","https://openalex.org/W4200099981","https://openalex.org/W4206748303","https://openalex.org/W4245763708","https://openalex.org/W4256566940","https://openalex.org/W4388939953"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W4366262926","https://openalex.org/W2610509641","https://openalex.org/W2497329047","https://openalex.org/W2390548726","https://openalex.org/W2953697840","https://openalex.org/W2360985634","https://openalex.org/W2362102423","https://openalex.org/W2382118894","https://openalex.org/W4286377372"],"abstract_inverted_index":{"The":[0,57],"gradual":[1],"environmental":[2],"degradation":[3,108],"of":[4,13,24,48,54,59,89,99,106,111],"materials":[5,33],"can":[6,71],"lead":[7,45,93],"to":[8,21,46,94,130],"corrosion":[9,18],"and":[10,17,27,29,51,109,125],"mechanical":[11],"failures":[12,44],"electrical":[14,25,30,55,62,79,90,136],"loads.":[15],"Vibration":[16],"both":[19],"contribute":[20],"the":[22,38,52,87,107,132],"failure":[23,110],"connections":[26],"conductors,":[28],"arcs":[31],"destroy":[32],"in":[34,74],"ways":[35],"that":[36,92],"enhance":[37],"opportunities":[39],"for":[40,85,134],"further":[41],"damage.":[42],"These":[43],"loss":[47],"system":[49],"capability":[50],"possibility":[53],"fires.":[56],"signatures":[58,91],"these":[60,100],"impending":[61],"failures,":[63],"which":[64],"may":[65],"occur":[66],"over":[67],"weeks":[68],"or":[69],"months,":[70],"be":[72],"detected":[73],"many":[75],"systems":[76],"through":[77],"nonintrusive":[78],"monitoring.":[80],"This":[81],"paper":[82],"demonstrates":[83],"techniques":[84,101],"decoding":[86],"type":[88],"progressive":[95],"failure.":[96],"Example":[97],"applications":[98],"are":[102,128],"illustrated":[103],"with":[104],"observations":[105],"copper-sheathed":[112],"jacket":[113],"water":[114],"heaters":[115],"aboard":[116],"a":[117],"United":[118],"States":[119],"Coast":[120],"Guard":[121],"vessel.":[122],"Electrical,":[123],"material,":[124],"vibration":[126],"analysis":[127],"presented":[129],"demonstrate":[131],"basis":[133],"diagnostic":[135],"signatures.":[137]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2}],"updated_date":"2026-08-11T07:18:39.950985","created_date":"2025-10-10T00:00:00"}