{"id":"https://openalex.org/W4285818280","doi":"https://doi.org/10.1109/tim.2022.3192054","title":"Feature-Based Inversion Using Variational Autoencoder for Electrical Impedance Tomography","display_name":"Feature-Based Inversion Using Variational Autoencoder for Electrical Impedance Tomography","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4285818280","doi":"https://doi.org/10.1109/tim.2022.3192054"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3192054","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3192054","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011000189","display_name":"Zhichao Lin","orcid":"https://orcid.org/0000-0002-7354-8435"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhichao Lin","raw_affiliation_strings":["Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7354-8435","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089388395","display_name":"Rui Guo","orcid":"https://orcid.org/0000-0002-5294-923X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Guo","raw_affiliation_strings":["Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-5294-923X","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077286383","display_name":"Ke Zhang","orcid":"https://orcid.org/0000-0002-5751-0621"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ke Zhang","raw_affiliation_strings":["Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-5751-0621","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003510248","display_name":"Maokun Li","orcid":"https://orcid.org/0000-0002-7258-6413"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Maokun Li","raw_affiliation_strings":["Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7258-6413","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015451787","display_name":"Fan Yang","orcid":"https://orcid.org/0000-0002-0362-4236"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Yang","raw_affiliation_strings":["Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0362-4236","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022666762","display_name":"Shenheng Xu","orcid":"https://orcid.org/0000-0003-0105-8194"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shenheng Xu","raw_affiliation_strings":["Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-0105-8194","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100407498","display_name":"Dong Liu","orcid":"https://orcid.org/0000-0002-9645-7683"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I308837","display_name":"Suzhou University of Science and Technology","ror":"https://ror.org/04en8wb91","country_code":"CN","type":"education","lineage":["https://openalex.org/I308837"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dong Liu","raw_affiliation_strings":["CAS Key Laboratory of Microscale Magnetic Resonance and School of Physical Sciences, University of Science and Technology of China, Hefei, China","School of Biomedical Engineering and Suzhou Institute for Advanced Research, University of Science and Technology of China, Suzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-9645-7683","affiliations":[{"raw_affiliation_string":"CAS Key Laboratory of Microscale Magnetic Resonance and School of Physical Sciences, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]},{"raw_affiliation_string":"School of Biomedical Engineering and Suzhou Institute for Advanced Research, University of Science and Technology of China, Suzhou, China","institution_ids":["https://openalex.org/I308837","https://openalex.org/I126520041"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079173460","display_name":"Aria Abubakar","orcid":"https://orcid.org/0000-0003-4025-3443"},"institutions":[{"id":"https://openalex.org/I4210090857","display_name":"Schlumberger (United States)","ror":"https://ror.org/009m79n22","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090857","https://openalex.org/I4210092184"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aria Abubakar","raw_affiliation_strings":["Schlumberger, Houston, TX, USA"],"raw_orcid":"https://orcid.org/0000-0003-4025-3443","affiliations":[{"raw_affiliation_string":"Schlumberger, Houston, TX, USA","institution_ids":["https://openalex.org/I4210090857"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5011000189"],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":1.755,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.84274353,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.7825274467468262},{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.7521103620529175},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.6100290417671204},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5662218332290649},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5601391792297363},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.544618546962738},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5328643321990967},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.45308011770248413},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44842201471328735},{"id":"https://openalex.org/keywords/prior-probability","display_name":"Prior probability","score":0.4209470748901367},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.391751766204834},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20856985449790955},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.1592274010181427},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.09544691443443298},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.08210974931716919}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.7825274467468262},{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.7521103620529175},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.6100290417671204},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5662218332290649},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5601391792297363},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.544618546962738},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5328643321990967},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.45308011770248413},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44842201471328735},{"id":"https://openalex.org/C177769412","wikidata":"https://www.wikidata.org/wiki/Q278090","display_name":"Prior