{"id":"https://openalex.org/W4312875646","doi":"https://doi.org/10.1109/tim.2022.3192068","title":"An Adaptive Filter for Subdivision of Circular Grating Signal of Angle Measurement","display_name":"An Adaptive Filter for Subdivision of Circular Grating Signal of Angle Measurement","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4312875646","doi":"https://doi.org/10.1109/tim.2022.3192068"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3192068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3192068","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029537808","display_name":"Yao Huang","orcid":"https://orcid.org/0000-0003-4088-1300"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]},{"id":"https://openalex.org/I4391767668","display_name":"State Key Laboratory of Modern Optical Instruments","ror":"https://ror.org/018fpas51","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767668","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Huang","raw_affiliation_strings":["State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, China","National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4088-1300","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692","https://openalex.org/I4391767668"]},{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086999716","display_name":"Shuangliang Che","orcid":"https://orcid.org/0000-0001-9954-518X"},"institutions":[{"id":"https://openalex.org/I4391767668","display_name":"State Key Laboratory of Modern Optical Instruments","ror":"https://ror.org/018fpas51","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767668","https://openalex.org/I76130692"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuangliang Che","raw_affiliation_strings":["State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-9954-518X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692","https://openalex.org/I4391767668"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010563665","display_name":"Gang Zheng","orcid":"https://orcid.org/0000-0002-3003-7897"},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gang Zheng","raw_affiliation_strings":["School of Measurement and Testing Engineering, China Jiliang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-3003-7897","affiliations":[{"raw_affiliation_string":"School of Measurement and Testing Engineering, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074052181","display_name":"Weibin Zhu","orcid":"https://orcid.org/0000-0002-9850-2812"},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weibin Zhu","raw_affiliation_strings":["School of Measurement and Testing Engineering, China Jiliang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-9850-2812","affiliations":[{"raw_affiliation_string":"School of Measurement and Testing Engineering, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014039816","display_name":"Yi Zhou","orcid":"https://orcid.org/0000-0001-9118-3524"},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Zhou","raw_affiliation_strings":["School of Measurement and Testing Engineering, China Jiliang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-9118-3524","affiliations":[{"raw_affiliation_string":"School of Measurement and Testing Engineering, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076494347","display_name":"Zi Xue","orcid":"https://orcid.org/0000-0002-2845-2055"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zi Xue","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-2845-2055","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9952,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.72278842,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subdivision","display_name":"Subdivision","score":0.638140082359314},{"id":"https://openalex.org/keywords/adaptive-filter","display_name":"Adaptive filter","score":0.6339460015296936},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.6001947522163391},{"id":"https://openalex.org/keywords/grating","display_name":"Grating","score":0.5287194848060608},{"id":"https://openalex.org/keywords/low-pass-filter","display_name":"Low-pass filter","score":0.47234928607940674},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45208871364593506},{"id":"https://openalex.org/keywords/finite-impulse-response","display_name":"Finite impulse response","score":0.41619428992271423},{"id":"https://openalex.org/keywords/filter-design","display_name":"Filter design","score":0.416063129901886},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38025742769241333},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.33025622367858887},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2789660096168518},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2671300768852234},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.21760806441307068},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1784704327583313},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.1550253927707672}],"concepts":[{"id":"https://openalex.org/C143392562","wikidata":"https://www.wikidata.org/wiki/Q449111","display_name":"Subdivision","level":2,"score":0.638140082359314},{"id":"https://openalex.org/C102248274","wikidata":"https://www.wikidata.org/wiki/Q168388","display_name":"Adaptive filter","level":2,"score":0.6339460015296936},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.6001947522163391},{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.5287194848060608},{"id":"https://openalex.org/C44682112","wikidata":"https://www.wikidata.org/wiki/Q918242","display_name":"Low-pass