{"id":"https://openalex.org/W4285109991","doi":"https://doi.org/10.1109/tim.2022.3181289","title":"Conductance Sensor With Self-Calibration and Venturi Tube Based Flowrate Measurement for Gas\u2013Water Slug Flow","display_name":"Conductance Sensor With Self-Calibration and Venturi Tube Based Flowrate Measurement for Gas\u2013Water Slug Flow","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4285109991","doi":"https://doi.org/10.1109/tim.2022.3181289"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3181289","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3181289","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034723120","display_name":"Wei Chen","orcid":"https://orcid.org/0000-0003-4962-1169"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wei Chen","raw_affiliation_strings":["Department of Automation, Tsinghua University, Beijing, China","Tsinghua University, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Department of Automation, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Tsinghua University, Shenzhen, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021386938","display_name":"Jinku Li","orcid":"https://orcid.org/0000-0001-7014-4454"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinku Li","raw_affiliation_strings":["Department of Automation, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Automation, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100421652","display_name":"Yi Li","orcid":"https://orcid.org/0000-0002-8855-4520"},"institutions":[{"id":"https://openalex.org/I4210114105","display_name":"Tsinghua\u2013Berkeley Shenzhen Institute","ror":"https://ror.org/02hhwwz98","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210114105","https://openalex.org/I95457486","https://openalex.org/I99065089"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Li","raw_affiliation_strings":["Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen, China","institution_ids":["https://openalex.org/I4210114105","https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101951237","display_name":"Maomao Zhang","orcid":"https://orcid.org/0000-0002-1742-4665"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},{"id":"https://openalex.org/I4210114105","display_name":"Tsinghua\u2013Berkeley Shenzhen Institute","ror":"https://ror.org/02hhwwz98","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210114105","https://openalex.org/I95457486","https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Maomao Zhang","raw_affiliation_strings":["Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen, China","institution_ids":["https://openalex.org/I4210114105","https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013482491","display_name":"Lihui Peng","orcid":"https://orcid.org/0000-0001-7363-6374"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lihui Peng","raw_affiliation_strings":["Department of Automation, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Automation, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5034723120"],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":0.7806,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.63687253,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/venturi-effect","display_name":"Venturi effect","score":0.8920753002166748},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7389585375785828},{"id":"https://openalex.org/keywords/volumetric-flow-rate","display_name":"Volumetric flow rate","score":0.7055657505989075},{"id":"https://openalex.org/keywords/conductance","display_name":"Conductance","score":0.6656213402748108},{"id":"https://openalex.org/keywords/flow-measurement","display_name":"Flow measurement","score":0.6567702889442444},{"id":"https://openalex.org/keywords/slug-flow","display_name":"Slug flow","score":0.6368316411972046},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5667474269866943},{"id":"https://openalex.org/keywords/mass-flow-meter","display_name":"Mass flow meter","score":0.5051758885383606},{"id":"https://openalex.org/keywords/two-phase-flow","display_name":"Two-phase flow","score":0.49630337953567505},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.46860870718955994},{"id":"https://openalex.org/keywords/conductivity","display_name":"Conductivity","score":0.46532222628593445},{"id":"https://openalex.org/keywords/flow","display_name":"Flow (mathematics)","score":0.4227575957775116},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.3877860903739929},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38467103242874146},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3534182012081146},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3002973198890686},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.21272465586662292},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2122267782688141},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1387569010257721}],"concepts":[{"id":"https://openalex.org/C21423434","wikidata":"https://www.wikidata.org/wiki/Q725699","display_name":"Venturi effect","level":3,"score":0.8920753002166748},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7389585375785828},{"id":"https://openalex.org/C172120300","wikidata":"https://www.wikidata.org/wiki/Q1134348","display_name":"Volumetric