probability","level":3,"score":0.4209470748901367},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.391751766204834},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20856985449790955},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.1592274010181427},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09544691443443298},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.08210974931716919},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3192054","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3192054","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2109305676","display_name":null,"funder_award_id":"61971263","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4771007548","display_name":null,"funder_award_id":"2018YFC0603604","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322392","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":58,"referenced_works":["https://openalex.org/W1526902685","https://openalex.org/W1595025288","https://openalex.org/W1763618411","https://openalex.org/W1959608418","https://openalex.org/W2007163863","https://openalex.org/W2026616100","https://openalex.org/W2052625285","https://openalex.org/W2054192842","https://openalex.org/W2083927153","https://openalex.org/W2122294678","https://openalex.org/W2128648870","https://openalex.org/W2138248326","https://openalex.org/W2141002303","https://openalex.org/W2150502135","https://openalex.org/W2155107551","https://openalex.org/W2342572800","https://openalex.org/W2402384669","https://openalex.org/W2565717406","https://openalex.org/W2606372414","https://openalex.org/W2759764994","https://openalex.org/W2767248316","https://openalex.org/W2795198316","https://openalex.org/W2883561321","https://openalex.org/W2883645217","https://openalex.org/W2896048271","https://openalex.org/W2908202080","https://openalex.org/W2910112947","https://openalex.org/W2910732135","https://openalex.org/W2913384339","https://openalex.org/W2916125097","https://openalex.org/W2920929174","https://openalex.org/W2945973759","https://openalex.org/W2962851448","https://openalex.org/W2963570578","https://openalex.org/W2981658631","https://openalex.org/W2990050904","https://openalex.org/W2994953704","https://openalex.org/W2998105502","https://openalex.org/W2999516274","https://openalex.org/W3004108902","https://openalex.org/W3013193552","https://openalex.org/W3030487003","https://openalex.org/W3041956526","https://openalex.org/W3090731561","https://openalex.org/W3092368201","https://openalex.org/W3101681511","https://openalex.org/W3104882764","https://openalex.org/W3112602021","https://openalex.org/W3187405905","https://openalex.org/W3209243150","https://openalex.org/W4206677772","https://openalex.org/W4245551807","https://openalex.org/W4320930577","https://openalex.org/W6640963894","https://openalex.org/W6713134421","https://openalex.org/W6736141755","https://openalex.org/W6746023985","https://openalex.org/W6780593937"],"related_works":["https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W2902419700","https://openalex.org/W3160616384","https://openalex.org/W2905540725","https://openalex.org/W4376629886","https://openalex.org/W2000128178","https://openalex.org/W2101428392","https://openalex.org/W2537891456","https://openalex.org/W2215273690"],"abstract_inverted_index":{"A":[0,23,42],"feature-based":[1],"inversion":[2],"method":[3,123,134],"is":[4,46,101,117,124,152],"presented":[5],"to":[6,48,82,127,141],"incorporate":[7,142],"structural":[8,36,143],"prior":[9],"information":[10,144],"of":[11,25,38,52,74,99],"the":[12,39,72,75,90,97,110,121],"human":[13,40,157],"thorax":[14,158],"for":[15,156],"absolute":[16],"imaging":[17],"in":[18,66],"electrical":[19],"impedance":[20],"tomography":[21],"(EIT).":[22],"set":[24],"EIT":[26,54,61,149],"images":[27,55,62],"are":[28,78],"generated":[29],"from":[30,145],"open-source":[31],"CT":[32,146],"scans":[33,147],"with":[34],"embedded":[35],"priors":[37],"thorax.":[41],"variational":[43],"autoencoder":[44],"(VAE)":[45],"applied":[47],"learn":[49],"high-level":[50],"features":[51],"these":[53],"and":[56,63,106,120,130,138],"construct":[57],"a":[58,67,86,136,153],"mapping":[59],"between":[60],"latent":[64,76],"codes":[65],"low-dimensional":[68],"feature":[69],"space.":[70],"Then,":[71],"parameters":[73],"code":[77],"served":[79],"as":[80],"unknowns":[81,100],"be":[83],"inverted":[84],"under":[85],"deterministic":[87],"framework":[88],"by":[89],"Gauss-Newton":[91],"(GN)":[92],"method.":[93,112],"In":[94],"this":[95],"way,":[96],"number":[98],"greatly":[102],"reduced.":[103],"Both":[104],"synthetic":[105],"experimental":[107],"data":[108],"validate":[109],"proposed":[111,122],"The":[113],"reconstructed":[114],"image":[115],"quality":[116],"significantly":[118],"improved,":[119],"relatively":[125],"robust":[126],"measurement":[128],"noise":[129],"modeling":[131],"errors.":[132],"This":[133],"provides":[135],"flexible":[137],"effective":[139],"way":[140],"into":[148],"inversion,":[150],"which":[151],"potential":[154],"algorithm":[155],"imaging.":[159]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":9}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}