filter","level":3,"score":0.47234928607940674},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45208871364593506},{"id":"https://openalex.org/C198386975","wikidata":"https://www.wikidata.org/wiki/Q117785","display_name":"Finite impulse response","level":2,"score":0.41619428992271423},{"id":"https://openalex.org/C22597639","wikidata":"https://www.wikidata.org/wiki/Q5449227","display_name":"Filter design","level":3,"score":0.416063129901886},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38025742769241333},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.33025622367858887},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2789660096168518},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2671300768852234},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.21760806441307068},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1784704327583313},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.1550253927707672},{"id":"https://openalex.org/C147176958","wikidata":"https://www.wikidata.org/wiki/Q77590","display_name":"Civil engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3192068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3192068","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G3199656856","display_name":null,"funder_award_id":"52175526","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7410320584","display_name":null,"funder_award_id":"2017YFF0204901","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1487230384","https://openalex.org/W1581709742","https://openalex.org/W2010768868","https://openalex.org/W2068049401","https://openalex.org/W2074956119","https://openalex.org/W2081678792","https://openalex.org/W2083382325","https://openalex.org/W2113416571","https://openalex.org/W2160187790","https://openalex.org/W2295022403","https://openalex.org/W2325078523","https://openalex.org/W2378306496","https://openalex.org/W2470094054","https://openalex.org/W2525969944","https://openalex.org/W2582432186","https://openalex.org/W2611553768","https://openalex.org/W2754543509","https://openalex.org/W2801081308","https://openalex.org/W2804125910","https://openalex.org/W2901703342","https://openalex.org/W2918661020","https://openalex.org/W3034291086","https://openalex.org/W3108958504"],"related_works":["https://openalex.org/W1994765137","https://openalex.org/W1526610477","https://openalex.org/W2117601629","https://openalex.org/W2239614294","https://openalex.org/W2130405143","https://openalex.org/W2377616974","https://openalex.org/W3080832556","https://openalex.org/W84702264","https://openalex.org/W2514272563","https://openalex.org/W1955951130"],"abstract_inverted_index":{"Angle":[0],"is":[1,18,30,46,85,102,111,130,145,154,246],"an":[2,16,66,243],"important":[3],"physical":[4],"quantity":[5],"in":[6,73,201],"International":[7],"Systems":[8],"of":[9,15,19,38,50,77,83,95,106,118,125,132,150,182,235],"Units":[10],"(SI).":[11],"The":[12,27,81,104,148,193,232],"precise":[13],"measurement":[14,35,52],"angle":[17,34],"great":[20],"significance":[21],"for":[22,178],"scientific":[23],"research":[24],"and":[25,42,87,137,160,185],"production.":[26],"circular":[28,79],"grating":[29,51],"a":[31,133,157,175,183,186,224,239],"widely":[32],"used":[33],"sensor":[36],"because":[37],"its":[39],"large":[40],"range":[41],"high":[43,55],"resolution.":[44,56],"Subdivision":[45],"the":[47,61,71,74,78,88,93,96,100,115,119,126,138,151,161,180,197,212,220,236],"key":[48],"part":[49],"to":[53,59,69],"ensure":[54],"In":[57],"order":[58],"guarantee":[60],"subdivision":[62,84,90,109],"function,":[63],"we":[64],"propose":[65],"adaptive":[67,143,198,244],"filter":[68,136,153,199,205,218,245],"suppress":[70],"noises":[72,107,208],"moir\u00e9":[75,97,120],"signals":[76,98],"grating.":[80],"principle":[82],"introduced":[86],"arc-tangent":[89],"method":[91],"mapping":[92],"phase":[94,225],"into":[99],"displacement":[101],"adopted.":[103],"influence":[105],"on":[108],"results":[110,194],"analyzed":[112],"by":[113,166],"building":[114],"error":[116,226],"model":[117],"signals.":[121],"A":[122],"detailed":[123],"description":[124],"adapted":[127,152],"filter,":[128],"which":[129],"composed":[131],"linear":[134],"prediction":[135],"least":[139],"mean":[140],"square":[141],"(LMS)":[142],"algorithm,":[144],"provided":[146],"herein.":[147],"structure":[149,159],"optimized":[155],"with":[156,174,219,238],"symmetrical":[158],"hardware":[162],"resources":[163],"are":[164,172],"reduced":[165],"about":[167],"1/3.":[168],"Finally,":[169],"evaluation":[170],"tests":[171],"performed":[173],"calibration":[176],"platform":[177],"positioning":[179,233],"accuracy":[181,234],"turntable":[184,237],"laboratory-made":[187,240],"field-programmable":[188],"gate":[189],"array":[190],"(FPGA)":[191],"circuit.":[192],"confirmed":[195],"that":[196],"proposed":[200],"this":[202],"article":[203],"can":[204],"out":[206],"random":[207],"more":[209],"effectively":[210],"than":[211,248],"conventional":[213],"finite":[214],"impulse":[215],"response":[216],"(FIR)":[217],"same":[221],"order,":[222],"revealing":[223],"fluctuates":[227],"within":[228],"[\u22120.012,":[229],"+0.003":[230],"rad].":[231],"circuit":[241],"using":[242],"better":[247],"0.8.":[249]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}