flow rate","level":2,"score":0.7055657505989075},{"id":"https://openalex.org/C121932024","wikidata":"https://www.wikidata.org/wiki/Q5159376","display_name":"Conductance","level":2,"score":0.6656213402748108},{"id":"https://openalex.org/C16302685","wikidata":"https://www.wikidata.org/wiki/Q15091623","display_name":"Flow measurement","level":2,"score":0.6567702889442444},{"id":"https://openalex.org/C139514615","wikidata":"https://www.wikidata.org/wiki/Q16935556","display_name":"Slug flow","level":4,"score":0.6368316411972046},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5667474269866943},{"id":"https://openalex.org/C175580448","wikidata":"https://www.wikidata.org/wiki/Q114414","display_name":"Mass flow meter","level":3,"score":0.5051758885383606},{"id":"https://openalex.org/C144308804","wikidata":"https://www.wikidata.org/wiki/Q232997","display_name":"Two-phase flow","level":3,"score":0.49630337953567505},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.46860870718955994},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.46532222628593445},{"id":"https://openalex.org/C38349280","wikidata":"https://www.wikidata.org/wiki/Q1434290","display_name":"Flow (mathematics)","level":2,"score":0.4227575957775116},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.3877860903739929},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38467103242874146},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3534182012081146},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3002973198890686},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.21272465586662292},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2122267782688141},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1387569010257721},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.0},{"id":"https://openalex.org/C201289731","wikidata":"https://www.wikidata.org/wiki/Q1172599","display_name":"Inlet","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3181289","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3181289","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/6","display_name":"Clean water and sanitation"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1963743205","https://openalex.org/W1975901848","https://openalex.org/W1980270940","https://openalex.org/W2018727977","https://openalex.org/W2072723620","https://openalex.org/W2081220834","https://openalex.org/W2090550306","https://openalex.org/W2119771321","https://openalex.org/W2367989366","https://openalex.org/W2404898809","https://openalex.org/W2746081606","https://openalex.org/W2885042175","https://openalex.org/W2982961715","https://openalex.org/W2988659410","https://openalex.org/W3022219162","https://openalex.org/W3029015787","https://openalex.org/W3109248529","https://openalex.org/W3157740181","https://openalex.org/W3184841762","https://openalex.org/W3209761448"],"related_works":["https://openalex.org/W2031362611","https://openalex.org/W2170423821","https://openalex.org/W2403501948","https://openalex.org/W2014364261","https://openalex.org/W2373244322","https://openalex.org/W1997857127","https://openalex.org/W1518678420","https://openalex.org/W2057718659","https://openalex.org/W2550286026","https://openalex.org/W1553052159"],"abstract_inverted_index":{"As":[0],"the":[1,52,55,64,73,76,84,102,115,118,136,150],"water":[2],"cut":[3],"of":[4,21,58,75,80,156,158],"oilfields":[5,47],"is":[6,20,48,61,88,132,170],"becoming":[7],"higher":[8],"and":[9,39,91,142,161,166],"higher,":[10],"developing":[11],"low-cost":[12],"flowrate":[13,124,160,163],"measurement":[14,125],"methods":[15],"for":[16,127,172],"gas-water":[17,129],"two-phase":[18],"flow":[19,131],"great":[22],"importance.":[23],"Among":[24],"different":[25],"sensing":[26],"techniques,":[27],"conductance":[28,59,81,108,138],"sensor":[29,60,109,139],"has":[30],"received":[31],"widespread":[32],"attention":[33],"due":[34,50],"to":[35,51,63,93,100,113],"its":[36,43],"fast":[37],"response":[38],"low":[40],"cost,":[41],"but":[42],"practical":[44,173],"application":[45],"in":[46,95,175],"limited":[49],"fact":[53],"that":[54,149],"output":[56,78,86,120],"signal":[57],"related":[62],"liquid":[65,162],"conductivity.":[66],"This":[67],"issue":[68],"can":[69],"be":[70],"overcome":[71],"by":[72],"normalization":[74],"full-liquid":[77,85,119],"voltage":[79,87],"sensor.":[82],"However,":[83],"generally":[89],"difficult":[90],"expensive":[92],"obtain":[94],"field":[96],"applications.":[97],"In":[98],"order":[99],"improve":[101],"practicability,":[103],"this":[104],"paper":[105],"proposes":[106],"a":[107,123],"with":[110,140],"online":[111],"self-calibration":[112,141],"suppress":[114],"dependence":[116],"on":[117,135],"voltage.":[121],"Furthermore,":[122],"method":[126],"horizontal":[128],"slug":[130],"presented":[133],"based":[134],"proposed":[137],"Venturi":[143],"tube.":[144],"The":[145],"experimental":[146],"results":[147],"show":[148],"mean":[151],"absolute":[152],"percentage":[153],"errors":[154],"(MAPEs)":[155],"predictions":[157],"gas":[159],"are":[164],"4.62%":[165],"4.26%,":[167],"respectively,":[168],"which":[169],"promising":[171],"applications":[174],"oilfields.":[176]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}