{"id":"https://openalex.org/W4286377481","doi":"https://doi.org/10.1109/tim.2022.3193172","title":"Measurement Uncertainty in Voltage Coefficients for Compressed-Gas Capacitor Based on a Simplified Tilting Method","display_name":"Measurement Uncertainty in Voltage Coefficients for Compressed-Gas Capacitor Based on a Simplified Tilting Method","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4286377481","doi":"https://doi.org/10.1109/tim.2022.3193172"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3193172","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3193172","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074000379","display_name":"Huanghui Zhang","orcid":"https://orcid.org/0000-0003-3412-6763"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Huanghui Zhang","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3412-6763","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001452215","display_name":"Haiming Shao","orcid":"https://orcid.org/0000-0002-3305-4190"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiming Shao","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-3305-4190","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100765811","display_name":"Jiafu Wang","orcid":"https://orcid.org/0000-0003-1092-5712"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiafu Wang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-1092-5712","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102979842","display_name":"Feipeng Lin","orcid":"https://orcid.org/0000-0002-1108-1622"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feipeng Lin","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-1108-1622","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100695572","display_name":"Wei Zhao","orcid":"https://orcid.org/0000-0002-7346-5947"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhao","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7346-5947","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078948815","display_name":"Chuansheng Li","orcid":"https://orcid.org/0000-0001-8045-0367"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuansheng Li","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8045-0367","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015475948","display_name":"Tianyu Sun","orcid":"https://orcid.org/0000-0002-6915-4687"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tianyu Sun","raw_affiliation_strings":["Liaoning Provincial Institute of Measurement, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-6915-4687","affiliations":[{"raw_affiliation_string":"Liaoning Provincial Institute of Measurement, Shenyang, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090722199","display_name":"Yiqian Wu","orcid":"https://orcid.org/0000-0003-2007-742X"},"institutions":[{"id":"https://openalex.org/I4210123506","display_name":"Jiangsu Institute of Metrology","ror":"https://ror.org/035hazd92","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210123506"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiqian Wu","raw_affiliation_strings":["Beijing Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-2007-742X","affiliations":[{"raw_affiliation_string":"Beijing Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210123506"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5074000379"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.2771,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.52805931,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7931473851203918},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.7329959273338318},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.7301064729690552},{"id":"https://openalex.org/keywords/voltage-divider","display_name":"Voltage divider","score":0.5950849652290344},{"id":"https://openalex.org/keywords/high-voltage","display_name":"High voltage","score":0.5846610069274902},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5186333060264587},{"id":"https://openalex.org/keywords/capacitance-probe","display_name":"Capacitance probe","score":0.5090755820274353},{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.459989458322525},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4586576819419861},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.4372142255306244},{"id":"https://openalex.org/keywords/reservoir-capacitor","display_name":"Reservoir capacitor","score":0.430597186088562},{"id":"https://openalex.org/keywords/decoupling-capacitor","display_name":"Decoupling capacitor","score":0.3963332772254944},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.3633238971233368},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2888370156288147},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23430243134498596}],"concepts":[{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7931473851203918},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.7329959273338318},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7301064729690552},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.5950849652290344},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.5846610069274902},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5186333060264587},{"id":"https://openalex.org/C203455917","wikidata":"https://www.wikidata.org/wiki/Q5034478","display_name":"Capacitance probe","level":4,"score":0.5090755820274353},{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.459989458322525},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4586576819419861},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.4372142255306244},{"id":"https://openalex.org/C23621802","wikidata":"https://www.wikidata.org/wiki/Q171486","display_name":"Reservoir capacitor","level":5,"score":0.430597186088562},{"id":"https://openalex.org/C35196352","wikidata":"https://www.wikidata.org/wiki/Q1532649","display_name":"Decoupling capacitor","level":4,"score":0.3963332772254944},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.3633238971233368},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2888370156288147},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23430243134498596},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3193172","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3193172","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8299999833106995}],"awards":[{"id":"https://openalex.org/G8740519188","display_name":null,"funder_award_id":"2017YFF0205701","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1968585257","https://openalex.org/W1985139731","https://openalex.org/W1992821664","https://openalex.org/W1999935231","https://openalex.org/W2012822366","https://openalex.org/W2019514496","https://openalex.org/W2036264407","https://openalex.org/W2118324632","https://openalex.org/W2144111029","https://openalex.org/W2151143539","https://openalex.org/W2907717094","https://openalex.org/W3085044723","https://openalex.org/W4238550448"],"related_works":["https://openalex.org/W4200280459","https://openalex.org/W2752631005","https://openalex.org/W2520651928","https://openalex.org/W2386715075","https://openalex.org/W2782955844","https://openalex.org/W2372778416","https://openalex.org/W4309835303","https://openalex.org/W1495357512","https://openalex.org/W3021272452","https://openalex.org/W1487723970"],"abstract_inverted_index":{"High-voltage":[0],"compressed-gas":[1,60],"capacitor":[2,58,96,125,154,194],"is":[3,28,67,174,200,212],"a":[4,48,88,121,141,158,165],"type":[5],"of":[6,18,26,37,55,120,151,170,185,193],"precision":[7],"equipment":[8],"commonly":[9],"used":[10],"in":[11,20,188,202],"high":[12,107],"voltage":[13,16,24,53,80,108,118,149,190],"laboratories.":[14,74],"The":[15,39,94,162,204],"dependence":[17],"capacitance,":[19,27],"other":[21],"words,":[22],"the":[23,34,52,56,79,84,99,114,117,136,148,152,168,171,179,183,189,209],"coefficient":[25,54,81,119,150,191],"an":[29,69],"important":[30],"factor":[31],"to":[32,77,130],"ensure":[33],"measurement":[35,138,172,186],"accuracy":[36],"capacitors.":[38],"simplified":[40,85,197],"tilting":[41,86,198],"method":[42,139,199],"derived":[43],"from":[44],"PTB,":[45],"which":[46],"provides":[47],"solution":[49],"for":[50,72],"measuring":[51],"high-voltage":[57,95,124,143],"with":[59,140,157],"coaxial":[61],"cylindrical":[62],"electrodes":[63],"structure.":[64],"However,":[65],"it":[66,132],"not":[68],"easy":[70],"work":[71],"most":[73],"In":[75,128],"order":[76,129],"evaluate":[78],"based":[82,195],"on":[83,98,113,196],"method,":[87],"special":[89],"experimental":[90],"platform":[91,100],"was":[92,126,133,155],"developed.":[93],"installed":[97],"can":[101],"be":[102,110],"tilted":[103],"and":[104,109,145],"rotated":[105],"at":[106],"remote-controlled.":[111],"Base":[112],"developed":[115],"platform,":[116],"350":[122],"kV":[123],"measured.":[127],"verify,":[131],"re-measured":[134],"by":[135],"direct":[137],"dummy":[142,153],"capacitor,":[144],"before":[146],"that,":[147],"calibrated":[156],"near":[159],"zero-voltage-coefficient":[160],"capacitor.":[161],"results":[163,173,206],"show":[164,207],"good":[166],"agreement,":[167],"consistency":[169],"better":[175,214],"than":[176,215],"1.2&#x00D7;10<sup>-6</sup>":[177],"between":[178],"two":[180],"methods.":[181],"Furthermore,":[182],"evaluation":[184,205],"uncertainty":[187,211],"determination":[192],"introduced":[201],"detail.":[203],"that":[208],"expanded":[210],"significantly":[213],"2.0&#x00D7;10<sup>-6</sup>,":[216],"k=2.":[217]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}